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    • 31. 发明授权
    • System and method for testing off-chip driver impedance
    • 用于测试片外驱动器阻抗的系统和方法
    • US08368422B1
    • 2013-02-05
    • US13463832
    • 2012-05-04
    • Bret Roberts DaleOliver Kiehl
    • Bret Roberts DaleOliver Kiehl
    • H03K19/00
    • H03K5/1534H03K19/00346
    • A testing circuit for verifying the impedance of off-chip drivers includes: a plurality of off-chip drivers (OCD), each off-chip driver including a through-silicon via (TSV); an IREF test pad, for driving a current to the plurality of off-chip drivers; a plurality of pre-drivers, each respective pre-driver coupled to one of the plurality of off-chip drivers, wherein the plurality of pre-drivers are configured to turn on the off-chip drivers; a VREF test pad, for inputting a reference voltage to the testing circuit; a plurality of input buffers (IB) for outputting a plurality of comparison results, each of the plurality of input buffers configured to output the plurality of comparison results according to the reference voltage and the voltage at the TSV nodes; and a test pad, coupled to the plurality of IBs, for receiving the comparison results to determine whether the impedance of each OCD is within a desired range.
    • 用于验证片外驱动器的阻抗的测试电路包括:多个芯片外驱动器(OCD),每个芯片外驱动器包括穿硅通孔(TSV); 用于驱动电流到所述多个芯片外驱动器的IREF测试焊盘; 多个预驱动器,每个相应的预驱动器耦合到所述多个片外驱动器中的一个,其中所述多个预驱动器被配置为导通所述芯片外驱动器; VREF测试板,用于向测试电路输入参考电压; 用于输出多个比较结果的多个输入缓冲器(IB),所述多个输入缓冲器中的每一个被配置为根据所述参考电压和所述TSV节点处的电压输出所述多个比较结果; 以及耦合到所述多个IB的测试焊盘,用于接收所述比较结果,以确定每个OCD的阻抗是否在期望的范围内。
    • 38. 发明授权
    • System and apparatus for generating ideal rise and fall time
    • 用于产生理想上升和下降时间的系统和装置
    • US07622972B2
    • 2009-11-24
    • US12025786
    • 2008-02-05
    • Bret Roberts DaleDarin James DaudelinRyan Andrew JurasekDave Eugene Chapmen
    • Bret Roberts DaleDarin James DaudelinRyan Andrew JurasekDave Eugene Chapmen
    • H03K5/12
    • H03K19/00361Y10T307/50
    • A system for generating an ideal rise or fall time includes: a first current source, for providing a first current; an adjustable capacitive component, coupled to the first current source, for generating an output signal according to a total capacitance controlled by a comparison signal; a signal conversion circuit, coupled to the adjustable capacitive component, for restoring charges stored in the adjustable capacitive component to a predetermined value when a voltage level of the output signal reaches a reference value to generate a clock-like signal; and a comparison circuit, coupled to the signal conversion circuit and the adjustable capacitive component, for comparing a period of the clock-like signal with a reference period of a reference clock signal and generating the comparison signal to adjust the total capacitance of the adjustable capacitive component when periods are not the same.
    • 用于产生理想上升或下降时间的系统包括:用于提供第一电流的第一电流源; 耦合到第一电流源的可调电容分量,用于根据由比较信号控制的总电容产生输出信号; 耦合到可调电容部件的信号转换电路,用于当输出信号的电压电平达到参考值以便产生类似时钟的信号时,将存储在可调电容部件中的电荷恢复到预定值; 以及耦合到信号转换电路和可调电容分量的比较电路,用于将时钟状信号的周期与参考时钟信号的参考周期进行比较,并产生比较信号,以调节可调电容的总电容 时间段不一样的组件。
    • 39. 发明授权
    • Decoupling capacitance calibration devices and methods for DRAM
    • 用于DRAM的去耦电容校准装置和方法
    • US08780666B2
    • 2014-07-15
    • US13340691
    • 2011-12-30
    • Darin James DaudelinBret Roberts Dale
    • Darin James DaudelinBret Roberts Dale
    • G11C5/14
    • G11C5/147G11C11/40G11C11/4074G11C29/021G11C29/028
    • A decoupling capacitance (decap) calibration device includes a plurality of parallel decoupling capacitors configured to be electrically connected to a power supply at a point between the power supply and logic circuitry. The plurality of capacitors exhibit a plurality of different capacitance values and are configured to independently turn on or off according to a plurality of inputs. Decap calibration circuitry is configured to update the plurality of inputs in response to a determination signal. A voltage detector is configured to detect a voltage at an output of the plurality of capacitors and to compare the output voltage to a reference voltage. The decap calibration device is configured to generate the determination signal in response to the voltage comparison.
    • 去耦电容(decap)校准装置包括多个并联去耦电容器,其被配置为在电源和逻辑电路之间的点处电连接到电源。 多个电容器具有多个不同的电容值,并被配置为根据多个输入独立地导通或截止。 解除校准电路被配置为响应于确定信号来更新多个输入。 电压检测器被配置为检测多个电容器的输出处的电压,并将输出电压与参考电压进行比较。 解叠度校准装置被配置为响应于电压比较而产生确定信号。