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    • 28. 发明授权
    • Memory testing method
    • 内存测试方法
    • US06721915B2
    • 2004-04-13
    • US09750098
    • 2000-12-29
    • Satoshi SatoTakeshi FurukawaAkiko Matsumoto
    • Satoshi SatoTakeshi FurukawaAkiko Matsumoto
    • G06F1100
    • G11C29/10G11C29/56
    • In the case where the internal configuration is different in each memory (in the case where the correspondence information between the program address designated by the testing program and the physical address in the memory is different), the correspondence information of each memory is input from externally to the memory testing program, so that it becomes possible to use versatilely the memory testing program. Furthermore, even in the case where the internal configuration is unclear, it becomes possible to presume the internal configuration, so that it becomes possible to use versatilely the memory testing program for various memories.
    • 在每个存储器内部配置不同的情况下(在由测试程序指定的程序地址与存储器中的物理地址之间的对应信息不同的情况下),每个存储器的对应信息从外部输入 到内存测试程序,使得可以通用的内存测试程序。 此外,即使在内部结构不清楚的情况下,也可以设定内部结构,从而可以通用地使用各种存储器的存储器测试程序。