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31. 发明授权

US07835870B2 Methods and systems for evaluating the length of elongated elements 失效
标题翻译：用于评估细长元件长度的方法和系统
公开(公告)号：US07835870B2
公开(公告)日：2010-11-16
申请号：US11264452
申请日：2005-11-01
申请人： Sankar Nair , Soumendu Bhattacharya , Vishwanath Natarajan , Abhijit Chatterjee
发明人： Sankar Nair , Soumendu Bhattacharya , Vishwanath Natarajan , Abhijit Chatterjee
IPC分类号： G01N33/48
CPC分类号： C12Q1/68 , C12Q2565/631 , C12Q2565/125 , C12Q2525/204
摘要： Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.
摘要翻译：公开了用于评估样品中细长元件的长度的系统和方法。所公开的系统和方法可以包括使用直流电刺激来确定对应于样品的至少一部分的直流电流基极长度区域。此外，所公开的系统和方法可以包括使用交流电刺激来确定直流基极长度区域对应于第一组细长元件和第二组细长元件。第一组细长元件可以具有第一基底长度，并且第二组细长元件可以具有第二基底长度。细长元件可以包括例如链分子，脱氧核糖核酸（DNA），核糖核酸（RNA）或蛋白质。此外，所公开的系统和方法可以包括测量通过纳米孔的离子电流，即由交流电刺激产生的离子电流。

32. 发明申请

US20070099191A1 Methods and systems for evaluating the length of elongated elements 失效
标题翻译：用于评估细长元件长度的方法和系统
公开(公告)号：US20070099191A1
公开(公告)日：2007-05-03
申请号：US11264452
申请日：2005-11-01
申请人： Sankar Nair , Soumendu Bhattacharya , Vishwanath Natarajan , Abhijit Chatterjee
发明人： Sankar Nair , Soumendu Bhattacharya , Vishwanath Natarajan , Abhijit Chatterjee
IPC分类号： C12Q1/68 , G06F19/00
CPC分类号： C12Q1/68 , C12Q2565/631 , C12Q2565/125 , C12Q2525/204
摘要： Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.
摘要翻译：公开了用于评估样品中细长元件的长度的系统和方法。所公开的系统和方法可以包括使用直流电刺激来确定对应于样品的至少一部分的直流电流基极长度区域。此外，所公开的系统和方法可以包括使用交流电刺激来确定直流基极长度区域对应于第一组细长元件和第二组细长元件。第一组细长元件可以具有第一基底长度，并且第二组细长元件可以具有第二基底长度。细长元件可以包括例如链分子，脱氧核糖核酸（DNA），核糖核酸（RNA）或蛋白质。此外，所公开的系统和方法可以包括测量通过纳米孔的离子电流，即由交流电刺激产生的离子电流。

33. 发明申请

US20060290548A1 High speed data converter testing devices, methods, & systems 有权
标题翻译：高速数据转换器测试设备，方法和系统
公开(公告)号：US20060290548A1
公开(公告)日：2006-12-28
申请号：US11368079
申请日：2006-03-03
申请人： Shalabh Goyal , Abhijit Chatterjee
发明人： Shalabh Goyal , Abhijit Chatterjee
IPC分类号： H03M1/10
CPC分类号： H03M1/1095 , H03M1/12
摘要： Devices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and based on their device signatures mapped with the mapping function, dynamic specifications for the second set of data converters can be obtained. Other embodiments are also claimed and described.
摘要翻译：提供了测试高速模数和数模转换器的设备和方法。根据一个实施例，测试装置可以包括输出，混频器和输入。输出可以提供信号，并且混频器可以接收信号并向具有采样频率的数据转换器提供测试信号。测试信号可以是光谱不纯的。输入可以采样频率较低的数据转换器输出，以便数据转换器输出采样。根据另一个实施例，测试第一组数据转换器以获得将动态规范与设备签名相关联的映射功能。然后，可以测试第二组数据转换器，并且基于其与映射函数映射的设备签名，可以获得第二组数据转换器的动态规范。还要求保护和描述其它实施例。

34. 发明申请

US20060106555A1 Method for using an alternate performance test to reduce test time and improve manufacturing yield 审中-公开
标题翻译：使用替代性能测试来减少测试时间并提高制造产量的方法
公开(公告)号：US20060106555A1
公开(公告)日：2006-05-18
申请号：US11303406
申请日：2005-12-16
申请人： Ram Voorakaranam , Abhijit Chatterjee , Sasikumar Cherubal , David Majernik
发明人： Ram Voorakaranam , Abhijit Chatterjee , Sasikumar Cherubal , David Majernik
IPC分类号： G06F19/00
CPC分类号： G01R31/2831
摘要： A method for using an alternate performance test to reduce test time and improve manufacturing yield. The method comprises establishing a specification test limit within which a product would be accepted under specification test criteria and inner and outer alternate test error bounds relative to the specification test limit; initially testing the product with the alternate test; accepting the product if the alternate test result is within the inner alternate test error bound; rejecting the product if the alternate test result is outside the outer alternate test error bound; and retesting the product using the specification test if the alternate test result is on or between the alternate error bounds. On retesting, the product is ordinarily rejected if the specification test result is outside the specification test limits. The method may further comprise modifying a production test to produce a specification test whose guardband is narrower than the production test. The alternate test may provide a reduction of test time from that required by the specification test, and may be a signature test. The method can be used where the acceptability parameter value distribution for the product is peaked, and the specification test has upper and lower test limits.
摘要翻译：一种使用替代性能测试来减少测试时间并提高制造产量的方法。该方法包括建立规范测试极限，在规范测试标准范围内接受产品，在相对于规范测试极限的情况下，内外替代测试误差范围; 首先用替代测试测试产品; 如果替代测试结果在内部替代测试误差范围内，则接受产品; 如果替代测试结果在外部替代测试误差界限之外，则拒绝产品; 并且如果备用测试结果在备用误差范围之间或之间，则使用规范测试重新测试产品。在重新测试时，如果规格测试结果超出规格测试限制，则产品通常被拒绝。该方法还可以包括修改生产测试以产生其保护带窄于生产测试的规格测试。替代测试可以提供从规范测试所要求的测试时间的减少，并且可以是签名测试。该方法可用于产品可接受参数值分布达到峰值，规格试验具有上限和下限。

35. 发明授权

US06964004B2 Method and apparatus for testing a system-on-a-chip 失效
标题翻译：用于测试片上系统的方法和装置
公开(公告)号：US06964004B2
公开(公告)日：2005-11-08
申请号：US10280543
申请日：2002-10-24
申请人： Abhijit Chatterjee , Dave Majernik , Sasikumar Cherubal , Sudip Chakrabarti , Ramakrishna Voorakaranam , Jacob A. Abraham , Douglas Goodman
发明人： Abhijit Chatterjee , Dave Majernik , Sasikumar Cherubal , Sudip Chakrabarti , Ramakrishna Voorakaranam , Jacob A. Abraham , Douglas Goodman
IPC分类号： G01R31/3167 , G01R31/3185 , G01R31/28
CPC分类号： G01R31/318505 , G01R31/3167
摘要： A method for testing a system on a chip or a system on a package (““SOPC”) having a plurality of internal modules that are tested to determine whether predetermined performance specifications are satisfied. A first module of the SOPC is selected for testing. A determination is made as to whether the first module is directly accessible or not. If the first module is directly accessible, the module may be tested with automated test equipment external to the SOPC. If the first module is not directly accessible, the module may be tested with a second and third module of the SOPC.
摘要翻译：一种用于测试芯片上的系统或者具有多个内部模块的封装上的系统（“SOPC”）的方法，所述多个内部模块被测试以确定是否满足预定的性能规范。选择SOPC的第一模块进行测试。确定第一模块是否可直接访问，如果第一模块可直接访问，则可以使用SOPC外部的自动测试设备对模块进行测试，如果第一模块不可直接访问，则模块可以用SOPC的第二和第三个模块进行测试。

36. 发明申请

US20050233951A1 Novel two gonadotropin releasing hormones and a method to isolate the same 失效
标题翻译：新型两种促性腺激素释放激素及其分离方法
公开(公告)号：US20050233951A1
公开(公告)日：2005-10-20
申请号：US11148067
申请日：2005-06-08
申请人： Abhijit Chatterjee , Partha Ray , Subrata Dasgupta , Samir Bhattacharya , Santosh Pasha
发明人： Abhijit Chatterjee , Partha Ray , Subrata Dasgupta , Samir Bhattacharya , Santosh Pasha
IPC分类号： A01K61/00 , A61K38/00 , A61K38/24 , A61P15/00 , B01J20/281 , C07K7/23 , G01N30/46 , G01N30/88 , G01N33/48 , G01N33/68
CPC分类号： C07K7/23 , A61K38/00 , Y10S930/13
摘要： The present invention relates to two novel Gonadotropin releasing hormones muGnRH I and muGnRH II of amino acid SEQ ID 1 as QHWSAWRLPG, and SEQ ID 2 QHWSWGILPG respectively, useful for induced breeding in fish both in combination and alone, by activating production of Gonadotropin, and a method of isolating the same from Indian Murrel brain, and further, a method of inducing breeding in fishes using the said novel gonadotropin releasing hormones.
摘要翻译：本发明涉及两种新颖的促性腺激素释放激素，分别用于QHWSAWRLPG的氨基酸SEQ ID 1和SEQ ID NO：2的QGWSWGILPG，通过激活促性腺激素的产生可以组合和单独地诱导育种鱼，一种将其从印度Murrel脑分离的方法，此外，使用所述新颖的促性腺激素释放激素在鱼类中诱导育种的方法。

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