会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 41. 发明授权
    • Heat treatment apparatus
    • 热处理设备
    • US08674273B2
    • 2014-03-18
    • US13040697
    • 2011-03-04
    • Tomihiro YonenagaYumiko Kawano
    • Tomihiro YonenagaYumiko Kawano
    • H05B6/10C23C16/00
    • C23C16/46H01L21/67109H05B6/105H05B6/365H05B6/44
    • Provided is a heat treatment apparatus which, when simultaneously heating substrates placed on susceptors, is capable of controlling the uniformity of temperature within each substrate. The heat treatment apparatus includes: a reaction tube which performs predetermined treatment to wafers; a plurality of susceptors each of which has a mounting surface for mounting the wafer and is made of a conductive material; a rotatable quartz boat wherein the susceptors spaced apart in a direction perpendicular to the mounting surfaces are arranged and supported in the reaction tube; a magnetic field generating unit which is arranged on a sidewall of the processing chamber and includes a pair of electromagnets which generate an AC magnetic field in a direction parallel to the mounting surfaces of the susceptors and inductively heat the susceptors; and a control unit which controls the AC magnetic field generated by the magnetic field generating unit.
    • 提供一种热处理装置,当同时加热放置在基座上的基板时,能够控制每个基板内的温度均匀性。 热处理装置包括:对晶片进行预定处理的反应管; 多个感受体具有用于安装晶片并由导电材料制成的安装表面; 一个可旋转的石英舟,其中在垂直于安装表面的方向间隔开的基座被布置和支撑在反应管中; 磁场产生单元,其布置在所述处理室的侧壁上,并且包括一对电磁体,所述一对电磁体在平行于所述基座的安装表面的方向上产生交流磁场并感应加热所述基座; 以及控制单元,其控制由磁场产生单元产生的交流磁场。
    • 42. 发明申请
    • HEAT TREATMENT APPARATUS
    • 热处理设备
    • US20110248024A1
    • 2011-10-13
    • US13092650
    • 2011-04-22
    • Tomihiro YONENAGAYumiko Kawano
    • Tomihiro YONENAGAYumiko Kawano
    • H05B6/10
    • H01L21/67109H01L21/67303
    • In-plane temperature of each substrate is uniformly controlled at the time of heating substrates placed on a plurality of susceptors, respectively. A heat treatment apparatus is provided with susceptors, i.e., conductive members for placing wafers thereon, having an induction heating body electrically divided into a center portion thereof and a peripheral portion thereof; a quartz boat supporting the susceptors arranged in a row; an induction coil, which is arranged inside a processing chamber to surround the circumference of each of the susceptors and configured such that the temperature of the induction coil can be freely adjusted; and a control unit which performs temperature control by changing the ratio between heat value at the center portion of the induction heating body and that at the peripheral portion, by controlling two high frequency currents of different frequencies to be applied to the induction coil from a high frequency current circuit.
    • 在分别加热放置在多个基座上的基板时,均匀地控制每个基板的面内温度。 一种热处理设备设置有基座,即用于在其上放置晶片的导电构件,具有电分割成其中心部分的感应加热体及其周边部分; 支撑排列成一排的基座的石英舟; 感应线圈,其布置在处理室内部以围绕每个基座的圆周并且被配置为使得感应线圈的温度可以自由地调节; 以及控制单元,其通过改变感应加热体的中心部分的热值与周边部分的热值之比,通过从高电平控制施加到感应线圈的不同频率的两个高频电流来进行温度控制 频率电流电路。
    • 45. 发明授权
    • Method for forming multilevel interconnection of semiconductor device
    • 形成半导体器件多层互连的方法
    • US5904557A
    • 1999-05-18
    • US794936
    • 1997-02-04
    • Takayuki KomiyaYumiko Kawano
    • Takayuki KomiyaYumiko Kawano
    • H01L21/3205H01L21/304H01L21/3105H01L21/768H01L23/522H01L23/532H01L21/28
    • H01L23/5226H01L21/76802H01L21/76883H01L23/53214H01L21/31053H01L2924/0002
    • A method for forming a multilevel interconnection of a semiconductor device of the present invention includes the steps of forming a first wiring layer by depositing a metallic film containing aluminum on an insulating film of a substrate and patterning the metallic film, forming an interlayer insulating film on the entire surface of the substrate to cover the wiring layer from the upper side, forming a connection hole reaching to the first wiring layer at a predetermined position of the interlayer insulating film, selectively depositing aluminum onto an interior of the connection hole at a volume fraction of 100% or more by CVD to fill the interior of the connection hole, flattening the entire upper surface of the interlayer insulating film including the connection hole filled with aluminum by a polishing process, washing the entire surface flattened by the polishing process, and depositing the metallic film containing aluminum at a predetermined position of the upper surface of the flattened and washed interlayer insulating film and patterning the metallic film, thereby forming a second wiring layer connected to the first wiring layer through aluminum filled in the connection hole.
    • 形成本发明的半导体器件的多层互连的方法包括以下步骤:通过在衬底的绝缘膜上沉积包含铝的金属膜形成第一布线层并对金属膜进行图案化,形成层间绝缘膜 基板的整个表面从上侧覆盖布线层,在层间绝缘膜的预定位置处形成到达第一布线层的连接孔,以选择性的方式将铝沉积到连接孔的内部,体积分数 通过CVD填充100%以上以填充连接孔的内部,通过抛光处理使包括填充有铝的连接孔的层间绝缘膜的整个上表面变平,洗涤通过抛光处理而变平的整个表面,以及沉积 在f的上表面的预定位置处含有铝的金属膜 拉延和洗涤的层间绝缘膜并图案化金属膜,从而形成通过填充在连接孔中的铝连接到第一布线层的第二布线层。
    • 47. 发明授权
    • Heat treatment apparatus
    • 热处理设备
    • US08658951B2
    • 2014-02-25
    • US13092650
    • 2011-04-22
    • Tomihiro YonenagaYumiko Kawano
    • Tomihiro YonenagaYumiko Kawano
    • H05B6/10
    • H01L21/67109H01L21/67303
    • In-plane temperature of each substrate is uniformly controlled at the time of heating substrates placed on a plurality of susceptors, respectively. A heat treatment apparatus is provided with susceptors, i.e., conductive members for placing wafers thereon, having an induction heating body electrically divided into a center portion thereof and a peripheral portion thereof; a quartz boat supporting the susceptors arranged in a row; an induction coil, which is arranged inside a processing chamber to surround the circumference of each of the susceptors and configured such that the temperature of the induction coil can be freely adjusted; and a control unit which performs temperature control by changing the ratio between heat value at the center portion of the induction heating body and that at the peripheral portion, by controlling two high frequency currents of different frequencies to be applied to the induction coil from a high frequency current circuit.
    • 在分别加热放置在多个基座上的基板时,均匀地控制每个基板的面内温度。 一种热处理设备设置有基座,即用于在其上放置晶片的导电构件,具有电分割成其中心部分的感应加热体及其周边部分; 支撑排列成一排的基座的石英舟; 感应线圈,其布置在处理室内部以围绕每个基座的圆周并且被配置为使得感应线圈的温度可以自由地调节; 以及控制单元,其通过改变感应加热体的中心部分的热值与周边部分的热值之比,通过从高电平控制施加到感应线圈的不同频率的两个高频电流来进行温度控制 频率电流电路。
    • 48. 发明申请
    • METHOD FOR FORMING Ge-Sb-Te FILM AND STORAGE MEDIUM
    • 形成Ge-Sb-Te薄膜和储存介质的方法
    • US20130183446A1
    • 2013-07-18
    • US13825579
    • 2011-09-05
    • Yumiko KawanoSusumu Arima
    • Yumiko KawanoSusumu Arima
    • C23C16/06C23C16/44
    • C23C16/06C23C16/305C23C16/44C23C16/45523H01L45/06H01L45/144H01L45/1616
    • Disclosed is a method for forming a Ge—Sb—Te film, in which a substrate is disposed within a process chamber, a gaseous Ge material, a gaseous Sb material, and a Te material are introduced into the process chamber, so that a Ge—Sb—Te film formed of Ge2Sb2Te5 is formed on the substrate by CVD. The method for forming a Ge—Sb—Te film comprises: a step (step 2) wherein the gaseous Ge material and the gaseous Sb material or alternatively a small amount of the gaseous Te material not sufficient for formed of Ge2Sb2Te5 in addition to the gaseous Ge material and the gaseous Sb material are introduced into the process chamber so that a precursor film, which does not contain Te or contains Te in an amount smaller than that in Ge2Sb2Te5, is formed on the substrate; and a step (step 3) wherein the gaseous Te material is introduced into the process chamber and the precursor film is caused to adsorb Te, so that the Te concentration in the film is adjusted.
    • 公开了一种形成Ge-Sb-Te膜的方法,其中将衬底设置在处理室内,气态Ge材料,气态Sb材料和Te材料被引入处理室中,使得Ge 由Ge2Sb2Te5形成的-Sb-Te膜通过CVD形成在基板上。 形成Ge-Sb-Te膜的方法包括:步骤(步骤2),其中气态Ge材料和气态Sb材料或替代地少量气态Te材料不足以形成Ge2Sb2Te5,除了气体 将Ge材料和气态Sb材料引入处理室,使得在基板上形成不含Te或含有Te的量的前体膜,其量小于Ge 2 Sb 2 Te 5中的Te; 和步骤(步骤3),其中将气态Te材料引入处理室,并使前体膜吸附Te,从而调节膜中的Te浓度。
    • 50. 发明申请
    • HEAT TREATMENT APPARATUS
    • 热处理设备
    • US20110210117A1
    • 2011-09-01
    • US13040697
    • 2011-03-04
    • Tomihiro YonenagaYumiko Kawano
    • Tomihiro YonenagaYumiko Kawano
    • H05B6/10
    • C23C16/46H01L21/67109H05B6/105H05B6/365H05B6/44
    • Provided is a heat treatment apparatus which, when simultaneously heating substrates placed on susceptors, is capable of controlling the uniformity of temperature within each substrate. The heat treatment apparatus includes: a reaction tube which performs predetermined treatment to wafers; a plurality of susceptors each of which has a mounting surface for mounting the wafer and is made of a conductive material; a rotatable quartz boat wherein the susceptors spaced apart in a direction perpendicular to the mounting surfaces are arranged and supported in the reaction tube; a magnetic field generating unit which is arranged on a sidewall of the processing chamber and includes a pair of electromagnets which generate an AC magnetic field in a direction parallel to the mounting surfaces of the susceptors and inductively heat the susceptors; and a control unit which controls the AC magnetic field generated by the magnetic field generating unit.
    • 提供一种热处理装置,当同时加热放置在基座上的基板时,能够控制每个基板内的温度均匀性。 热处理装置包括:对晶片进行预定处理的反应管; 多个感受体具有用于安装晶片并由导电材料制成的安装表面; 一个可旋转的石英舟,其中在垂直于安装表面的方向间隔开的基座被布置和支撑在反应管中; 磁场产生单元,其布置在所述处理室的侧壁上,并且包括一对电磁体,所述一对电磁体在平行于所述基座的安装表面的方向上产生交流磁场并感应加热所述基座; 以及控制单元,其控制由磁场产生单元产生的交流磁场。