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    • 33. 发明申请
    • TERAHERTZ WAVE CONTROL ELEMENT
    • US20230093066A1
    • 2023-03-23
    • US17789278
    • 2020-12-25
    • NAGAOKA UNIVERSITY OF TECHNOLOGYNISSAN CHEMICAL CORPORATIONUNIVERSITY OF HYOGO
    • Tomoyuki SASAKIHiroshi ONONobuhiro KAWATSUKIKohei GOTOKimiaki TSUTSUI
    • G02F1/1337G02F1/01
    • The present invention provides a polarization-independent terahertz wave control element, and provides a method for manufacturing a polarization-independent terahertz wave control element. The present invention provides a terahertz wave control element comprising: (A) a first flat plate having (A1) a first substrate, (A2) a first electrode formed on the first substrate, and (A3) a first liquid crystal alignment film formed on the first electrode; (B) a second flat plate having (B1) a second substrate, (B2) a second electrode formed on the second substrate, and (B3) a second liquid crystal alignment film formed on the second electrode; and (C) a liquid crystal present in a space formed by disposing (A) the first flat plate and (B) the second flat plate parallel to each other with a predetermined distance therebetween so that the first and second liquid crystal alignment films face each other, wherein (D1) the terahertz wave control element has a first portion in which the liquid crystal is aligned in a first direction parallel to (A) the first flat plate and (B) the second flat plate, and a second portion in which the liquid crystal is aligned in a second direction orthogonal to the first direction and parallel to (A) the first flat plate and (B) the second flat plate when no voltage is applied, (D2) the first portion has a first width, the second portion has a second width, the first and second portions are disposed adjacent to each other and alternately disposed in a predetermined cycle, (D3) when voltage is applied, the liquid crystal in each of the first portion and the second portion is aligned in a direction orthogonal to (A) the first substrate and (B) the second substrate, and (E) a phase change in which a terahertz wave transmitted through the terahertz wave control element is independent of the state of polarization.
    • 34. 发明申请
    • Surface Shape Measurement Device and Surface Shape Measurement Method
    • US20220349699A1
    • 2022-11-03
    • US17272426
    • 2019-08-29
    • University of Hyogo
    • Kunihiro SATO
    • G01B9/02015G01B9/02G03H1/04
    • The present invention provides a surface shape measuring device and a surface shape measuring method which do not require a physical reference plane and can improve measurement accuracy without using a mechanical adjustment mechanism. The illumination light condensing point PQ and the reference light condensing point PL are arranged as mirror images of each other with respect to the virtual plane VP, and each data of the object light O, being a reflected light of the spherical wave illumination light Q, and the inline spherical wave reference light L is recorded on each hologram. On the virtual plane VP, the reconstructed object light hologram hV for measurement is generated, and the spherical wave optical hologram sV representing a spherical wave light emitted from the reference light condensing point PL is analytically generated. The height distribution of the surface to be measured of the object 4 is obtained from the phase distribution obtained by dividing the reconstructed object light hologram hV by the spherical wave light hologram sV. High-accuracy surface shape measurement without requiring a reference plane such as a glass substrate is realized by comparing the phase data of the reflected light acquired from the surface to be measured and the phase distribution on the plane cut surface of the spherical wave obtained analytically.