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    • 41. 发明公开
    • 아미드계 화합물을 포함하는 포토레지스트 박리액 및 이를이용한 박리 방법
    • 含有粘合剂的光电离子液体和使用其的剥离光电子的方法
    • KR1020080017849A
    • 2008-02-27
    • KR1020060079578
    • 2006-08-22
    • 동우 화인켐 주식회사
    • 홍형표김병묵김태희
    • G03F7/42
    • A photoresist stripping solution, and a stripping method using the stripping solution are provided to improve the stripping effect of a cured photoresist film and to prevent the corrosion of a metal wiring and an interlayer insulating layer by lowering the surface tension of a stripping solution. A photoresist stripping solution comprises an amide-based compound represented by the formula 1, wherein R1 is H, a C1-C10 linear or branched alkyl group, a C5-C8 cycloalkyl group or a C6-C10 aryl group. Also the photoresist stripping solution comprises 1-20 wt% of an amide-based compound represented by the formula 1; 5-50 wt% of a water-soluble organic amine-based compound; 1-20 wt% of a hydroxyl amine salt-based compound; 1-40 wt% of a water-soluble polar aprotic solvent; 1-20 wt% of an alkylene glycol alkyl ether compound; 0.1-10 wt% of a compound represented by the formula 2; 0.1-10 wt% of an aromatic hydroxy compound; and 10-50 wt% of deionized water, wherein R2 and R3 are identical or different each other and are H, a carboxyl group, an alkylcarbonyl group, a hydroxyl group or an alkyl group.
    • 提供光致抗蚀剂剥离溶液和使用剥离溶液的剥离方法以改善固化的光致抗蚀剂膜的剥离效果,并通过降低剥离溶液的表面张力来防止金属布线和层间绝缘层的腐蚀。 光致抗蚀剂剥离溶液包含由式1表示的酰胺类化合物,其中R1是H,C1-C10直链或支链烷基,C5-C8环烷基或C6-C10芳基。 光致抗蚀剂剥离溶液也包含1-20重量%的由式1表示的酰胺类化合物; 5-50重量%的水溶性有机胺系化合物; 1-20重量%的羟胺盐类化合物; 1-40重量%的水溶性极性非质子溶剂; 1-20重量%的亚烷基二醇烷基醚化合物; 0.1-10重量%的由式2表示的化合物; 0.1-10重量%的芳族羟基化合物; 和10-50重量%的去离子水,其中R2和R3相同或不同,为H,羧基,烷基羰基,羟基或烷基。
    • 43. 发明公开
    • 구리용 레지스트 제거용 조성물
    • 铜或铜合金剥离组合物
    • KR1020100125108A
    • 2010-11-30
    • KR1020090044149
    • 2009-05-20
    • 동우 화인켐 주식회사
    • 홍형표홍헌표김태희김병묵
    • G03F7/42
    • G03F7/425C07D295/15C11D3/2068C11D11/0047G03F7/0045G03F7/0397G03F7/0757G03F7/091
    • PURPOSE: A stripper composition for copper or copper alloy is provided to be applied in a dip method and spray type stripping process and to remove a photoresist film hardened by a photolithographic process and wet etch process. CONSTITUTION: A stripper composition for copper or copper alloy comprises (A) 0.1-30 weight% tertiary cyclic amine compound represented by chemical formula 1 or 2, (B) 0.01-10 weight% additive, and (C) the balance of organic solvent. In chemical formula 1 and 2, R1-R6 are independently hydrogen, C1~C10 linear or branched alkyl group; n1 and n3 are independently an integer of 0 or 1; n2 and n4 are independently an integer of 0-4; X1 and X2 are independently S, and O or N; and Y is a hydroxy group or amino group.
    • 目的:提供用于铜或铜合金的汽提器组合物,以浸渍法和喷雾型剥离方法施加,并除去通过光刻工艺和湿蚀刻工艺硬化的光致抗蚀剂膜。 构成:铜或铜合金的剥离剂组合物包含(A)0.1-30重量%的由化学式1或2表示的叔环状胺化合物,(B)0.01-10重量%的添加剂,和(C)余量的有机溶剂 。 在化学式1和2中,R 1 -R 6独立地是氢,C 1〜C 10直链或支链烷基; n1和n3独立地为0或1的整数; n2和n4独立地为0-4的整数; X 1和X 2独立地为S,O或N; Y为羟基或氨基。
    • 44. 发明公开
    • 포토레지스트 박리액 조성물 및 이를 이용한포토레지스트의 박리방법
    • 光电子剥离器组合物,以及使用其的光电离子的挥发方法
    • KR1020080045501A
    • 2008-05-23
    • KR1020060114700
    • 2006-11-20
    • 동우 화인켐 주식회사
    • 김태희박면규정진우
    • G03F7/42
    • A photoresist stripper composition is provided to ensure excellent corrosion resistance to a substrate on which a multiple-junction metal wiring containing silver is formed, and to be rinsed with only water without using a separate organic solvent during a rinsing process. A non-aqueous photoresist stripper composition that does not cause corrosion of silver wiring, includes 10-40wt% of an organic amine-based compound, 30-80wt% of a polar organic solvent, and 0.1-10wt% of a triazole-based compound. A method for stripping photoresist includes the steps of: (a) applying a photoresist composition onto a substrate having a metal layer, and drying the coated substrate to form a photoresist film; (b) exposing the photoresist film to a light selectively, and developing the exposed photoresist film to form a photoresist pattern; (c) etching the substrate using the photoresist pattern as a mask; and (d) removing the photoresist pattern from the substrate using the non-aqueous photoresist stripper composition.
    • 提供光致抗蚀剂剥离剂组合物以确保对其中形成含有银的多结金属配线的基板的优异的耐腐蚀性,并且在漂洗过程中仅使用水而不使用单独的有机溶剂进行冲洗。 不引起银线腐蚀的非水性光致抗蚀剂剥离剂组合物包含10〜40重量%的有机胺系化合物,30〜80重量%的极性有机溶剂和0.1〜10重量%的三唑系化合物 。 剥离光刻胶的方法包括以下步骤:(a)将光致抗蚀剂组合物涂覆到具有金属层的基底上,并干燥涂覆的基底以形成光致抗蚀剂膜; (b)将光致抗蚀剂膜选择性地曝光,并使曝光的光致抗蚀剂膜显影以形成光致抗蚀剂图案; (c)使用光致抗蚀剂图案作为掩模蚀刻基板; 和(d)使用非水性光致抗蚀剂剥离剂组合物从基材上除去光刻胶图案。
    • 45. 发明公开
    • 포토레지스트 박리용 조성물 및 이를 이용한 박리 방법
    • 光电离子组合物和使用它的光电离子的挥发方法
    • KR1020080031565A
    • 2008-04-10
    • KR1020060097584
    • 2006-10-04
    • 동우 화인켐 주식회사
    • 홍형표김태희김병묵
    • G03F7/42
    • A photoresist stripper composition is provided to ensure excellent removability of photoresist cured after an ion injection process or an ion injection process and a high-temperature etching process, and minimize corrosion of film. A photoresist stripper composition includes 5-50wt% of an alkaline compound, 1-40wt% of a water-soluble polar solvent compound, 5-40wt% of an alkyleneglycol alkylether compound, 5-40wt% of a deionized distilled water, 0.01-10wt% of a corrosion inhibitor, 0.01-10wt% of a pH control agent, and 0.001-10wt% of a fluorinated compound. The molar ratio of fluorine ions/hydroxide ions contained in the composition is 1x10^(-6) - 1.
    • 提供光致抗蚀剂剥离剂组合物以确保在离子注入工艺或离子注入工艺和高温蚀刻工艺之后固化的光致抗蚀剂的优异的可除去性,并且使膜的腐蚀最小化。 光致抗蚀剂剥离剂组合物包括5-50重量%的碱性化合物,1-40重量%的水溶性极性溶剂化合物,5-40重量%的亚烷基二醇烷基醚化合物,5-40重量%的去离子蒸馏水,0.01-10重量% %的腐蚀抑制剂,0.01-10重量%的pH控制剂和0.001-10重量%的氟化化合物。 组合物中所含的氟离子/氢氧根离子的摩尔比为1×10 ^( - 6)-1。
    • 48. 发明公开
    • 구리용 레지스트 제거용 조성물
    • 铜或铜合金剥离组合物
    • KR1020100125109A
    • 2010-11-30
    • KR1020090044150
    • 2009-05-20
    • 동우 화인켐 주식회사
    • 홍형표홍헌표김태희김병묵
    • G03F7/42
    • G03F7/425C07D213/643C07D307/93C07D491/048C11D3/2068C11D11/0047G03F7/039
    • PURPOSE: A stripper composition for copper or copper alloy is provided to enable applications to a dip method, single wafer method and spray stripping processes and to minimize the corrosion of an insulating layer without isopropanol. CONSTITUTION: A stripper composition for copper or copper alloy comprises (A) 0.1-30 weight% cyclic compound represented by chemical formula 1 or 2, and (B) the remaining amount of organic solvents. In chemical formula 1 and 2, R1, R2 and R4 are independently hydrogen, C1~C10 linear or branched alkyl group, C6~C10 aryl group, and C1~C10 linear or branched alkylamino group; R3 and R5 are hydrogen, C1~C10 linear or branched alkyl group, C6~C10 aryl group, and C1~C10 linear or branched alkylamino group or amino group; X1 is C, S, O or N; n1 is an integer of 1 or 2; and n2 is an integer of 1-4.
    • 目的:提供用于铜或铜合金的脱模剂组合物,以使应用于浸渍法,单晶法和喷雾剥离工艺,并且使不含异丙醇的绝缘层的腐蚀最小化。 构成:铜或铜合金的剥离剂组合物包含(A)0.1-30重量%的由化学式1或2表示的环状化合物,和(B)剩余量的有机溶剂。 在化学式1和化学式2中,R 1,R 2和R 4独立地为氢,C 1〜C 10直链或支链烷基,C 6〜C 10芳基,C 1〜C 10直链或支链烷基氨基; R3和R5是氢,C1〜C10直链或支链烷基,C6〜C10芳基和C1〜C10直链或支链烷基氨基或氨基; X1为C,S,O或N; n1为1或2的整数; n2为1-4的整数。
    • 49. 发明公开
    • 구리용 레지스트 제거용 조성물
    • 可兼容的电阻去除组合物
    • KR1020100011472A
    • 2010-02-03
    • KR1020080072706
    • 2008-07-25
    • 동우 화인켐 주식회사
    • 홍헌표홍형표김병묵김태희
    • G03F7/34G03F7/42
    • G03F7/425C08F220/22C11D3/2068C11D11/0047G03F7/004G03F7/422
    • PURPOSE: A Cu-compatible resist removing composition is provided to be applied to a dip type, single type, and spray type stripping processes and to remove a photoresist film hardened by severe photolithography and wet etch processes in a short time. CONSTITUTION: A Cu-compatible resist removing composition comprises (A) 1-10 weight% tertiary alkanolamine represented by chemical formula 1, (B) the remaining amount of solvent including an amide functional group represented by chemical formula 2, and (C) 0.1-5 weight% additive including an azole compound and hydroxy benzene compound. In chemical formulae 1 and 2, R1 and R2 are independently C1-6 alkyl group, C1-6 hydroxy alkyl group or C1-6 amino alkyl group.
    • 目的:提供Cu兼容的抗蚀剂去除组合物以适用于浸渍型,单一型和喷雾型剥离工艺,并在短时间内除去通过严格光刻和湿法蚀刻工艺硬化的光致抗蚀剂膜。 构成:Cu兼容的抗蚀剂去除组合物包含(A)1-10重量%的由化学式1表示的叔链烷醇胺,(B)包括由化学式2表示的酰胺官能团的溶剂的剩余量和(C)0.1 -5重量%的添加剂,包括唑类化合物和羟基苯化合物。 在化学式1和2中,R 1和R 2独立地为C 1-6烷基,C 1-6羟基烷基或C 1-6氨基烷基。