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    • 35. 发明申请
    • Semiconductor light generating device
    • 半导体发光装置
    • US20080076199A1
    • 2008-03-27
    • US11979873
    • 2007-11-09
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • H01L21/00
    • H01L33/32H01L33/02H01L33/025H01L33/06
    • The semiconductor light generating device comprises a light generating region 3, a first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 and a second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7. In this semiconductor light generating device, the light generating region 3 is made of III-nitride semiconductor, and includes a InAlGAN semiconductor layer. The first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 is doped with a p-type dopant, such as magnesium, and is provided on the light generating region 3. The second AlX2Ga1-X2N semiconductor layer 7 has a p-type concentration smaller than the first AlX1Ga1-X1N semiconductor layer 5. The second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7 is provided between the light generating region 3 and the first AlX1Ga1-X1N semiconductor layer 5.
    • 半导体光产生装置包括发光区域3,第一Al 1 N 1 Ga 1-X1 N半导体(0 <= X1 <= 1)层5和第二层 Al x X2 Ga 1-X2 N半导体(0 <= X2 <= 1)层7.在该半导体光产生装置中,光产生区3由III 氮化物半导体,并且包括InAlGAN半导体层。 第一Al X1 N 1 Ga 1-X1 N半导体(0 <= X1 <= 1)层5掺杂有诸如镁的p型掺杂剂,并且是 设置在发光区域3上。第二Al X2 X2 Ga 1-X2 N半导体层7的p型浓度比第一Al X1 < 第一Al 2 N 2 Ga 1-X 2 N半导体(0 <= X2 <= 1 / 1)层7设置在发光区域3和第一Al 1 N 1 Ga 1-X1 N半导体层5之间。
    • 36. 发明授权
    • Semiconductor light generating device
    • 半导体发光装置
    • US07294867B2
    • 2007-11-13
    • US11032230
    • 2005-01-11
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • H01L33/00H01L29/24
    • H01L33/32H01L33/02H01L33/025H01L33/06
    • The semiconductor light generating device comprises a light generating region 3, a first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 and a second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7. In this semiconductor light generating device, the light generating region 3 is made of III-nitride semiconductor, and includes a InAlGaN semiconductor layer. The first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 is doped with a p-type dopant, such as magnesium, and is provided on the light generating region 3. The second AlX2Ga1-X2N semiconductor layer 7 has a p-type concentration smaller than the first AlX1Ga1-X1N semiconductor layer 5. The second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7 is provided between the light generating region 3 and the first AlX1Ga1-X1N semiconductor layer 5.
    • 半导体光产生装置包括发光区域3,第一Al X1 X 1 Ga 1-X1 N半导体(0 <= X 1 <= 1)层5和 第二Al x X2 Ga 1-X2 N半导体(0 <= X 2 <= 1)层7。 在该半导体发光元件中,发光区域3由III族氮化物半导体构成,具有InAlGaN半导体层。 第一Al X1 X1&lt; 1-X1&gt; N半导体(0 <= X 1 <= 1)层5掺杂有诸如镁的p型掺杂剂,以及 设置在发光区域3上。 第二Al X2 X2 Ga 1-X2 N半导体层7的p型浓度比第一Al X1 Ga 1 -X1 N半导体层5。 第二Al X2 X2 Ga 1-X2 N半导体(0 <= X 2 <= 1)层7设置在发光区3和第一Al X1 1-X1 N半导体层5。
    • 37. 发明授权
    • Semiconductor light generating device
    • 半导体发光装置
    • US07508011B2
    • 2009-03-24
    • US11979873
    • 2007-11-09
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • Katsushi AkitaTakao NakamuraHideki Hirayama
    • H01L33/00
    • H01L33/32H01L33/02H01L33/025H01L33/06
    • The semiconductor light generating device comprises a light generating region 3, a first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 and a second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7. In this semiconductor light generating device, the light generating region 3 is made of III-nitride semiconductor, and includes a InAlGAN semiconductor layer. The first AlX1Ga1-X1N semiconductor (0≦X1≦1) layer 5 is doped with a p-type dopant, such as magnesium, and is provided on the light generating region 3. The second AlX2Ga1-X2N semiconductor layer 7 has a p-type concentration smaller than the first AlX1Ga1-X1N semiconductor layer 5. The second AlX2Ga1-X2N semiconductor (0≦X2≦1) layer 7 is provided between the light generating region 3 and the first AlX1Ga1-X1N semiconductor layer 5.
    • 半导体光产生装置包括光产生区3,第一AlX1Ga1-X1N半导体(0 <= X1 <= 1)层5和第二AlX2Ga1-X2N半导体(0 <= X2 <= 1)层7.在此 半导体发光器件,光生成区域3由III族氮化物半导体构成,并且包括InAlGAN半导体层。 第一AlX1Ga1-X1N半导体(0 <= X1 <= 1)层5掺杂有诸如镁的p型掺杂剂,并且设置在发光区域3上。第二AlX2Ga1-X2N半导体层7具有 p型浓度比第一AlX1Ga1-X1N半导体层5小。第二AlX2Ga1-X2N半导体(0 <= X2 <= 1)层7设置在发光区域3和第一AlX1Ga1-X1N半导体层5之间。