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    • 33. 发明申请
    • Read-only memory array with dielectric breakdown programmability
    • 具有介电击穿可编程性的只读存储阵列
    • US20060268593A1
    • 2006-11-30
    • US11136981
    • 2005-05-25
    • Meng DingZhizheng LiuYi HeMark Randolph
    • Meng DingZhizheng LiuYi HeMark Randolph
    • G11C17/00
    • G11C17/16G11C2213/72H01L27/1021H01L27/112H01L27/11206H01L27/118
    • According to one exemplary embodiment, a programmable ROM array includes at least one bitline situated in a substrate. The programmable ROM array further includes at least one wordline situated over the at least one bitline. The programmable ROM array further includes a memory cell situated at an intersection of the at least one bitline and the at least one wordline, where the memory cell includes a dielectric region situated between the at least one bitline and the at least one wordline. A programming operation causes the memory cell to change from a first logic state to a second logic state by causing the dielectric region to break down. The programming operation causes the memory cell to operate as a diode. A resistance of the memory cell can be measured in a read operation to determine if the memory cell has the first or second logic state.
    • 根据一个示例性实施例,可编程ROM阵列包括位于衬底中的至少一个位线。 可编程ROM阵列还包括位于至少一个位线上的至少一个字线。 可编程ROM阵列还包括位于所述至少一个位线和所述至少一个字线的交叉点处的存储器单元,其中所述存储器单元包括位于所述至少一个位线和所述至少一个字线之间的电介质区域。 通过使介电区域分解,编程操作使存储单元从第一逻辑状态变为第二逻辑状态。 编程操作使存储单元作为二极管工作。 可以在读取操作中测量存储器单元的电阻,以确定存储单元是否具有第一或第二逻辑状态。
    • 34. 发明授权
    • Flash memory cell and methods for programming and erasing
    • 闪存单元和编程和擦除的方法
    • US07120063B1
    • 2006-10-10
    • US10841850
    • 2004-05-07
    • Zhizheng LiuZengtao LiuYi HeMark Randolph
    • Zhizheng LiuZengtao LiuYi HeMark Randolph
    • G11C11/34G11C16/04
    • G11C16/0466G11C16/0491H01L21/28282H01L29/66833
    • Flash memory cells are presented which comprise a dielectric material formed above a substrate channel region, a charge trapping material formed over the dielectric material, and a control gate formed over the charge trapping material. The cell may be programmed by directing electrons from the control gate into the charge trapping material to raise the cell threshold voltage. The electrons may be directed from the control gate to the charge trapping material by coupling a substrate to a substrate voltage potential, and coupling the control gate to a gate voltage potential, where the gate voltage potential is lower than the substrate voltage potential. The cell may be erased by directing electrons from the charge trapping material into the control gate to lower a threshold voltage of the flash memory cell, such as by coupling the substrate to a substrate voltage potential, and coupling the control gate to a gate voltage potential, where the gate voltage potential is higher than the substrate voltage potential.
    • 提供了闪存单元,其包括形成在衬底沟道区上方的电介质材料,在电介质材料上形成的电荷俘获材料,以及形成在电荷俘获材料上的控制栅。 可以通过将电子从控制栅极引导到电荷捕获材料中来提高电池阈值电压来编程电池。 电子可以通过将衬底耦合到衬底电压电势,并将控制栅极耦合到栅极电压电位,其中栅极电压电位低于衬底电压电位,从控制栅极引导到电荷俘获材料。 可以通过将电子从电荷捕获材料引入控制栅极来降低闪速存储器单元的阈值电压,例如通过将衬底耦合到衬底电压电位,以及将控制栅极耦合到栅极电压电位来擦除电池 ,其中栅极电压电位高于衬底电压电位。
    • 37. 发明授权
    • N-channel multi-time programmable memory devices
    • N通道多时间可编程存储器件
    • US08975685B2
    • 2015-03-10
    • US13600792
    • 2012-08-31
    • Yi HeXiang LuAlbert Bergemont
    • Yi HeXiang LuAlbert Bergemont
    • H01L29/788
    • G11C16/0408G11C2216/10
    • N-channel multi-time programmable memory devices having an N-conductivity type substrate, first and second P-conductivity type wells in the N-conductivity type substrate, N-conductivity type source and drain regions formed in the first P-conductivity type well, the source and drain regions being separated by a channel region, an oxide layer over the N-conductivity type substrate; and a floating gate extending over the channel region and over the second P-conductivity type well in the N-conductivity type substrate, the multi-time programmable memory cell being programmable by hot electron injection and erasable by hot hole injection.
    • 具有N-导电类型衬底,N导电类型衬底中的第一和第二P导电类型阱的N沟道多时间可编程存储器件,形成在第一P导电型阱中的N导电型源极和漏极区 源极和漏极区域被沟道区域分隔,N导电型衬底上的氧化物层; 以及在N导电类型衬底中在沟道区域上延伸超过第二P导电类型的浮栅,多时间可编程存储单元可通过热电子注入进行编程,并可通过热空穴注入进行擦除。
    • 40. 发明授权
    • Controller for a resonant switched-mode power converter
    • 谐振开关型功率转换器的控制器
    • US08456868B2
    • 2013-06-04
    • US12771467
    • 2010-04-30
    • Yi HeTuck Meng ChanYong Siang TeoXiaowu GongMeng Kiat Jeoh
    • Yi HeTuck Meng ChanYong Siang TeoXiaowu GongMeng Kiat Jeoh
    • H02M3/335
    • H02M3/3378H02M3/33592H02M2001/0058Y02B70/1433Y02B70/1475Y02B70/1491
    • An embodiment of the invention relates to an LLC power converter including a controller configured to regulate an output characteristic of the power converter by controlling a power converter switching frequency. In a first mode of operation, the controller turns off a secondary-side power switch earlier than a turn-off time of a primary-side power switch by a time difference that is controlled by a resistor coupled to an external circuit node. In a second mode of operation, the controller turns on a secondary-side power switch at substantially the same time as the primary-side power switch, and turns off the secondary-side power switch after a maximum on time that is a nonlinear function of a load current of the power converter. The nonlinear function is a substantially constant function of the load current for a value of the load current higher than a threshold value.
    • 本发明的实施例涉及一种LLC功率转换器,其包括被配置为通过控制功率转换器开关频率来调节功率转换器的输出特性的控制器。 在第一操作模式中,控制器比次级侧电源开关早于初级侧电源开关的关断时间,该时间差由耦合到外部电路节点的电阻器控制。 在第二操作模式中,控制器在与初级侧电源开关基本相同的时间接通次级侧电源开关,并且在作为非线性功能的最大导通时间之后关闭次级侧电源开关 功率转换器的负载电流。 对于高于阈值的负载电流的值,非线性函数是负载电流的基本上恒定的函数。