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    • 31. 发明授权
    • Optical sensor having dielectric film stack
    • US06625336B2
    • 2003-09-23
    • US09967019
    • 2001-09-28
    • William A. ChallenerJames M. DePuydtWilliam A. Tolbert
    • William A. ChallenerJames M. DePuydtWilliam A. Tolbert
    • G02B600
    • G01N21/552
    • A method and apparatus for optically assaying a targeted substance in a sample using a sensor comprising a dielectric film stack having a plurality of dielectric layers. For at least one angle of incidence the dielectric layers operate as a waveguide for light incident upon the sensor. In one configuration, each dielectric layer comprises a dielectric material selected from a first dielectric material having a first index of refraction and a second dielectric material having a second index of refraction. The dielectric film stack is formed such that the dielectric material of the dielectric layers alternates between the first dielectric material and the second dielectric material. The dielectric film stack is either formed as a dielectric mirror such that light incident upon the sensor reflects from the sensor or as an anti-reflection film stack such that light incident upon the light beam propagates through the sensor. The inventive sensor exhibits a resonance that is comparable in magnitude with resonances commonly exhibited by conventional SPR sensors. However, unlike grating-based SPR sensors, the inventive sensor allows a sample to be assayed with substrate-incident light such that the incident light need not propagate through the sample. In addition, because the sensor does not rely on the use of conductive metals, the sensor enables sharp resonances at shorter wavelengths than conventional SPR sensors.
    • 32. 发明授权
    • Optical sensor having dielectric film stack
    • 具有电介质膜叠层的光学传感器
    • US06320991B1
    • 2001-11-20
    • US09174178
    • 1998-10-16
    • William A. ChallenerJames M. DePuydtWilliam A. Tolbert
    • William A. ChallenerJames M. DePuydtWilliam A. Tolbert
    • G02B600
    • G01N21/552
    • A method and apparatus for optically assaying a targeted substance in a sample using a sensor comprising a dielectric film stack having a plurality of dielectric layers. For at least one angle of incidence the dielectric layers operate as a waveguide for light incident upon the sensor. In one configuration, each dielectric layer comprises a dielectric material selected from a first dielectric material having a first index of refraction and a second dielectric material having a second index of refraction. The dielectric film stack is formed such that the dielectric material of the dielectric layers alternates between the first dielectric material and the second dielectric material. The dielectric film stack is either formed as a dielectric mirror such that light incident upon the sensor reflects from the sensor or as an anti-reflection film stack such that light incident upon the light beam propagates through the sensor. The inventive sensor exhibits a resonance that is comparable in magnitude with resonances commonly exhibited by conventional SPR sensors. However, unlike grating-based SPR sensors, the inventive sensor allows a sample to be assayed with substrate-incident light such that the incident light need not propagate through the sample. In addition, because the sensor does not rely on the use of conductive metals, the sensor enables sharp resonances at shorter wavelengths than conventional SPR sensors.
    • 一种用于使用包括具有多个电介质层的电介质膜堆叠的传感器光学测定样品中的目标物质的方法和装置。 对于至少一个入射角,电介质层作为入射到传感器上的光的波导工作。 在一种配置中,每个介电层包括选自具有第一折射率的第一介电材料和具有第二折射率的第二介电材料的电介质材料。 电介质膜堆叠形成为使得电介质层的电介质材料在第一介电材料和第二电介质材料之间交替。 电介质膜堆叠形成为介电镜,使得入射到传感器上的光从传感器反射或作为抗反射膜堆叠,使得入射到光束上的光传播通过传感器。 本发明的传感器表现出与常规SPR传感器通常表现的共振相当的共振。 然而,与基于光栅的SPR传感器不同,本发明的传感器允许用基板入射光来测定样品,使得入射光不需要通过样品传播。 此外,由于传感器不依赖于导电金属的使用,传感器可以在比传统SPR传感器更短的波长下实现尖锐的谐振。