会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 32. 发明申请
    • MEMORY AND READING METHOD THEREOF
    • 存储器及其读取方法
    • US20100027331A1
    • 2010-02-04
    • US12183285
    • 2008-07-31
    • Chun-Hsiung HUNGHsin-Yi HO
    • Chun-Hsiung HUNGHsin-Yi HO
    • G11C16/26
    • G11C11/5671G11C16/0475G11C16/26G11C2211/5612
    • A method for reading a memory, which includes a memory cell having a first half cell and a second half cell, includes the following steps. A first voltage is applied to the memory cell to determine whether a threshold voltage of the first half cell is higher than a predetermined value or not. If the threshold voltage of the first half cell is higher than the predetermined value, a second voltage higher than the first voltage is applied to the memory cell to read data stored in the second half cell, otherwise a third voltage lower than the first voltage is applied to the memory cell to read the data stored in the second half cell.
    • 一种用于读取存储器的方法,其包括具有第一半单元和第二半单元的存储单元,包括以下步骤。 向存储单元施加第一电压,以确定第一半单元的阈值电压是否高于预定值。 如果第一半单元的阈值电压高于预定值,则向存储单元施加高于第一电压的第二电压以读取存储在第二半单元中的数据,否则低于第一电压的第三电压为 应用于存储器单元以读取存储在第二半单元中的数据。
    • 35. 发明授权
    • Programming scheme for non-volatile flash memory
    • 非易失性闪存的编程方案
    • US07474565B2
    • 2009-01-06
    • US11636920
    • 2006-12-11
    • Chun-Jen HuangChia-Jung ChenHsin-Yi Ho
    • Chun-Jen HuangChia-Jung ChenHsin-Yi Ho
    • G11C11/34G11C16/04
    • G11C16/10G11C11/5628G11C2211/5621
    • An embodiment of the present invention involves a method of programming a memory cell. The memory cell is in a first state having a maximum initial threshold voltage. The memory cell is to be programmed to one of a plurality of states having a higher target threshold voltage relative to the maximum initial threshold voltage. There is a cue voltage between the maximum initial threshold voltage and the target threshold voltage. The memory cell has a drain region. The method includes applying a drain voltage to the cell by a programming pulse having a first width, determining whether the cell has reached the cue threshold voltage, and if the cell has reached the cue threshold voltage, changing the programming pulse width from the first pulse width to a second pulse width. The second pulse width is smaller than the first pulse width.
    • 本发明的一个实施例涉及一种编程存储器单元的方法。 存储单元处于具有最大初始阈值电压的第一状态。 存储器单元将被编程为具有相对于最大初始阈值电压的较高目标阈值电压的多个状态之一。 在最大初始阈值电压和目标阈值电压之间存在一个提示电压。 存储单元具有漏极区域。 该方法包括通过具有第一宽度的编程脉冲向单元施加漏极电压,确定单元是否已经达到提示阈值电压,以及如果单元已经达到提示阈值电压,则从第一脉冲改变编程脉冲宽度 宽度到第二个脉冲宽度。 第二脉冲宽度小于第一脉冲宽度。
    • 38. 发明授权
    • Memory and operation method therefor
    • 记忆和操作方法
    • US08094494B2
    • 2012-01-10
    • US12576323
    • 2009-10-09
    • Hsin-Yi HoChun-Hsiung HungYun-Chen Chou
    • Hsin-Yi HoChun-Hsiung HungYun-Chen Chou
    • G11C11/34
    • G11C11/5642G11C16/26G11C16/349
    • In an operation method for a memory including a plurality of memory cells, a first reading is performed on the memory cells by applying a reference voltage; the reference voltage is moved if it is checked that the first reading result is not correct; a second reading is performed on the memory cells by applying the moved reference voltage; a first total number of a first logic state in the first reading is compared with a second total number of the first logic state in the second reading if it is checked that the second reading result is not correct; and the moving of the reference voltage is stopped if the first reading result has the same number of the first logic state as the second reading result, and the moved reference voltage is stored as a target reference voltage.
    • 在包括多个存储单元的存储器的操作方法中,通过施加参考电压对存储器单元执行第一读取; 如果检查到第一读取结果不正确,则移动参考电压; 通过施加移动的参考电压对存储器单元执行第二读取; 如果检查到第二读取结果不正确,则将第一读取中的第一逻辑状态的第一总数与第二读取中的第一逻辑状态的第二总数进行比较; 并且如果第一读取结果具有与第二读取结果相同数量的第一逻辑状态,并且移动的参考电压被存储为目标参考电压,则参考电压的移动停止。