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    • 34. 发明授权
    • Constructing variability maps by correlating off-state leakage emission images to layout information
    • 通过将非状态泄漏图像与布局信息相关联来构建变异性图
    • US08131056B2
    • 2012-03-06
    • US12241926
    • 2008-09-30
    • Stanislav PolonskyPeilin SongFranco StellariAlan J. Weger
    • Stanislav PolonskyPeilin SongFranco StellariAlan J. Weger
    • G06K9/00
    • G06T7/001G06T2207/30148
    • Improved techniques are disclosed for monitoring or sensing process variations in integrated circuit designs. Such techniques provide such improvements by constructing variability maps correlating leakage emission images to layout information. By way of example, a method for monitoring one or more manufacturing process variations associated with a device under test (e.g., integrated circuit) comprises the following steps. An emission image representing an energy emission associated with a leakage current of the device under test is obtained. The emission image is correlated with a layout of the device under test to form a cross emission image. Common structures on the cross emission image are selected and identified as regions of interest. One or more variability measures (e.g., figures of merit) are calculated based on the energy emissions associated with the regions of interest. A variability map is created based on the calculated variability measures, wherein the variability map is useable to monitor the one or more manufacturing process variations associated with the device under test.
    • 公开了用于监测或感测集成电路设计中的工艺变化的改进的技术。 这样的技术通过构建将泄漏发射图像与布局信息相关联的可变性图来提供这样的改进。 作为示例,用于监测与被测器件(例如,集成电路)相关联的一个或多个制造工艺变化的方法包括以下步骤。 获得表示与被测设备的泄漏电流相关联的能量发射的发射图像。 发射图像与待测器件的布局相关,以形成交叉发射图像。 选择交叉发射图像上的共同结构并将其识别为感兴趣的区域。 基于与感兴趣区域相关联的能量排放来计算一个或多个可变性度量(例如,品质因素)。 基于所计算的变异性度量创建变异性图,其中可变性图可用于监测与被测设备相关联的一个或多个制造过程变化。
    • 37. 发明授权
    • Enhanced signal observability for circuit analysis
    • 电路分析增强的信号可观测性
    • US07446550B2
    • 2008-11-04
    • US11949325
    • 2007-12-03
    • Chandler Todd McDowellStanislav PolonskyPeilin SongFranco StellariAlan J. Weger
    • Chandler Todd McDowellStanislav PolonskyPeilin SongFranco StellariAlan J. Weger
    • G01R31/02
    • G01R31/311
    • Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.
    • 公开了利用例如皮秒成像电路分析(PICA)来增强响应于集成电路(IC)内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号,并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd,以增强相对于强度和能量的光子发射。 因此,光子发射与噪声更为区别。 在许多实施例中,信标包括晶体管,并且在几个实施例中,信标包括启用和禁用来自信标的光子发射的启用装置。 此外,PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。
    • 40. 发明申请
    • Enhanced signal observability for circuit analysis
    • 电路分析增强的信号可观测性
    • US20060028219A1
    • 2006-02-09
    • US10912493
    • 2004-08-05
    • Chandler McDowellStanislav PolonskyPeilin SongFranco StellariAlan Weger
    • Chandler McDowellStanislav PolonskyPeilin SongFranco StellariAlan Weger
    • G01R31/28G06K9/00
    • G01R31/311
    • Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.
    • 公开了利用例如皮秒成像电路分析(PICA)来增强响应于集成电路(IC)内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号,并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd,以增强相对于强度和能量的光子发射。 因此,光子发射与噪声更为区别。 在许多实施例中,信标包括晶体管,并且在几个实施例中,信标包括启用和禁用来自信标的光子发射的启用装置。 此外,PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。