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    • 22. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08987829B2
    • 2015-03-24
    • US12100621
    • 2008-04-10
    • Yoshiaki ShimookaTakashi IzumidaHiroki Okamoto
    • Yoshiaki ShimookaTakashi IzumidaHiroki Okamoto
    • H01L27/092H01L21/8238H01L29/78
    • H01L21/823807H01L27/092H01L29/7843H01L29/7846
    • A semiconductor device may include a p-channel semiconductor active region and an n-channel semiconductor active region. An element isolation insulating layer electrically isolates the p-channel semiconductor active region from the n-channel semiconductor active region. An insulating layer made of a different material, being in contact with both ends, in its channel length direction, of the p-channel semiconductor active region applies a compression stress in the channel length direction to a channel of the p-channel semiconductor active region. The p-channel semiconductor active region is surrounded by the insulating layer, in the channel length direction, of the p-channel semiconductor active region and by the element isolation insulating layer, parallel to the channel length direction, of the p-channel semiconductor active region. The n-channel semiconductor active region is surrounded by the element isolation insulating layer.
    • 半导体器件可以包括p沟道半导体有源区和n沟道半导体有源区。 元件隔离绝缘层将p沟道半导体有源区与n沟道半导体有源区电隔离。 由p沟道半导体有源区的沿其沟道长度方向与两端接触的不同材料制成的绝缘层将沟道长度方向的压缩应力施加到p沟道半导体有源区的沟道 。 p沟道半导体有源区被p沟道半导体有源区的沟道长度方向的绝缘层和与沟道长度方向平行的元件隔离绝缘层包围, 地区。 n沟道半导体有源区被元件隔离绝缘层包围。
    • 27. 发明申请
    • MEMS DEVICE
    • MEMS器件
    • US20110095382A1
    • 2011-04-28
    • US12907110
    • 2010-10-19
    • Yoshiaki Shimooka
    • Yoshiaki Shimooka
    • H01L29/84H01L21/02
    • B81C1/00476B81B2207/097B81C2203/0136B81C2203/0145
    • A MEMS device of an embodiment includes: a MEMS element; a first cavity region provided on the MEMS element; a second cavity region provided on a surrounding portion outside the MEMS element, the second cavity region having a lower height than the first cavity region; a third cavity region provided on a surrounding portion outside the second cavity region, the third cavity region having a lower height than the second cavity region; an insulating film provided to cover upper portions and side surfaces of the first to the third cavity regions; an opening provided in the insulating film on the first to the third cavity regions; and a sealant provided on the insulating film to seal the opening and to retain the first to the third cavity regions.
    • 实施例的MEMS器件包括:MEMS元件; 设置在所述MEMS元件上的第一腔区; 第二空腔区域,设置在MEMS元件外部的周围部分上,第二空腔区域具有比第一空腔区域低的高度; 第三腔区,设置在第二腔区外的周围部分,第三腔区具有比第二腔区更低的高度; 绝缘膜,设置为覆盖第一至第三腔区的上表面和侧表面; 设置在第一至第三腔区域的绝缘膜上的开口; 以及设置在绝缘膜上以密封开口并保持第一至第三腔区的密封剂。