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    • 34. 发明申请
    • VEHICLE DOOR OUTER HANDLE DEVICE
    • 车门外部手柄装置
    • US20100293753A1
    • 2010-11-25
    • US12755536
    • 2010-04-07
    • Tadashi SaitouTeruo YamazakiTakashi OgawaNoriyuki ToshitsunaKatsuya Ashizawa
    • Tadashi SaitouTeruo YamazakiTakashi OgawaNoriyuki ToshitsunaKatsuya Ashizawa
    • E05B1/00
    • E05B85/14E05B17/18E05B77/34Y10T16/458Y10T70/8649Y10T292/57
    • In a vehicle door outer handle device, an inwardly recessed housing recess is provided in a base member fixed to a vehicle door; an outer handle having an operation portion is pivotably supported on the base member while being able to pivot to an operated position in accordance with pulling of the operation portion and being spring-biased toward a non-operated position side, at least part of the operation portion being disposed in the housing recess; and a cylinder lock is mounted on the base member so that a key hole is covered at least in a state in which the outer handle is in the non-operated position. In the outer handle device, a cover member is detachably mounted on the base member so as to cover the key hole, the cover member being formed as a separate body from the outer handle so as to form part of the housing recess while forming a design surface of the base member. Accordingly, it is possible to provide a vehicle door outer handle device that makes it difficult for the position of a cylinder lock to be identified.
    • 在车门外手柄装置中,在固定在车门上的基座部件内设有向内凹入的容纳凹部, 具有操作部分的外把手可枢转地支撑在基座部件上,同时能够根据操作部分的拉动而枢转到操作位置,并且朝向非操作位置侧进行弹簧偏压,至少部分操作 部分设置在所述壳体凹部中; 并且圆筒锁安装在基座构件上,使得至少在外手柄处于非操作位置的状态下覆盖键孔。 在外手柄装置中,盖构件可拆卸地安装在基座构件上以覆盖键孔,盖构件形成为与外把手分开的主体,从而形成壳体凹部的一部分,同时形成设计 基部构件的表面。 因此,可以提供使得难以识别气缸锁的位置的车门外手柄装置。
    • 35. 发明申请
    • FOCUSED ION BEAM APPARATUS
    • 聚焦离子束设备
    • US20100219339A1
    • 2010-09-02
    • US12712863
    • 2010-02-25
    • Takashi OgawaKenichi NishinakaYoshihiro Koyama
    • Takashi OgawaKenichi NishinakaYoshihiro Koyama
    • G01N23/225H01J3/14
    • H01J37/08H01J37/28H01J2237/0807H01J2237/31749
    • The crystal structure of the emitter can be accurately grasped from a FIM image without being influenced by disturbances, such as contamination, and even if the rearrangement of atoms has been performed, whether or not the crystal structure of the emitter has returned to the original state can also be accurately determined. There is a provided a focused ion beam apparatus including an emitter 10, a gas source 11 which supplies gas G2, a cooling unit 12 which cools the emitter, a heating unit 13 which heats the tip of the emitter, an extraction power source unit 15 which applies an extraction voltage to ionize the gas into gas ions at the tip of the emitter, and then extract the gas ions, a beam optical system 16 which makes the extracted gas ions into a focused ion beam (FIB), and then radiates the focused ion beam onto a sample S, an image acquiring mechanism 17 which acquires a FIM image of the tip of the emitter, and a control unit 7 having a display unit and a storage unit 7b. A guide which displays an ideal crystal structure of the tip of the emitter is stored in advance in the storage unit. The control unit is enabled to display the guide in the state of overlapping the acquired FIM image on the display unit.
    • 可以从FIM图像中精确地掌握发射体的晶体结构,而不受诸如污染等干扰的影响,即使原子的重排已经被执行,发射体的晶体结构是否已经恢复到初始状态 也可以准确确定。 提供了一种聚焦离子束装置,其包括发射极10,供应气体G2的气体源11,冷却发射极的冷却单元12,加热发射极顶端的加热单元13,提取电源单元15 其施加提取电压以将气体离子化为发射体顶端的气体离子,然后提取气体离子,使得提取的气体离子成为聚焦离子束(FIB)的束光学系统16,然后辐射 聚焦离子束到样本S上,获取发射器的尖端的FIM图像的图像获取机构17以及具有显示单元和存储单元7b的控制单元7。 将显示发射器顶端的理想晶体结构的引导件预先存储在存储单元中。 控制单元能够在显示单元上与获取的FIM图像重叠的状态下显示引导件。
    • 36. 发明申请
    • CHARGED PARTICLE BEAM APPARATUS AND METHOD OF ADJUSTING CHARGED PARTICLE OPTICS
    • 充电颗粒光束装置和调整充电颗粒光学的方法
    • US20100116984A1
    • 2010-05-13
    • US12449633
    • 2008-02-04
    • Takashi OgawaYo YamamotoHiroshi Matsumura
    • Takashi OgawaYo YamamotoHiroshi Matsumura
    • G21K1/00G01N23/00
    • H01J37/28H01J37/3056H01J2237/1501H01J2237/216
    • A charged particle beam apparatus which is able to adjust charged particle optics easily in a short time with a high degree of accuracy and a method of adjusting charged particle optics are provided. A charged particle beam apparatus 1 includes a charged particle source 9, charged particle optics 12, 16 configured to set the ion beam I to a bean characteristic value corresponding to an input value to cause a sample to be irradiated therewith, scanning means 17 configured to be able to move the irradiation point of the charged particle beam I relatively with each other, observing means 32 being capable of obtaining an image, and a control unit 30, and the control unit 30 includes spot pattern forming means 33 configured to set the input value to different values and cause the sample to be irradiated with the charged particle beam I by a plurality of times at different positions to form a plurality of spot patterns and spot pattern analyzing means 34 configured to select a spot pattern having a smallest characteristic value, and sets the input values of the charged particle optics 12, 16 to a value equal to the input value corresponding to the selected spot pattern.
    • 提供一种能够以高精度容易地在短时间内调节带电粒子光学的带电粒子束装置和调节带电粒子光学的方法。 带电粒子束装置1包括带电粒子源9,带电粒子光学器件12,16,被配置为将离子束I设置为对应于输入值的豆特征值以使样品照射;扫描装置17,被配置为 能够相对地移动带电粒子束I的照射点,观察装置32能够获得图像,以及控制单元30,并且控制单元30包括斑点图案形成装置33,其被配置为设置输入 值到不同的值,并且使得样品在不同位置被多次照射带电粒子束I以形成多个斑点图案和​​斑点图案分析装置34,其被配置为选择具有最小特征值的斑点图案, 并将带电粒子光学器件12,16的输入值设置为等于对应于所选择的斑点图案的输入值的值。
    • 37. 发明授权
    • Inspection device and inspection method
    • 检验装置及检验方法
    • US07696767B2
    • 2010-04-13
    • US12458588
    • 2009-07-16
    • Keisuke InoueNobuhiro KatsumaSeiichi KageyamaMasanori HamadaTakashi Ogawa
    • Keisuke InoueNobuhiro KatsumaSeiichi KageyamaMasanori HamadaTakashi Ogawa
    • G01R31/02
    • G01R31/2886G01R1/0483
    • A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    • 连接检查电路板的第一电极和半导体集成电路的一个外部电极的第一导电接触件布置在固定构件中。 连接布线板的第二电极和半导体集成电路的另一个外部电极的第二导电接触件布置在可移动部件中。 连接检查电路板的一个第三电极和布线板的另一个第三电极的第三导电接触件布置在可动件中。 另一第三电极连接到第二电极。 当可动构件移动到接触位置时,第二导电接触件与另一个外部电极接触,并且第三导电接触件与一个第三电极接触。