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31. 发明专利

JP2015072263A X線撮像システム审中-公开
标题翻译： X射线成像系统
公开(公告)号：JP2015072263A
公开(公告)日：2015-04-16
申请号：JP2014178453
申请日：2014-09-02
申请人：キヤノン株式会社
发明人：半田宗一郎
IPC分类号： A61B6/00 , G01N23/04
CPC分类号： G01N23/20075 , G21K1/067 , G01N2223/056 , G01N2223/204 , G01N2223/316
摘要：【課題】サイズの大きいX線源を使用する場合でも、鮮鋭度の高い被検体画像を得ることのできるX線撮像システムを提供する。【解決手段】本発明の第一側面に係るX線撮像システムは、X線源から放射されるX線を部分的に遮蔽することで微小X線源アレイを形成する微小X線源アレイ形成部と、被検体を透過したX線を検出するX線検出器と、を備え、前記微小X線源アレイ形成部は、前記X線源と前記X線検出器のあいだに配置された複数の格子を有し、前記X線源から発生するX線のうち前記複数の格子をすべて通過し得る通過X線の割合が前記X線源上のX線発生点の位置に依存して変化することにより、通過X線の割合の変化に応じたパターンの微小X線源アレイを形成するものである。【選択図】図2
摘要翻译：要解决的问题：提供即使使用大的X射线源也能够获得高度清晰的标本图像的X射线成像系统。解决方案：根据本发明的一个方面的X射线成像系统包括：通过部分地屏蔽从X射线源发射的X射线而形成微小X射线源阵列的X射线源阵列形成部; 以及X射线检测器，其检测穿过样本的X射线。微小X射线源阵列形成部具有配置在X射线源和X射线检测器之间的多个光栅。在X射线源产生的X射线中能够穿过所有多个光栅的透射X射线的速度根据X射线源上的X射线产生点的位置而变化，从而形成分钟 X射线源阵列具有对应于透射X射线速率变化的图案。

32. 发明专利

JP5550082B2 X-ray irradiation apparatus and analysis apparatus 有权
公开(公告)号：JP5550082B2
公开(公告)日：2014-07-16
申请号：JP2012508093
申请日：2011-03-30
申请人：独立行政法人物質・材料研究機構 , アルバック・ファイ株式会社
发明人：拡路山瑞 , 啓介小林 , 秀夫岩井 , 小畠　　雅明
IPC分类号： H05G2/00
CPC分类号： G01N23/2273 , G01N2223/204 , G01N2223/206 , G21K1/06 , G21K7/00 , H01J35/28 , H01J35/30 , H01J2235/081 , H01J2235/086 , H01J2235/163

33. 发明授权

US11921059B2 Inspection apparatus and inspection method 有权
公开(公告)号：US11921059B2
公开(公告)日：2024-03-05
申请号：US18350093
申请日：2023-07-11
申请人： Canon Anelva Corporation
发明人： Takeo Tsukamoto
IPC分类号： G01N23/04 , G01N23/083 , G01N23/18 , G01N23/20008 , G01N23/2206 , G01N23/223 , G21K7/00 , H01J35/18
CPC分类号： G01N23/18 , G01N23/04 , G01N23/083 , G01N23/20008 , G01N23/2206 , G01N23/223 , G21K7/00 , H01J35/186 , G01N2223/04 , G01N2223/052 , G01N2223/071 , G01N2223/076 , G01N2223/1016 , G01N2223/20 , G01N2223/204 , G01N2223/32 , G01N2223/643 , G01N2223/652
摘要： An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.

34. 发明公开

US20230408425A1 Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System 审中-公开
公开(公告)号：US20230408425A1
公开(公告)日：2023-12-21
申请号：US18241417
申请日：2023-09-01
申请人： Phoenix, LLC
发明人： Tye Gribb , Lucas Jacobson
IPC分类号： G01N23/02
CPC分类号： G01N23/025 , G01N2223/204 , G01N2223/316
摘要： A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface having a concave curvature facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator.

35. 发明授权

US11774375B1 Re-entrant cones for moderator chamber of a neutron imaging system 有权
公开(公告)号：US11774375B1
公开(公告)日：2023-10-03
申请号：US17721980
申请日：2022-04-15
申请人： Phoenix, LLC
发明人： Tye Gribb , Lucas Jacobson
IPC分类号： G01N23/05 , G01N23/02
CPC分类号： G01N23/025 , G01N2223/204 , G01N2223/316
摘要： A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator. Furthermore, the entrance surface is shaped such that source neutrons produced at the beam target impinge the entrance surface with a neutron flux that varies by 10% or less along the entrance surface.

36. 发明公开

US20230238204A1 X-RAY IMAGING SYSTEM 审中-公开
公开(公告)号：US20230238204A1
公开(公告)日：2023-07-27
申请号：US17923259
申请日：2021-04-29
申请人： Excillum AB
发明人： Björn HANSSON , Julius HÅLLSTEDT , Tomi TUOHIMAA , Ulf LUNDSTRÖM , Daniel NILSSON
IPC分类号： H01J35/14 , H01J35/30 , G01N23/04
CPC分类号： H01J35/153 , H01J35/30 , G01N23/04 , G01N2223/204
摘要： An X-ray imaging system, including a target; an electron beam source configured to provide an electron beam for interaction with the target to generate X-ray radiation; electron optics configured to alternately direct the electron beam to at least a first and a second location on the target; an X-ray detector array configured to receive X-ray radiation generated at the first and second locations on the target; a sample position region for receiving a sample to be exposed to generated X-ray radiation, the sample position region being located in a region where X-ray radiation generated at the first location overlaps with X-ray radiation generated at the second location; and a processing unit coupled to the X-ray detector array, the processing unit being configured to create an image of a sample, positioned in the sample position region, based on the X-ray radiation originating from the first location and from the second location.

37. 发明申请

US20190189383A1 DEVICES HAVING AN ELECTRON EMITTING STRUCTURE 审中-公开
公开(公告)号：US20190189383A1
公开(公告)日：2019-06-20
申请号：US16285475
申请日：2019-02-26
申请人： NANOX IMAGING PLC
发明人： KOICHI IIDA , HIDENORI KENMOTSU , JUN YAMAZAKI , HITOSHI MASUYA
IPC分类号： H01J3/14 , H01J35/14 , H01J1/304 , H01J3/02 , H01J29/46 , G01N23/046 , H01J35/06 , H01J31/12 , G01T1/161
CPC分类号： H01J35/065 , G01N23/046 , G01N2223/204 , G01N2223/419 , G01T1/161 , H01J1/3042 , H01J3/021 , H01J3/027 , H01J3/14 , H01J29/467 , H01J31/127 , H01J35/14 , H01J2235/068
摘要： Controlling total emission current of an electron emitting construct in an x-ray emitting device by providing a cathode, providing multiple active areas each active area having a gated cone electron source, including multiple emitter tips arranged in an array, a gate electrode, and a gate interconnect lead connected to the gate electrode, providing an x-ray emitting construct comprising an anode, the anode being an x-ray target, situating the x-ray emitting construct facing the active areas face each other, selecting a set of active areas, and activating selected active areas by conductively connecting a voltage source to their associated the gate electrode interconnect lead.

38. 发明授权

US09958403B1 Arrangement for X-Ray tomography 有权
公开(公告)号：US09958403B1
公开(公告)日：2018-05-01
申请号：US15728252
申请日：2017-10-09
申请人： FEI Company
发明人： Pavel Stejskal , Marek Un{hacek over (c)}ovský , Tomá{hacek over (s)} Vystav{hacek over (e)}l , Alan Frank de Jong , Bart Buijsse , Pierre Bleuet
IPC分类号： G01N23/00 , G01N23/04 , G21K7/00
CPC分类号： G01N23/046 , G01N23/2251 , G01N2223/1016 , G01N2223/204 , G01N2223/309 , G01N2223/3306 , G01N2223/401 , G01N2223/417 , G01N2223/419 , G21K7/00 , H01J37/28 , H01J2237/2807
摘要： A method of investigating a specimen using X-ray tomography, comprising (a) mounting the specimen to a specimen holder, (b) irradiating the specimen with a beam of X-rays along a first line of sight through the specimen, and (c) detecting a flux of X-rays transmitted through the specimen and forming a first image. Then (d) repeating the steps (b) and (c) for a series of different lines of sight through the specimen, thereby producing a corresponding series of images. The method further comprises (e) performing a mathematical reconstruction on said series of images, so as produce a tomogram of at least part of the specimen, wherein the specimen is disposed within a substantially cylindrical metallic shell with an associated cylindrical axis, the beam of X-rays is produced by directing a beam of charged particles onto a zone of said metallic shell, so as to produce a confined X-ray source at said zone, and the series of different lines of sight is achieved by rotating said shell about said cylindrical axis, thereby causing relative motion of said zone relative to the specimen.

39. 发明申请

US20130016813A1 X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE 有权
标题翻译： X射线辐射装置和分析装置
公开(公告)号：US20130016813A1
公开(公告)日：2013-01-17
申请号：US13638197
申请日：2011-03-30
申请人： Hiromichi Yamazui , Keisuke Kobayashi , Hideo Iwai , Masaaki Kobata
发明人： Hiromichi Yamazui , Keisuke Kobayashi , Hideo Iwai , Masaaki Kobata
IPC分类号： G21K5/04 , G21K1/06 , H01J35/08
CPC分类号： G01N23/2273 , G01N2223/204 , G01N2223/206 , G21K1/06 , G21K7/00 , H01J35/28 , H01J35/30 , H01J2235/081 , H01J2235/086 , H01J2235/163
摘要： [Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device.[Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.
摘要翻译：本发明提供能够在宽范围内调整X射线能量的X射线照射装置以及配备有X射线照射装置的分析装置。本发明的实施方式的X射线照射装置通过聚焦机构将从X射线产生机构发射的X射线聚焦到预定的焦点位置。 X射线产生机构具有产生具有不同波长的多个X射线的结构。聚焦机构具有通过具有适合于由X射线产生机构产生的各X射线的波长的衍射特性的聚焦元件将多个X射线聚焦到同一焦点位置的结构。

40. 发明申请

US20110186723A1 Apparatus and Method for Pulsed Neutron Generation Including a High Voltage Power Supply 有权
标题翻译：包括高压电源的脉冲中子生成装置和方法
公开(公告)号：US20110186723A1
公开(公告)日：2011-08-04
申请号：US13014211
申请日：2011-01-26
申请人： Constantyn Chalitsios , Yi Liu , Steven Bliven
发明人： Constantyn Chalitsios , Yi Liu , Steven Bliven
IPC分类号： G01V5/10
CPC分类号： H05H3/06 , G01N23/09 , G01N2223/204 , G01N2223/649
摘要： An apparatus for estimating at least one property of an earth formation is disclosed. The apparatus includes: a carrier configured to be disposed in the formation; a neutron tube disposed at the carrier and located on an axis; a high voltage power source disposed in the carrier and electrically connected to the neutron tube, the high voltage power source located remotely from the neutron tube; and at least one detector disposed in the carrier and located proximate to the neutron tube.
摘要翻译：公开了一种用于估计地层的至少一种性质的装置。该装置包括：被配置为设置在地层中的载体; 设置在载体上并位于轴上的中子管; 设置在载体中并与中子管电连接的高压电源，远离中子管的高压电源; 以及设置在载体中并位于中子管附近的至少一个检测器。

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