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    • 37. 发明申请
    • Diffraction order controlled overlay metrology
    • 衍射顺序控制重叠度量
    • US20060197951A1
    • 2006-09-07
    • US11363755
    • 2006-02-27
    • Aviv FrommerVladimir LevinskiMark SmithJeffrey ByersChris MackMichael Adel
    • Aviv FrommerVladimir LevinskiMark SmithJeffrey ByersChris MackMichael Adel
    • G01B11/00
    • G03F9/7049G03F7/70633G03F9/7088
    • In one embodiment, a system for imaging an acquisition target or an overlay or alignment semiconductor target is disclosed. The system includes a beam generator for directing at least one incident beam having a wavelength λ towards a periodic target having structures with a specific pitch p. A plurality of output beams are scattered from the periodic target in response to the at least one incident beam. The system further includes an imaging lens system for passing only a first and a second output beam from the target. The imaging system is adapted such that the angular separation between the captured beams, λ, and the pitch are selected to cause the first and second output beams to form a sinusoidal image. The system also includes a sensor for imaging the sinusoidal image or images, and a controller for causing the beam generator to direct the at least one incident beam towards the periodic target or targets, and for analyzing the sinusoidal image or images. In one application the detector detects a sinusoidal image of an acquisition target with the same pitch as the designed target and the controller analyzes the pitch of the sinusoidal image compared to design data to determine whether the target has been successfully acquired. In a second application a first and second periodic target that each have a specific pitch p are imaged so that the detector detects a first sinusoidal image of the first target and a second sinusoidal image of the second target and the controller analyzes the first and second sinusoidal image to determine whether the first and second targets have an overlay or alignment error.
    • 在一个实施例中,公开了一种用于对采集目标或覆盖或对准半导体目标进行成像的系统。 该系统包括用于将具有波长λ的至少一个入射光束朝向具有特定间距p的结构的周期性目标引导的光束发生器。 响应于至少一个入射光束,多个输出光束从周期性靶标散射。 该系统还包括用于仅从目标通过第一和第二输出光束的成像透镜系统。 成像系统被适配成使得捕获的光束λ和间距之间的角度间隔被选择为使得第一和第二输出光束形成正弦图像。 该系统还包括用于对正弦图像或图像进行成像的传感器,以及控制器,用于使光束发生器将至少一个入射光束引向周期性目标或目标,并用于分析正弦图像或图像。 在一个应用中,检测器以与设计目标相同的间距检测采集目标的正弦图像,并且控制器分析与设计数据相比的正弦图像的间距,以确定目标是否已被成功获取。 在第二应用中,每个具有特定间距p的第一和第二周期性目标成像,使得检测器检测第一目标的第一正弦图像和第二目标的第二正弦图像,并且控制器分析第一和第二正弦曲线 图像以确定第一和第二目标是否具有覆盖或对齐错误。
    • 39. 发明授权
    • System and method for temperature limiting in a sealed solar energy collector
    • 密封太阳能收集器中温度限制的系统和方法
    • US08857426B2
    • 2014-10-14
    • US13522714
    • 2011-01-18
    • Shimon KlierZvika KlierMichael AdelRoyi Efron
    • Shimon KlierZvika KlierMichael AdelRoyi Efron
    • F24J2/30F24J2/46
    • F24S10/90F24S40/55F24S80/60F24S90/10Y02E10/40
    • Insulated solar panels provide that provide a solar thermal collector with means for limiting stagnation temperatures and preventing damage include: temperature limiting is provided by the insulated solar panel, isolating internal components from the environment, using passive closed systems within the sealed solar thermal collector, while also allowing alternative implementations as active systems and/or portions of the temperature limiting system outside the sealed solar thermal collector. A heat pipe can be used as a passive thermal switch, where the temperature induced action at a predetermined temperature causes an abrupt transition from a state of thermal isolation to a state of strong thermal coupling. Additionally, a set of siphon circulation pipes provides a passive closed system for temperature limiting.
    • 绝缘太阳能电池板提供了一种用于限制停滞温度并防止损坏的太阳能集热器,包括:隔热太阳能电池板提供温度限制,使用密封的太阳能集热器内的被动封闭系统将环境内部组件与环境隔离,同时 还允许作为密封太阳能热收集器外部的有源系统和/或温度限制系统的部分的替代实施方式。 热管可以用作被动热开关,其中在预定温度下的温度诱导作用导致从热隔离状态到强热耦合状态的突然转变。 此外,一套虹吸循环管道提供了一种用于温度限制的被动封闭系统。