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    • 32. 发明授权
    • Photodetector circuit, input device, and input/output device
    • 光电检测器电路,输入设备和输入/输出设备
    • US08461590B2
    • 2013-06-11
    • US13313539
    • 2011-12-07
    • Hikaru TamuraYoshiyuki KurokawaTakayuki Ikeda
    • Hikaru TamuraYoshiyuki KurokawaTakayuki Ikeda
    • H01L29/04
    • H01L27/14692
    • An adverse effect of parasitic capacitance on optical data output from a photodetector circuit is suppressed. A photodetector circuit includes a photoelectric conversion element; a first field-effect transistor; a second field-effect transistor; a first conductive layer functioning as a gate of the first field-effect transistor; an insulating layer provided over the first conductive layer; a semiconductor layer overlapping with the first conductive layer with the insulating layer interposed therebetween; a second conductive layer electrically connected to the semiconductor layer; and a third conductive layer electrically connected to the semiconductor layer, whose pair of side surfaces facing each other overlaps with at least one conductive layer including the first conductive layer with the insulating layer interposed therebetween, and which functions as the other of the source and the drain of the first field-effect transistor.
    • 抑制寄生电容对光检测器电路的光数据输出的不良影响。 光检测器电路包括光电转换元件; 第一场效应晶体管; 第二场效应晶体管; 用作第一场效应晶体管的栅极的第一导电层; 设置在第一导电层上的绝缘层; 半导体层与第一导电层重叠,绝缘层插入其间; 电连接到半导体层的第二导电层; 电连接到所述半导体层的第三导电层,所述第三导电层与所述半导体层相对,所述第一导电层的一对侧表面与包括所述第一导电层的至少一个导电层重叠,所述第一导电层的绝缘层位于所述半导体层之间,并且其作为源和 第一场效应晶体管的漏极。
    • 37. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08472235B2
    • 2013-06-25
    • US13048291
    • 2011-03-15
    • Munehiro KozumaYoshiyuki Kurokawa
    • Munehiro KozumaYoshiyuki Kurokawa
    • G11C17/00
    • G11C17/12H01L27/1225H01L29/7869
    • An object is reduction in power consumption of a semiconductor device including a memory circuit. In the semiconductor device including a memory circuit, the memory circuit includes a memory cell including a semiconductor element and a memory cell that does not include a semiconductor element in a region defined by a word line and a bit line which intersect with each other. A transistor formed using an oxide semiconductor so as to have extremely low off-state current is used as the semiconductor element, so that the reading precision is improved and thus low voltage operation can be performed. The memory cells store data high or data low. The memory cell comprising a semiconductor element stores minor data of high and low, and the memory cell that does not comprise the semiconductor element stores major data of high and low.
    • 目的在于减少包括存储电路的半导体器件的功耗。 在包括存储器电路的半导体器件中,存储电路包括存储单元,该存储单元包括半导体元件和存储单元,该半导体元件和存储单元在由彼此相交的字线和位线所限定的区域中不包括半导体元件。 使用以氧化物半导体形成为具有非常低的截止电流的晶体管作为半导体元件,从而提高读取精度,从而可以进行低电压工作。 存储单元存储数据高或数据量低。 包括半导体元件的存储单元存储高和低的次要数据,并且不包括半导体元件的存储单元存储高和低的主要数据。
    • 38. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20110235389A1
    • 2011-09-29
    • US13048291
    • 2011-03-15
    • Munehiro KozumaYoshiyuki Kurokawa
    • Munehiro KozumaYoshiyuki Kurokawa
    • G11C17/12
    • G11C17/12H01L27/1225H01L29/7869
    • An object is reduction in power consumption of a semiconductor device including a memory circuit. In the semiconductor device including a memory circuit, the memory circuit includes a memory cell including a semiconductor element and a memory cell that does not include a semiconductor element in a region defined by a word line and a bit line which intersect with each other. A transistor formed using an oxide semiconductor so as to have extremely low off-state current is used as the semiconductor element, so that the reading precision is improved and thus low voltage operation can be performed. The memory cells store data high or data low. The memory cell comprising a semiconductor element stores minor data of high and low, and the memory cell that does not comprise the semiconductor element stores major data of high and low.
    • 目的在于减少包括存储电路的半导体器件的功耗。 在包括存储器电路的半导体器件中,存储电路包括存储单元,该存储单元包括半导体元件和存储单元,该半导体元件和存储单元在由彼此相交的字线和位线所限定的区域中不包括半导体元件。 使用以氧化物半导体形成为具有非常低的截止电流的晶体管作为半导体元件,从而提高读取精度,从而可以进行低电压工作。 存储单元存储数据高或数据量低。 包括半导体元件的存储单元存储高和低的次要数据,并且不包括半导体元件的存储单元存储高和低的主要数据。
    • 40. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08716712B2
    • 2014-05-06
    • US13027488
    • 2011-02-15
    • Munehiro KozumaYoshiyuki Kurokawa
    • Munehiro KozumaYoshiyuki Kurokawa
    • H01L27/146
    • H01L27/14643H01L27/14603H01L27/14607H01L27/14609
    • An object of the invention is to improve the accuracy of light detection in a photosensor, and to increase the light-receiving area of the photosensor. The photosensor includes: a light-receiving element which converts light into an electric signal; a first transistor which transfers the electric signal; and a second transistor which amplifies the electric signal. The light-receiving element includes a silicon semiconductor, and the first transistor includes an oxide semiconductor. The light-receiving element is a lateral-junction photodiode, and an n-region or a p-region included in the light-receiving element overlaps with the first transistor.
    • 本发明的目的是提高光传感器中光检测的精度,并增加光传感器的光接收面积。 光传感器包括:将光转换成电信号的光接收元件; 传输电信号的第一晶体管; 以及放大电信号的第二晶体管。 光接收元件包括硅半导体,并且第一晶体管包括氧化物半导体。 光接收元件是横向结光电二极管,并且包含在光接收元件中的n区域或p区域与第一晶体管重叠。