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    • 34. 发明申请
    • ELECTROPHOTOGRAPHIC IMAGE FORMING APPARATUS
    • 电子图像形成装置
    • US20090214270A1
    • 2009-08-27
    • US12391703
    • 2009-02-24
    • Kaoru KATAOKAAkio TsujitaKatsuhiko Suzuki
    • Kaoru KATAOKAAkio TsujitaKatsuhiko Suzuki
    • G03G15/08
    • G03G15/0813G03G15/08G03G2215/0646
    • An electrophotographic image forming apparatus is disclosed. The electrophotographic image forming apparatus includes a photoconductor body, a donor roller which develops an electrostatic latent image on the surface of the photoconductor body by using charged toners, and a development nip section formed between the photoconductor body and the donor roller by having a predetermined gap between the photoconductor body and the donor roller. A developing traveling-wave electrode for generating a traveling-wave electric field is disposed at a position facing the surface of the donor roller at an upstream side of the moving direction of the photoconductor body relative to the development nip section, and a removing traveling-wave electrode for generating a traveling-wave electric field is disposed at a position facing the surface of the donor roller at a downstream side of the moving direction of the photoconductor body relative to the development nip section.
    • 公开了一种电子照相成像设备。 电子照相图像形成装置包括感光体,通过使用带电调色剂在感光体的表面上显影静电潜像的施主辊和通过具有预定间隙形成在感光体和供体辊之间的显影夹持区 在感光体和供体辊之间。 用于产生行波电场的显影行波电极设置在相对于显影压区部分在感光体主体的移动方向的上游侧面向供体辊表面的位置处, 用于产生行波电场的波长电极设置在相对于显影压区部分在感光体的移动方向的下游侧面对供体辊表面的位置处。
    • 36. 发明授权
    • IC tester simultaneously testing plural ICS
    • IC测试仪同时测试多个ICS
    • US06198273B1
    • 2001-03-06
    • US08966781
    • 1997-11-10
    • Takeshi OnishiMinoru YatsudaKatsuhiko Suzuki
    • Takeshi OnishiMinoru YatsudaKatsuhiko Suzuki
    • G01R104
    • G01R31/2851G01R31/01G01R31/2893G06F11/22
    • In an integrated-circuit tester which is provided with a contact failure analysis/storage part for counting and storing the number of failures occurring at each contact, an automatic stop part for deciding contact as defective based on the numbers of failures stored in the storage part and for stopping a handler, an automatic turn-OFF part by which, upon each operation of the automatic stop part, contacts having met the stop condition are automatically put in their unused state, and a defective contact display for displaying the number of contacts put in the unused state upon each automatic stop of the handler, an operator checks the number of contacts put in the unused state upon each automatic stop of the handler, then decides whether or not all the contacts used are to be replaced, and performs the necessary operations for resuming the test.
    • 在集成电路测试器中,设有接触故障分析/存储部分,用于计数和存储在每个接触处发生的故障次数,用于根据存储在存储部分中的故障次数来确定接触不良的自动停止部分 并且为了停止处理机构,在自动关闭部分的每次操作时,自动停机部分已经达到停止状态的触点自动处于其未使用状态,并且用于显示接触数量的缺陷接触显示 在处理器的每次自动停止时处于未使用状态,操作者在处理器的每次自动停止时检查放置在未使用状态的触点的数量,然后判定所有使用的触点是否被替换,并且执行必要 恢复测试的操作。
    • 37. 发明授权
    • Device transfer and reinspection method for IC handler
    • IC处理程序的设备传输和重新检测方法
    • US6075216A
    • 2000-06-13
    • US888745
    • 1997-07-07
    • Hiroto NakamuraYoshihito KobayashiKatsuhiko Suzuki
    • Hiroto NakamuraYoshihito KobayashiKatsuhiko Suzuki
    • G01R31/01H01L21/00H05K13/02H05K13/08B07C5/344
    • H01L21/67271G01R31/2893H05K13/022H05K13/08G01R31/01
    • An IC device transfer method for IC handler accommodates both a tray and a rod-shaped magazine. The tray installs a plurality of IC devices which transport in horizontal directions in the IC handler. The rod-shaped magazine installs a plurality of IC devices which transport in vertical directions in the IC handler. A device reinspection method in the IC test handler reinspects the IC devices stored in the tray or magazine without human intervention, sorts in accordance with the test results, and stores in either the rod-shaped magazine or the tray. For this purpose, a tray supply section transfers a user tray to a test tray, whereas a magazine supply section and a pick carrier section transfer a rod-shaped magazine to the test tray. An inspection setting sets the number of reinspection, the classification of inspection results, and the storage tray/magazine. The IC devices are loaded from the magazine and the user tray to the test tray and are tested. When a reinspection mode is effective, the IC devices to be reinspected are stored in the unloader section and transferred to the loader section by the tray transfer system to test the IC devices again. When the reinspection mode is completed, the IC device are sorted by categories and stored in the tray/magazine.
    • 用于IC处理器的IC器件传送方法同时容纳托盘和棒状盒。 托盘安装在IC处理器中沿水平方向传送的多个IC器件。 棒状盒安装在IC处理器中沿垂直方向传送的多个IC器件。 IC测试处理器中的器件重新检测方法重新考虑存储在托盘或杂志中的IC器件,而无需人为干预,根据测试结果进行排序,并存储在棒状盒或托盘中。 为此,托盘供应部分将用户托盘传送到测试托盘,而料盒供应部分和拾取托架部分将棒状托盘传送到测试托盘。 检查设置设置重新检查的次数,检验结果的分类和存储托盘/杂志。 IC器件从盒子和用户托盘装载到测试托盘并进行测试。 重新检查模式有效时,要重新检查的IC设备存储在卸载器部分,并通过托盘传输系统传输到装载器部分,以再次测试IC器件。 当重新检查模式完成后,IC设备按类别进行分类并存储在托盘/杂志中。