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    • 33. 发明申请
    • SECONDARY-BATTERY LIFE ESTIMATION APPARATUS AND METHOD
    • 二次电池寿命估算装置及方法
    • US20090070052A1
    • 2009-03-12
    • US12203411
    • 2008-09-03
    • Akihiro TaniguchiTakuma Iida
    • Akihiro TaniguchiTakuma Iida
    • G01R31/36
    • G01R31/3679G01R31/3651G01R31/3658
    • A secondary-battery life estimation apparatus includes: a voltage measuring portion measuring a terminal voltage of a secondary battery to be measured; a first memory storing in advance a terminal voltage V0 of a non-degraded secondary battery before the non-degraded secondary battery discharges after fully charged; a second memory which stores in advance a life-estimation data map as a look-up table associating a voltage difference dV between a terminal voltage V of the secondary battery to be measured before the secondary battery to be measured discharges after fully charged and the terminal voltage V0 with a residual life of the secondary battery to be measured; and a CPU calculating the voltage difference dV between the terminal voltage V measured by the voltage measuring portion before the secondary battery to be measured discharges after fully charged and the terminal voltage V0 stored in the first memory and estimating the residual life of the secondary battery to be measured based on the life-estimation data map stored in the second memory using the voltage difference dV.
    • 二次电池寿命估计装置包括:测量要测量的二次电池的端子电压的电压测量部分; 第一存储器,在未劣化的二次电池在完全充电之后放电之前,预先存储未劣化的二次电池的端子电压V0; 第二存储器,其预先存储寿命估计数据图作为查找表,其将要测量的待测量的二次电池之后的待测量的二次电池的终端电压V与完全充电之后放电之间的电压差dV相关联, 具有要测量的二次电池的剩余寿命的电压V0; 以及CPU,计算由被测量的二次电池之后的电压测量部分在完全充电之后测量的端子电压V和存储在第一存储器中的端子电压V0之间的电压差dV,并且将二次电池的剩余寿命估计为 基于使用电压差dV存储在第二存储器中的寿命估计数据图进行测量。