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    • 49. 发明授权
    • Switching mode power supply and driving method
    • 开关电源和驱动方式
    • US07672146B2
    • 2010-03-02
    • US11807460
    • 2007-05-29
    • Young-Bae ParkGwan-Bon Koo
    • Young-Bae ParkGwan-Bon Koo
    • H02M3/335
    • H02M3/33515H02M3/33523
    • A switching mode power supply includes a switching transistor, coupled to a primary coil at a primary side of a transformer for converting an input DC voltage, supplying power to a secondary and a tertiary coil at a secondary side of the transformer according to an operation of the switching transistor; a switching controller receiving a feedback voltage corresponding to a first voltage generated in the secondary coil and receiving a detection signal corresponding to a current of the switching transistor to generate a switching control signal for controlling the turn on/off of the switching transistor; and a feedback signal generator receiving the first voltage and the switching control signal to set a sampling period, and storing the first voltage, sampled with a last pulse of the first pulse string within the sampling period as a feedback voltage. The output voltage is thereby accurately detected without opto-couplers or shunt regulators.
    • 开关电源包括开关晶体管,其耦合到变压器的初级侧的初级线圈,用于转换输入直流电压,根据变压器的次级侧向次级侧的次级侧和第三级线圈供电 开关晶体管; 接收与所述次级线圈中产生的第一电压相对应的反馈电压的开关控制器,并接收对应于所述开关晶体管的电流的检测信号,以产生用于控制所述开关晶体管的导通/截止的开关控制信号; 以及反馈信号发生器,接收第一电压和开关控制信号以设置采样周期,并且将在采样周期内的第一脉冲串的最后脉冲采样的第一电压存储为反馈电压。 因此,在没有光耦合器或分流稳压器的情况下,可以精确地检测输出电压。
    • 50. 发明申请
    • THIN FILM TRANSISTOR ARRAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME AND SYSTEM FOR INSPECTING THE SUBSTRATE
    • 薄膜晶体管阵列基板,其制造方法和用于检测基板的系统
    • US20100044707A1
    • 2010-02-25
    • US12574915
    • 2009-10-07
    • Hyang-Shik KONGSung-Wook HuhYoung-Bae Park
    • Hyang-Shik KONGSung-Wook HuhYoung-Bae Park
    • H01L29/786
    • G02F1/1362G02F1/13458G02F2001/136254H01L21/32134H01L21/32136H01L27/124H01L27/1255H01L27/1288
    • Disclosed is a thin film transistor substrate and a system for inspecting the same. The thin film transistor substrate comprises gate wiring formed on an insulation substrate and including gate lines, and gate electrodes and gate pads connected to the gate lines; a gate insulation layer covering the gate wiring; a semiconductor layer formed over the gate insulation layer; data wiring formed over the gate insulation layer and including data pads; a protection layer covering the data wiring; auxiliary pads connected to the data pads through contact holes formed in the protection layer; and a pad auxiliary layer formed protruding a predetermined height under the data pads. The inspection system for determining whether a thin film transistor substrate is defective, in which the thin film transistor substrate comprises gate wiring including gate lines, gate electrodes and gate pads, and data wiring including source electrodes and drain electrodes, includes a probe pin for contacting the gate pads or data pads and transmitting a corresponding signal, wherein a contact tip at a distal end of the probe pin for contacting the gate pads or the data pads is rounded, and a radius of the rounded contact tip is 2 μm or less, or the rounded contact tip is coated with gold (Au).
    • 公开了一种薄膜晶体管基板及其检查系统。 薄膜晶体管基板包括形成在绝缘基板上并包括栅极线的栅极布线,以及连接到栅极线的栅电极和栅极焊盘; 覆盖栅极布线的栅极绝缘层; 形成在所述栅绝缘层上的半导体层; 数据布线形成在栅极绝缘层上并包括数据焊盘; 覆盖数据线的保护层; 辅助焊盘通过形成在保护层中的接触孔连接到数据焊盘; 以及在数据焊盘下方突出预定高度形成的焊盘辅助层。 用于确定薄膜晶体管基板是否缺陷的检查系统,其中薄膜晶体管基板包括包括栅极线,栅电极和栅极焊盘的栅极布线,以及包括源电极和漏电极的数据布线,包括用于接触的探针 所述栅极焊盘或数据焊盘并传输相应的信号,其中用于接触所述栅极焊盘或所述数据焊盘的所述探针的远端处的接触尖端是圆形的,并且所述圆形接触尖端的半径为2μm或更小, 或圆形接触尖端涂有金(Au)。