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    • 42. 发明专利
    • ION BEAM MILLING DEVICE
    • JPH01301870A
    • 1989-12-06
    • JP13134588
    • 1988-05-31
    • HITACHI LTD
    • TANAKA SHIGERUHASHIMOTO ISAO
    • C23F4/00
    • PURPOSE:To prevent temp. rise in substrates by a simplified constitution by disposing spare chambers capable of evacuation on both sides of a treatment chamber, moving holders to move objects of working into the treatment chamber, and providing means of cooling the holders in the spare chambers, respectively. CONSTITUTION:Gate valves 4a, 4b are closed and the inside of a treatment chamber 1 is evacuated to high vacuum. A substrate 11 is placed on a stand 8a3 of a holder 8a in a spare chamber 3a and the inside of the spare chamber 3a is reduced to high vacuum. The gate valve 4a is opened and the holder 8a is turned and allowed to reach the treatment chamber 1, and an ion beam from an ion source 2 irradiates the substrate 11 ion milling treatment to the substrate 11 is executed. In a spare chamber 3b also, a substrate 11 is introduced and the inside of the chamber 3b is reduced to high vacuum. In the course of alternately repeated ion milling operations, cooling water via cooling water-introducing pipes 9a1, 9b1 is allowed to flow through the tubes inserted in the holders 8a, 8b, respectively, by which the substrates 11 placed on the stand 8a3 and a stand 8b3, respectively, are cooled. By this method, temp. rise in the substrates 11 can be inhibited and the breakage of the substrates 11 can be prevented.