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    • 36. 发明申请
    • MEMORY DEVICES USING CARBON NANOTUBE (CNT) TECHNOLOGIES
    • 使用碳纳米管(CNT)技术的存储器件
    • US20080117671A1
    • 2008-05-22
    • US12018915
    • 2008-01-24
    • Toshiharu FurukawaMark HakeySteven HolmesDavid HorakCharles Koburger
    • Toshiharu FurukawaMark HakeySteven HolmesDavid HorakCharles Koburger
    • G11C11/34G11C7/00
    • G11C13/025B82Y10/00H01L51/0048H01L51/0512
    • Structures for memory devices. The structure includes (a) a substrate; (b) a first and second electrode regions on the substrate; and (c) a third electrode region disposed between the first and second electrode regions. In response to a first write voltage potential applied between the first and third electrode regions, the third electrode region changes its own shape, such that in response to a pre-specified read voltage potential subsequently applied between the first and third electrode regions, a sensing current flows between the first and third electrode regions. In addition, in response to a second write voltage potential being applied between the second and third electrode regions, the third electrode region changes its own shape such that in response to the pre-specified read voltage potential applied between the first and third electrode regions, said sensing current does not flow between the first and third electrode regions.
    • 存储器件结构。 该结构包括(a)基底; (b)基板上的第一和第二电极区域; 和(c)设置在第一和第二电极区之间的第三电极区。 响应于施加在第一和第三电极区域之间的第一写入电压电位,第三电极区域改变其自身形状,使得响应于随后施加在第一和第三电极区域之间的预先指定的读取电压电势,感测 电流在第一和第三电极区域之间流动。 此外,响应于施加在第二和第三电极区域之间的第二写入电压电位,第三电极区域改变其自身形状,使得响应于施加在第一和第三电极区域之间的预先设定的读取电压电位, 所述感测电流不在第一和第三电极区域之间流动。