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21. 发明专利

DE10084431B4 Aktive Sonde für ein Rasterkraftmikroskop mit atomarer Auflösung sowie Verfahren zur Verwendung derselben 未知
公开(公告)号：DE10084431B4
公开(公告)日：2011-08-11
申请号：DE10084431
申请日：2000-03-03
申请人： VEECO INSTR INC
发明人： ADDERTON DENNIS M , MINNE STEPHEN C
IPC分类号： G01B21/30 , G01Q10/06 , G01Q20/02 , G01Q60/24 , G01Q60/34 , G05D3/00 , G05D3/12
摘要： AFM zum Analysieren einer Probe mit einer vorbestimmten Abtastrate im Kontaktmodus, mit: einem selbstbetätigten Federbalken mit einem darauf angeordneten Z-Positionierungselement und einer daran angebrachten Spitze, welche die Probe im Wesentlichen kontinuierlich während einer Abtastoperation kontaktiert, einer ersten Rückkopplungsschaltung, die im Ansprechen auf eine vertikale Verschiebung des selbstbetätigten Federbalkens ein Federbalken-Steuersignal erzeugt, einer auf das Federbalken-Steuersignal ansprechenden zweiten Rückkopplungsschaltung zum Erzeugen eines Positionssteuersignals, wobei das Federbalken-Steuersignal in die zweite Rückkopplungsschaltung eingegeben wird, so dass die erste Rückkopplungsschaltung innerhalb der zweiten Rückkopplungsschaltung verschachtelt ist, und einem auf das Positionssteuersignal ansprechenden Z-Position-Aktuator zum Positionieren des selbstbetätigten Federbalkens oder der Probe, um den Abstand zwischen dem selbstbetätigten Federbalken und der Probe zu ändern.

22. 发明专利

DE602006002986D1 未知
公开(公告)号：DE602006002986D1
公开(公告)日：2008-11-13
申请号：DE602006002986
申请日：2006-06-21
申请人： CENTRE NAT RECH SCIENT , UNIV MONTPELLIER II
发明人： GIRARD PAUL , RAMONDA MICHEL , ARINERO RICHARD
IPC分类号： G01Q10/00 , G01Q60/32 , G01Q60/34

23. 发明专利

DE102006006811A1 未知
公开(公告)号：DE102006006811A1
公开(公告)日：2006-11-30
申请号：DE102006006811
申请日：2006-02-14
申请人： SII NANOTECHNOLOGY INC
发明人： YASUTAKE MASATOSHI , NAKAUE TAKUYA , WATANABE KAZUTOSHI , TAKAOKA OSAMU , UEMOTO ATSUSHI , WATANABE NAOYA , SHIKAKURA YOSHITERU
IPC分类号： B82B3/00 , B82Y40/00 , G01Q30/02 , G01Q60/24 , G01Q60/34 , G01Q80/00

24. 发明专利

DE10084431T5 未知
公开(公告)号：DE10084431T5
公开(公告)日：2004-07-01
申请号：DE10084431
申请日：2000-03-03
申请人： NANODEVICES INC
发明人： ADDERTON DENNIS M , MINNE STEPHEN C
IPC分类号： G01B21/30 , G01Q10/06 , G01Q20/02 , G01Q60/24 , G01Q60/34 , G05D3/00 , G05D3/12 , G12B21/20 , G01N13/16
摘要： An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value. The AFM includes a first feedback circuit nested within a second feedback circuit, wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever during a scanning operation, and the second feedback circuit is responsive to the cantilever control signal to generate a position control signal. A Z position actuator is also included within the second feedback circuit and is responsive to the position control signal to position the sample. In operation, preferably, the cantilever control signal alone is indicative of the topography of the sample surface. In a further embodiment, the first feedback circuit includes an active damping circuit for modifying the quality factor ("Q") of the cantilever resonance to optimize the bandwidth of the cantilever response.

25. 发明专利

CA2491404A1 SCANNING PROBE MICROSCOPE 未知
公开(公告)号：CA2491404A1
公开(公告)日：2004-01-15
申请号：CA2491404
申请日：2003-07-04
申请人： UNIV BRISTOL
发明人： HUMPHRIS ANDREW DAVID LAVER , HOBBS JAMIE KAYNE , MILES MERVYN JOHN
IPC分类号： G01B1/00 , G01Q30/04 , G01Q60/24 , G01Q60/34 , G01Q60/46 , G01B7/34
摘要： A scanning probe microscope detects or induces changes in a probe-sample interaction. In imaging mode, the probe (54) is brought into a contact distance of the sample (12) and the strength of the interaction measured as the probe (54) and sample surface are scanned relative to each other. Image collection is rapidly performed by carrying out a relative translation of th e sample (12) and probe (54) whilst one or other is oscillated at or near its resonant frequency. In a preferred embodiment the interaction is monitored b y means of capacitance developed at an interface between a metallic probe and the sample. In lithographic mode, an atomic force microscope is adapted to write information to a sample surface.

26. 发明专利

CA2487792A1 DEVICE AND METHOD OF USE FOR DETECTION AND CHARACTERIZATION OF PATHOGENS AND BIOLOGICAL MATERIALS 未知
公开(公告)号：CA2487792A1
公开(公告)日：2003-12-11
申请号：CA2487792
申请日：2003-05-29
申请人： BIOFORCE NANOSCIENCES INC
发明人： MOSHER CURTIS L , NETTIKADAN SAJU R , HENDERSON ERIC R
IPC分类号： B05D3/00 , C12Q1/02 , C12Q1/68 , C12Q1/70 , G01N33/552 , G01N33/553 , G01N33/554 , G01N33/569 , G01Q10/00 , G01Q30/20 , G01Q60/34 , G02B26/10
摘要： The present invention includes a method and apparatus for the detection of a target material. The method and apparatus includes providing a substrate wit h a surface and forming a domains of deposited materials thereon. The deposite d material can be placed on the surface and bound directly and non-specificall y to the surface, or it may be specifically or non-specifically bound to the surface. The deposited material has an affinity for a specific target material. The domains thus created are termed affinity domains or deposition domains. Multiple affinity domains of deposited materials can be deposited o n a single surface, creating a plurality of specific binding affinity domains for a plurality of target materials. Target materials may include, for example, pathogens or pathogenic markers such as viruses, bacteria, bacteria l spores, parasites, prions, fungi, mold or pollen spores. The device thus created is incubated with a test solution, gas or other supporting environme nt suspected of containing one or more of the target materials. Specific bindin g interactions between the target materials and a particular affinity domain occurs and is detected by various methods.

27. 发明专利

DE69906835D1 未知
公开(公告)号：DE69906835D1
公开(公告)日：2003-05-22
申请号：DE69906835
申请日：1999-01-21
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： YAMAMOTO MASAKI
IPC分类号： G01B7/28 , B23H9/00 , G01B7/00 , G01B7/34 , G01B21/20 , G01N37/00 , G01Q10/04 , G01Q20/04 , G01Q60/24 , G01Q60/34 , G01Q60/38 , G01Q60/40 , G01Q70/00 , G01Q70/10 , G01Q70/14 , B23H1/00
摘要： For three dimensional measuring in the submillimeter order of inner surfaces of fuel injector nozzles or ink jet nozzles (46). The probe (1)(stepped cantilever with pointed tip) is piezoelectrically (3) oscillated near resonance and adjusted (48) to a distortion amount. Electric (current)(53), magnetic (probe coil) measurements are added. The probe is of cemented carbide (WC,Co), diamond, boron nitride, and is fabricated by a micro electric discharge machining. A detoriated layer is removed by abrasive grain processing.

28. 发明专利

CA2462833A1 PROTEIN AND PEPTIDE NANOARRAYS 未知
公开(公告)号：CA2462833A1
公开(公告)日：2003-05-08
申请号：CA2462833
申请日：2002-10-02
申请人： UNIV NORTHWESTERN
发明人： MIRKIN CHAD A , DELLA CIOPPA GUY , DEMERS LINETTE , LEE KI-BUM , PARK SO-JUNG
IPC分类号： G01Q80/00 , G01Q90/00 , B01J19/00 , C07K17/14 , C12N11/14 , C40B40/10 , C40B60/14 , G01N33/53 , G01N37/00 , G01Q60/34 , G01Q70/06 , C07K17/00 , C07K1/04
摘要： Ultrahigh resolution patterning, preferably carried out by dip-pen nanolithographic printing, can be used to construct peptide and protein nanoarrays with nanometer-level dimensions. The peptide and protein nanoarrays, for example, exhibit almost no detectable nonspecific binding of proteins to their passivated portions. This work demonstrates how dip pen nanolithographic printing can be used in a method to generate high density protein and peptide patterns, which exhibit bioactivity and virtually no non - specific adsorption. It also shows that one can use AFM-based screening procedures to study the reactivity of the features that comprise such nanoarrays. The method encompasses a wide range of protein and peptide structures including, for example, enzymes and antibodies. Features at or below 300 nm can be achieved.

29. 发明专利

AU3510100A Active probe for an atomic force microscope and method of use thereof 未知
公开(公告)号：AU3510100A
公开(公告)日：2000-10-16
申请号：AU3510100
申请日：2000-03-03
申请人： NANODEVICES INC
发明人： ADDERTON DENNIS M , MINNE STEPHEN C
IPC分类号： G01B21/30 , G01Q10/06 , G01Q20/02 , G01Q60/24 , G01Q60/34 , G05D3/00 , G05D3/12
摘要： An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value. The AFM includes a first feedback circuit nested within a second feedback circuit, wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever during a scanning operation, and the second feedback circuit is responsive to the cantilever control signal to generate a position control signal. A Z position actuator is also included within the second feedback circuit and is responsive to the position control signal to position the sample. In operation, preferably, the cantilever control signal alone is indicative of the topography of the sample surface. In a further embodiment, the first feedback circuit includes an active damping circuit for modifying the quality factor ("Q") of the cantilever resonance to optimize the bandwidth of the cantilever response.

30. 发明专利

AU4076797A Atomic force microscope for generating a small incident beam spot 未知
公开(公告)号：AU4076797A
公开(公告)日：1998-03-26
申请号：AU4076797
申请日：1997-08-20
申请人： UNIV CALIFORNIA
发明人： HANSMA PAUL K , SCHAFFER TILMAN E , CLEVELAND JASON P
IPC分类号： G01B7/34 , G01B5/20 , G01B5/28 , G01B21/30 , G01Q20/02 , G01Q60/34 , G01Q60/38 , H01J3/14
摘要： An atomic force microscope utilizes an optical system having a numerical aperture sufficient with the wavelength of light of an incident beam (44) to form a spot on a cantilever (14) having a size of 8 micrometers or less in at least one dimension. An adjustable aperture (34) can be utilized to control the size and/or shape of the incident beam spot on the cantilever (14). Portions of the incident beam and the beam reflected from the cantilever overlap and are directed so that the plane of focus of the incident beam is parallel to the plane of the cantilever (14). The incident and reflected light beams are separated by polarization using a beamsplitter (40) in conjunction with a quarterwave plate (42). Focussing can be accomplished with a confocal viewing system coupled with a translatable focussing lens common to the optical system and the viewing system.

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