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41. 发明申请

US20090326879A1 Techniques for Thermal Modeling of Data Centers to Improve Energy Efficiency 有权
标题翻译：数据中心热建模技术提高能源效率
公开(公告)号：US20090326879A1
公开(公告)日：2009-12-31
申请号：US12146852
申请日：2008-06-26
申请人： Hendrik F. Hamann , Madhusudan K. Iyengar , Theodore G. van Kessel
发明人： Hendrik F. Hamann , Madhusudan K. Iyengar , Theodore G. van Kessel
IPC分类号： G06F17/10 , G06G7/56
CPC分类号： G06F1/206 , G06F17/5004 , G06F2217/80 , H05K7/20836 , Y02D10/16
摘要： Techniques for modeling a data center are provided. In one aspect, a method for modeling a data center is provided. The method comprises the following steps. Spatially dense three-dimensional thermal distribution and air flow measurements made in the data center using a mobile off-line surveying system are obtained. A temperature and air flow model for the data center is created using the spatially dense three-dimensional thermal distribution and air flow measurements. The temperature and air flow model is used to make thermal distribution and air flow predictions of the data center. The thermal distribution and air flow predictions are compared with the thermal distribution and air flow measurements made using the mobile off-line surveying system to produce a validated model for the data center.
摘要翻译：提供了数据中心建模技术。在一方面，提供了一种用于建模数据中心的方法。该方法包括以下步骤。获得了使用移动离线测量系统在数据中心进行的空间密集三维热分布和气流测量。使用空间密集的三维热分布和空气流量测量，创建数据中心的温度和气流模型。温度和气流模型用于对数据中心进行热分布和气流预测。将热分布和气流预测与使用移动离线测量系统进行的热分布和气流测量进行比较，以生成数据中心的验证模型。

42. 发明申请

US20080285232A1 Techniques for Data Center Cooling 有权
标题翻译：数据中心冷却技术
公开(公告)号：US20080285232A1
公开(公告)日：2008-11-20
申请号：US11750322
申请日：2007-05-17
申请人： Alan Claassen , Hendrik F. Hamann , Madhusudan K. Iyengar , James Andrew Lacey , Yves C. Martin , Roger R. Schmidt , Theodore Gerard Van Kessel
发明人： Alan Claassen , Hendrik F. Hamann , Madhusudan K. Iyengar , James Andrew Lacey , Yves C. Martin , Roger R. Schmidt , Theodore Gerard Van Kessel
IPC分类号： H05K7/20
CPC分类号： H05K7/20754 , H05K7/20736 , H05K7/20745
摘要： Techniques for cooling in a data center are provided. In one aspect a computer equipment rack is provided comprising one or more air inlets; one or more exhaust outlets, and one or more of: an air inlet duct mounted to the computer equipment rack surrounding at least a portion of the air inlets, the air inlet duct having a lateral dimension that approximates a lateral dimension of the computer equipment rack and a length that is less than a length of the computer equipment rack, and an air exhaust duct mounted to the computer equipment rack surrounding at least a portion of the exhaust outlets, the air exhaust duct having a lateral dimension that approximates the lateral dimension of the computer equipment rack and a length that is less than the length of the computer equipment rack.
摘要翻译：提供了数据中心冷却技术。在一个方面，提供了包括一个或多个空气入口的计算机设备机架; 一个或多个排气口，以及一个或多个：安装到计算机设备机架上的空气入口管道，其围绕空气入口的至少一部分，空气入口管道具有近似于计算机设备机架的横向尺寸的横向尺寸并且长度小于计算机设备机架的长度，以及安装在围绕至少一部分排气出口的计算机设备机架上的排气管，排气管具有接近侧向尺寸的横向尺寸计算机设备机架的长度小于计算机设备机架的长度。

43. 发明申请

US20080281551A1 METHOD AND APPARATUS FOR THREE-DIMENSIONAL MEASUREMENTS 有权
公开(公告)号：US20080281551A1
公开(公告)日：2008-11-13
申请号：US12110698
申请日：2008-04-28
申请人： Hendrik F. Hamann , Madhusudan K. Iyengar , James A. Lacey , Martin P. O'Boyle , Roger R. Schmidt
发明人： Hendrik F. Hamann , Madhusudan K. Iyengar , James A. Lacey , Martin P. O'Boyle , Roger R. Schmidt
IPC分类号： G01K13/00
CPC分类号： G01K1/026 , G01K2213/00
摘要： An apparatus and method for measuring the physical quantities of a data center during operation and method for servicing large-scale computing systems is disclosed. The apparatus includes a cart that supports a plurality of sensors. The cart is moveable within the data center. The sensors capture temperature or other physical parameters within the room. The sensor readings, along with position and orientation information pertaining to the cart are transmitted to a computer system where the data is analyzed to select the optimum temperature or other system environmental parameters for the data center.

44. 发明授权

US07167806B2 Method and system for measuring temperature and power distribution of a device 失效
标题翻译：测量设备温度和功率分布的方法和系统
公开(公告)号：US07167806B2
公开(公告)日：2007-01-23
申请号：US10919692
申请日：2004-08-17
申请人： Hendrik F. Hamann , James A. Lacey , Martin P. O'Boyle , Robert J. von Gutfeld , Jamil A. Wakil , Alan J. Weger
发明人： Hendrik F. Hamann , James A. Lacey , Martin P. O'Boyle , Robert J. von Gutfeld , Jamil A. Wakil , Alan J. Weger
IPC分类号： G06F15/00
CPC分类号： H01L22/34 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic device. In order to determine the chip power distributions the individual temperature fields for each heat source of a given power and size on the chip (as realized by a scanning focused laser beam) are measured under the same cooling conditions. Then the measured chip temperature distribution is represented as a superposition of the temperature fields of these individual heat sources and the corresponding power distribution is calculated with a set of linear equations.
摘要翻译：本发明提供了完全操作的电子设备的实时温度和功率映射。该方法利用红外（IR）温度成像，而IR透明冷却剂直接通过电子设备流经专门设计的单元。为了确定芯片功率分布，在相同的冷却条件下测量芯片上给定功率和尺寸（通过扫描聚焦激光束实现）的每个热源的各个温度场。然后，测量的芯片温度分布被表示为这些单个热源的温度场的叠加，并且用一组线性方程计算相应的功率分布。

45. 发明授权

US06566665B2 Method and apparatus for linking and/or patterning self-assembled objects 有权
标题翻译：用于连接和/或构图自组装物体的方法和装置
公开(公告)号：US06566665B2
公开(公告)日：2003-05-20
申请号：US09930979
申请日：2001-08-17
申请人： John E. E. Baglin , Hendrik F. Hamann , Shouheng Sun
发明人： John E. E. Baglin , Hendrik F. Hamann , Shouheng Sun
IPC分类号： H01J3730
CPC分类号： B82Y30/00 , G03F7/038 , G03F7/165 , G11B5/855 , Y10S977/901
摘要： The invention provides a method and related apparatus to link and/or pattern self-assembled first objects to a second object. Each of the first object (e.g., a nanoparticle) can be embedded in a mobile binder (i.e., a stabilizer). The invention applies energy to the first object and stabilizer, links this first object to the second object, and provides a controlled linkage of the first object with respect to the second object. Applying this procedure to many such objects results in a larger areal arrangement of these linked objects. An appropriate solvent may be used to remove non-linked objects, yielding a patterned array. Thermal annealing can be applied to control the physical and chemical properties of the array.
摘要翻译：本发明提供一种方法和相关装置，用于将自组装的第一物体链接和/或图案化为第二物体。第一物体（例如，纳米颗粒）中的每一个可以嵌入移动的粘合剂（即稳定剂）中。本发明将能量应用于第一物体和稳定器，将该第一物体与第二物体相连，并且提供第一物体相对于第二物体的受控连杆。将此过程应用于许多这样的对象导致这些链接对象的更大的面积排列。可以使用合适的溶剂来除去未连接的物体，产生图案化的阵列。可以应用热退火来控制阵列的物理和化学性质。

46. 发明授权

US06510120B2 Method for writing and/or erasing high density data on a media 有权
标题翻译：在介质上写入和/或擦除高密度数据的方法
公开(公告)号：US06510120B2
公开(公告)日：2003-01-21
申请号：US09773323
申请日：2001-01-31
申请人： Hemantha Kumar Wickramasinghe , Hendrik F. Hamann , Yves Martin
发明人： Hemantha Kumar Wickramasinghe , Hendrik F. Hamann , Yves Martin
IPC分类号： G11B700
CPC分类号： G11B9/00 , B82Y10/00 , G11B9/14 , G11B9/1409 , G11B9/1418 , Y10S977/725 , Y10S977/833 , Y10S977/932 , Y10S977/947
摘要： The invention discloses a method capable of writing/erasing high-density data, preferably on a phase-change recording media. A preferred embodiment of the invention features a novel thermal near-field heater that may be employed in an assembly enabled by the present method. The method may be preferably used for writing in a substantially thermal near-field mode. The invention provides advantages of writing densities greater than that of diffraction limited systems, for example, writing densities of approximately greater than 100 Gbit/inch2, and writing speeds approximately greater than 100 MHz.
摘要翻译：本发明公开了一种能够写入/擦除高密度数据的方法，优选地在相变记录介质上。本发明的一个优选实施例的特征在于一种新的热近场加热器，其可以用于通过本方法实现的组件中。该方法可以优选用于以基本上热的近场模式进行写入。本发明提供的写入密度大于衍射受限系统的密度，例如大约大于100Gbit / inch2的写入密度以及大约大于100MHz的写入速度。

47. 发明授权

US08308968B2 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth 有权
公开(公告)号：US08308968B2
公开(公告)日：2012-11-13
申请号：US12536156
申请日：2009-08-05
申请人： Guy M. Cohen , Hendrik F. Hamann
发明人： Guy M. Cohen , Hendrik F. Hamann
IPC分类号： G01Q30/00
CPC分类号： G01Q70/12 , G01Q60/22
摘要： A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.

48. 发明申请

US20120284216A1 Knowledge-Based Models for Data Centers 审中-公开
标题翻译：基于知识的数据中心模型
公开(公告)号：US20120284216A1
公开(公告)日：2012-11-08
申请号：US13549428
申请日：2012-07-14
申请人： Hendrik F. Hamann , Raymond Lloyd , Wanli Min
发明人： Hendrik F. Hamann , Raymond Lloyd , Wanli Min
IPC分类号： G06F15/18
CPC分类号： G06F1/206 , G06N3/02 , H05K7/20836 , Y02D10/16
摘要： Techniques for data center analysis are provided. In one aspect, a method for modeling thermal distributions in a data center includes the following steps. Vertical temperature distribution data is obtained for a plurality of locations throughout the data center and is plotted as an s-curve, wherein the vertical temperature distribution data reflects physical conditions at each of the locations which is reflected in a shape of the s-curve. Each of the s-curves is represented with a set of parameters that characterize the shape of the s-curve, wherein the s-curve representations make up a knowledge base model of predefined s-curve types from which thermal distributions and associated physical conditions at the plurality of locations throughout the data center can be analyzed. The set of parameters that characterize the shape of the s-curve are associated with the physical conditions at the plurality of locations throughout the data center using a machine-learning model.
摘要翻译：提供数据中心分析技术。一方面，用于对数据中心中的热分布进行建模的方法包括以下步骤。对于整个数据中心的多个位置获得垂直温度分布数据，并将其绘制为s曲线，其中垂直温度分布数据反映了以s曲线的形状反映的每个位置处的物理条件。每个s曲线由表征s曲线形状的一组参数表示，其中s曲线表示构成了预定S曲线类型的知识库模型，从该曲线形式中的热分布和相关的物理条件可以分析整个数据中心的多个位置。表征s曲线形状的参数集合与使用机器学习模型的整个数据中心的多个位置处的物理条件相关联。

49. 发明授权

US08244502B2 Knowledge-based models for data centers 有权
标题翻译：基于知识的数据中心模型
公开(公告)号：US08244502B2
公开(公告)日：2012-08-14
申请号：US12540213
申请日：2009-08-12
申请人： Hendrik F. Hamann , Raymond Lloyd , Wanli Min
发明人： Hendrik F. Hamann , Raymond Lloyd , Wanli Min
IPC分类号： G06F17/50
CPC分类号： G06F1/206 , H05K7/20836
摘要： Techniques for data center analysis are provided. In one aspect, a method for modeling thermal distributions in a data center is provided. The method includes the following steps. Vertical temperature distribution data is obtained for a plurality of locations throughout the data center. The vertical temperature distribution data for each of the locations is plotted as an s-curve, wherein the vertical temperature distribution data reflects physical conditions at each of the locations which is reflected in a shape of the s-curve. Each of the s-curves is represented with a set of parameters that characterize the shape of the s-curve, wherein the s-curve representations make up a knowledge base model of predefined s-curve types from which thermal distributions and associated physical conditions at the plurality of locations throughout the data center can be analyzed.
摘要翻译：提供数据中心分析技术。在一方面，提供了一种用于对数据中心中的热分布建模的方法。该方法包括以下步骤。在整个数据中心的多个位置获得垂直的温度分布数据。每个位置的垂直温度分布数据被绘制为s曲线，其中垂直温度分布数据反映了以s曲线的形状反映的每个位置处的物理条件。每个s曲线用表征s曲线形状的一组参数表示，其中s曲线表示构成了预定义的s曲线类型的知识库模型，其中热分布和相关联的物理条件可以分析整个数据中心的多个位置。

50. 发明授权

US08220068B2 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth 有权
标题翻译：通过纳米线生长形成的单片高宽比纳米尺寸扫描探针显微镜（SPM）尖端
公开(公告)号：US08220068B2
公开(公告)日：2012-07-10
申请号：US12533427
申请日：2009-07-31
申请人： Guy M. Cohen , Hendrik F. Hamann
发明人： Guy M. Cohen , Hendrik F. Hamann
IPC分类号： G01Q70/12
CPC分类号： G01Q70/12 , G01Q60/22
摘要： A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.
摘要翻译：公开了一种扫描探针，其中微加工金字塔尖端通过外延纳米线从尖端的顶部生长而延伸。诸如金的金属颗粒可以终止纳米线以实现无孔近场光学显微镜探针。

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