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    • 34. 发明授权
    • Test pattern generating method and apparatus and storing medium for storing test pattern generating program
    • 测试模式生成方法和装置以及用于存储测试模式生成程序的存储介质
    • US07437646B2
    • 2008-10-14
    • US10965766
    • 2004-10-18
    • Daisuke Maruyama
    • Daisuke Maruyama
    • G01R31/28
    • G06F11/263G01R31/31813G01R31/318371
    • The present invention is a test pattern generating method. And the test pattern generating method provides a counting step for counting the number of faults becoming undetectable respectively, at each of states 0 and 1 that are able to be given to each of input pins of EOR gates when each of the EOR gates becomes a D frontier (different frontier) or a J frontier (justify frontier), a selecting step for selecting a state in which the number of faults becoming undetectable is smaller in the 0 and 1 states as an allocating state to the input pin, based on a counted result at the counting step, and step for generating the test pattern based on a selected state at the selecting step. With this, dynamic compaction can be effectively executed by restraining the increase of the number of test patterns.
    • 本发明是测试图形生成方法。 并且测试模式生成方法提供计数步骤,用于在每个EOR门变为D时能够分配给能够被赋予EOR门的每个输入引脚的状态0和1的每个状态变得不可检测的数量的计数步骤 边界(不同边界)或J边界(对齐边界),选择步骤,用于选择在0和1状态中的故障数量变得不可检测的状态,作为对输入引脚的分配状态,基于计数 在计数步骤中产生,以及用于在选择步骤基于选择状态产生测试图案的步骤。 由此,可以通过抑制测试图案的数量的增加来有效地执行动态压缩。
    • 35. 发明授权
    • Ball screw apparatus
    • 滚珠丝杠装置
    • US06450055B1
    • 2002-09-17
    • US09653072
    • 2000-08-31
    • Noriaki SekiyaDaisuke MaruyamaToshiyuki IehisaKazuo Miyaguchi
    • Noriaki SekiyaDaisuke MaruyamaToshiyuki IehisaKazuo Miyaguchi
    • F16H2522
    • F16H25/2214Y10T74/19772
    • A ball screw apparatus comprises a screw shaft, a nut, and a plurality of balls. A first helical groove is formed at an outer peripheral surface of the screw shaft. A second helical groove is formed at an inner peripheral surface of the nut. A rolling contact way of balls is defined by the first helical groove and the second helical groove facing each other. A connecting way formed of a tube for connecting a part and another part of the rolling contact way is provided on the nut. An endlessly communicating circuit is defined by the connecting way and the rolling contact way. Each of the balls is endlessly arranged in the circuit. A smoothly continuous machined portion is formed by cutting out an angular portion between the helical groove and the connecting way of the nut.
    • 滚珠丝杠装置包括螺杆轴,螺母和多个滚珠。 第一螺旋槽形成在螺杆轴的外周面。 在螺母的内周面形成第二螺旋槽。 球的滚动接触方式由第一螺旋槽和彼此面对的第二螺旋槽限定。 在螺母上设置由用于连接一部分的管和滚动接触方式的另一部分形成的连接方式。 无缝连接电路由连接方式和滚动接触方式定义。 每个滚珠都是循环地布置在电路中。 通过切割螺旋槽和螺母的连接方式之间的角部形成平滑连续的加工部。
    • 36. 发明授权
    • Fault simulation method and apparatus, and storage medium storing fault simulation program
    • 故障模拟方法和装置,存储介质存储故障模拟程序
    • US06205567B1
    • 2001-03-20
    • US09030858
    • 1998-02-26
    • Daisuke Maruyama
    • Daisuke Maruyama
    • G01R3128
    • G06F11/261
    • A fault simulation method in which a sufficient diagnostic rate is ensured by enabling a fault in a circuit area forward of a storage element to be handled as an object to be detected, to thereby increase the speed of detection of a fault; i.e., the speed of fault simulation. In the fault simulation method, the integrated circuit is divided into a backward circuit area, which is a combinational circuit area on the output-pin side of a storage element included in the integrated circuit, and a forward circuit area, which is a combinational circuit area on the input-pin side of the storage element. When a fault which propagates to input pins of the storage element exists in the forward circuit area, the value of the fault at that observation time is written into the storage element, and at a later observation time the value of the fault is read from the storage element and propagated to the backward circuit area from output pins of the storage element. The present invention is used when the serviceability of an integrated circuit, such as an LSI or an LSI-equipped printed board, is verified through use of test patterns.
    • 一种故障模拟方法,其中通过使待处理的存储元件的电路区域中的故障能够作为被检测对象来确保足够的诊断率,从而提高故障检测速度; 即故障模拟的速度。 在故障模拟方法中,集成电路被分为反向电路区域,该后向电路区域是集成电路中包括的存储元件的输出端侧的组合电路区域和作为组合电路的正向电路区域 存储元件的输入针侧的区域。 当在正向电路区域中存在传播到存储元件的输入引脚的故障时,将该观测时间的故障值写入存储元件,并且在稍后的观察时间,从 存储元件,并从存储元件的输出引脚传播到反向电路区域。 当通过使用测试图案来验证集成电路(例如LSI或配备LSI的印刷电路板)的可用性时,使用本发明。
    • 37. 发明申请
    • INFORMATION CLASSIFICATION SYSTEM, INFORMATION PROCESSING APPARATUS, INFORMATION CLASSIFICATION METHOD AND PROGRAM
    • 信息分类系统,信息处理设备,信息分类方法和程序
    • US20120254085A1
    • 2012-10-04
    • US13437082
    • 2012-04-02
    • Daisuke MaruyamaKazuo AokiTakehiko Ishii
    • Daisuke MaruyamaKazuo AokiTakehiko Ishii
    • G06F15/18
    • G06F17/30707
    • An information classification system includes a server including a knowledge base that receives classification information to be classified, conducts language analysis of the classification information to acquire and classify a plurality of keywords into elements made up of a classification target word and a related word that modifies the classification target word, and conducts a search with the related word, so as to assign a classification identification value to the information; a classification candidate extraction section that extracts the classification identification value that the knowledge base assigns to generate an automatic classification result; and a classification update section that receives the automatic classification result and corrects registered items in the knowledge base with a correction value received through a GUI for classification confirmation while referring to log data that is a processing history about automatic classification for the language analysis and the element classification.
    • 信息分类系统包括:服务器,其包括接收要分类的分类信息的知识库,进行分类信息的语言分析,以获取并分类多个关键字到由分类目标词和相关词组成的元素中, 分类目标字,并用相关字进行搜索,以便为信息分配分类识别值; 分类候选提取部,其提取知识库分配的分类识别值,生成自动分类结果; 以及分类更新部分,其参考作为用于语言分析的自动分类的处理历史的日志数据和元素,接收自动分类结果并且通过用于分类确认的GUI接收到的校正值来校正知识库中的注册项目, 分类。
    • 40. 发明授权
    • Integrated circuit testing method, program, storing medium, and apparatus
    • 集成电路测试方法,程序,存储介质和设备
    • US07027947B2
    • 2006-04-11
    • US10791725
    • 2004-03-04
    • Daisuke Maruyama
    • Daisuke Maruyama
    • G01R31/303
    • G01R31/318307G01R31/31813
    • An ATPG unit permits allocation of a don't care X as a state for activating a propagating path of a failure and, after a change in network, transfers the state from the don't care X to an uncontrol value, thereby activating the propagating path of the failure. Further, the ATPG unit supplies a system clock as a sending clock to a sending FF, gives a change to the network from the sending FF, propagates the change, supplies the system clock as a receiving clock to a receiving FF, and captures the network change, thereby propagating a state for detecting a delay failure to a path between the sending FF and the receiving FF and generating a test pattern when the propagation succeeds.
    • ATPG单元允许分配不关心X作为激活故障的传播路径的状态,并且在网络改变之后,将状态从不关心X传送到非控制值,从而激活传播 失败的路径 此外,ATPG单元向发送FF提供作为发送时钟的系统时钟,从发送FF给出网络的改变,传播改变,将系统时钟作为接收时钟提供给接收FF,并捕获网络 从而传播用于检测延迟故障的状态到发送FF和接收FF之间的路径,并且当传播成功时产生测试模式。