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21. 发明专利

SU402835A1 未知
公开(公告)号：SU402835A1
公开(公告)日：1973-10-19
申请号：SU1742734
申请日：1972-01-31
IPC分类号： G01R31/27 , G01R31/22

22. 发明专利

CH543098A Verfahren und Einrichtung zur Untersuchung von dotiertem Halbleitermaterial 未知
公开(公告)号：CH543098A
公开(公告)日：1973-10-15
申请号：CH477972
申请日：1972-03-30
申请人： BBC BROWN BOVERI & CIE
发明人： SITTIG ROLAND DR
IPC分类号： G01R31/26 , G01R31/28 , G01R31/22

23. 发明专利

DE2044225C3 未知
公开(公告)号：DE2044225C3
公开(公告)日：1973-09-20
申请号：DE2044225
申请日：1970-09-07
申请人： LICENTIA PATENT-VERWALTUNGS-GMBH, 6000 FRANKFURT
发明人： BELZER, HANS-JOACHIM , KUBITZKI, GERHARD
IPC分类号： G01R31/26 , G01R31/22

24. 发明专利

SE359702B 未知
公开(公告)号：SE359702B
公开(公告)日：1973-09-03
申请号：SE1009570
申请日：1970-07-21
申请人： BBC BROWN BOVERI & CIE
发明人： NYFFELER H , WUETHRICH R
IPC分类号： G01R31/26 , H02H7/12 , H02M7/04 , H02M7/10 , G01R31/22 , H02M1/00

25. 发明专利

CS149037B1 未知
公开(公告)号：CS149037B1
公开(公告)日：1973-05-24
申请号：CS140871
申请日：1971-02-25
IPC分类号： G01R31/26 , G01R31/22

26. 发明专利

SU374559A2 未知
公开(公告)号：SU374559A2
公开(公告)日：1973-03-20
申请号：SU1663956
申请日：1971-05-27
IPC分类号： G01R31/25 , G01R31/22

27. 发明专利

SU363943A1 未知
公开(公告)号：SU363943A1
公开(公告)日：1972-12-25
申请号：SU1256004
申请日：1968-07-15
IPC分类号： H01L21/66 , G01R31/22

28. 发明专利

DE2061420A1 未知
公开(公告)号：DE2061420A1
公开(公告)日：1971-06-24
申请号：DE2061420
申请日：1970-12-14
申请人： IBM
IPC分类号： H01L21/66 , G01N21/21 , G01N21/55 , G01N21/84 , G01R31/26 , G01R31/22
摘要： 1306850 Optical testing INTERNATIONAL BUSINESS MACHINES CORP 3 Dec 1970 [15 Dec 1969] 57393/70 Heading G2J The impurity concentration of semi-conductive material is determined by measuring the angle of incidence of monochromatic infrared light (polarised in the plane of incidence) at which reflectivity is a minimum. When two such minimums are found, they may be distinguished by a further test (a) intensity of reflected beam or (b) measuring angular spread for a given magnitude of intensity or (c) measuring the intensity of the plane polarized light with the plane of polarization perpendicular to the plane of incidence.

29. 发明专利

DE1962577A1 未知
公开(公告)号：DE1962577A1
公开(公告)日：1970-08-13
申请号：DE1962577
申请日：1969-12-13
申请人： TELEDYNE INC
发明人： WIESLER MORDECHAI , MARTINONIS VIRGIL , S MACINTYRE JOHN
IPC分类号： H01L21/66 , B07C5/34 , B07C5/344 , G01R31/28 , G01R31/311 , H01L21/00 , G01R31/22
摘要： 1289840 Handling semi-conductor devices TELEDYNE Inc 15 Dec 1969 [19 Dec 1968] 40682/71 Divided out of 1289837 Heading H1K [Also in Division B8] The subject-matter of the Specification is included in the Specification 1,289,837, but the claims relate to apparatus for handling a flexible tape 140 having sprocket holes 142 along one margin and spaced openings 144 in which are situated semi-conductor devices 100 stuck to an adhesive web 146 bonded to one side of the tape 140. The apparatus includes guide surfaces 158, 160 which direct the intermittently advanced tape 140 from a supply reel 148 to a position between a vacuum probe 80 and a needle 164, both of which members are vertically reciprocable, and hence to a take-up reel 154. The apparatus may be used to place devices 100 supplied by the vacuum probe 80, which is one of several arranged around a turret indexer, on the adhesive web 146 through the openings 144, or may alternatively be used to feed devices 100 from the tape 140 to the vacuum probe 80. In the latter case the reciprocating needle 164 is used to push against the web 146 to displace the device 100 upwardly through the opening 144.

30. 发明专利

DE1589467A1 未知
公开(公告)号：DE1589467A1
公开(公告)日：1970-05-14
申请号：DE1589467
申请日：1967-08-18
申请人： AMPEX
发明人： F WALLACE KURT
IPC分类号： H01J9/42 , G01R31/22
摘要： 1,203,944. Automatic voltage control. AMPEX CORP. Aug.18, 1967 [Aug.19, 1966], No.35878/67. Heading G3R. [Also in Division H2] A circuit arrangement for prolonging the life of a cathode filament 18 of an electron microscope and for indicating the end of the useful life thereof comprises a constant voltage supply source 20 for the filament and an indicating device 24 indicating the end of life. The supply voltage to the filament is maintained constant by means of a feedback link 22 or by manual means. During the life of the filament evaporation thereof takes place causing- with a constant voltage supplya gradual reduction in the filament current. This reducation in current alters the indication of the device 24 and when the filament current reduces to a predetermined valuesay 80% of the initial filament current settable by resistor 26- the filament is considered to be at the end of its useful life.

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