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    • 23. 发明授权
    • Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit
    • 半导体器件,半导体器件的测试方法以及半导体集成电路
    • US06774655B2
    • 2004-08-10
    • US10622472
    • 2003-07-21
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • G01R3102
    • G11C29/022G11C29/02
    • A semiconductor device mounted on a board or the like and having a test circuit, having the function of carrying out a contact test at a low cost on the terminals of the semiconductor, is disclosed. The semiconductor device comprises a terminal test circuit for testing a state of a contact of an external terminal and a test mode control circuit unit. The test mode control circuit unit outputs a signal indicating a first operation mode upon application of a power supply voltage thereto, outputs a test mode signal to the terminal test circuit in response to a control signal input to a specific terminal such as a chip select terminal, and outputs a signal indicating a second operation mode in response to the number of times in which the level of the control signal input to the specific terminal changes. Preferably, the first operation mode is a terminal test mode, and the second operation mode is a normal operation mode. A method of testing the semiconductor device and a semiconductor integrated circuit, having the test circuit, are also disclosed.
    • 公开了一种安装在板等上并具有测试电路的半导体器件,具有在半导体端子上以低成本进行接触测试的功能。 半导体器件包括用于测试外部端子和测试模式控制电路单元的接触状态的端子测试电路。 测试模式控制电路单元在施加电源电压时输出指示第一操作模式的信号,响应于输入到诸如芯片选择端子的特定终端的控制信号,向终端测试电路输出测试模式信号 并且响应于输入到特定终端的控制信号的电平改变的次数而输出指示第二操作模式的信号。 优选地,第一操作模式是终端测试模式,并且第二操作模式是正常操作模式。 还公开了一种测试半导体器件的方法和具有测试电路的半导体集成电路。
    • 25. 发明授权
    • Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit
    • 半导体器件,半导体器件的测试方法以及半导体集成电路
    • US06621283B1
    • 2003-09-16
    • US09437221
    • 1999-11-10
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • Yasurou MatsuzakiMasao NakanoToshiya UchidaAtsushi HatakeyamaKenichi KawasakiYasuhiro Fujii
    • G01R3102
    • G11C29/022G11C29/02
    • A semiconductor device mounted on a board or the like and having a test circuit, having the function of carrying out a contact test at a low cost on the terminals of the semiconductor, is disclosed. The semiconductor device comprises a terminal test circuit for testing a state of a contact of an external terminal and a test mode control circuit unit. The test mode control circuit unit outputs a signal indicating a first operation mode upon application of a power supply voltage thereto, outputs a test mode signal to the terminal test circuit in response to a control signal input to a specific terminal such as a chip select terminal, and outputs a signal indicating a second operation mode in response to the number of times in which the level of the control signal input to the specific terminal changes. Preferably, the first operation mode is a terminal test mode, and the second operation mode is a normal operation mode. A method of testing the semiconductor device and a semiconductor integrated circuit, having the test circuit, are also disclosed.
    • 公开了一种安装在板等上并具有测试电路的半导体器件,具有在半导体端子上以低成本进行接触测试的功能。 半导体器件包括用于测试外部端子和测试模式控制电路单元的接触状态的端子测试电路。 测试模式控制电路单元在施加电源电压时输出指示第一操作模式的信号,响应于输入到诸如芯片选择端子的特定终端的控制信号,向终端测试电路输出测试模式信号 并且响应于输入到特定终端的控制信号的电平改变的次数而输出指示第二操作模式的信号。 优选地,第一操作模式是终端测试模式,并且第二操作模式是正常操作模式。 还公开了一种测试半导体器件的方法和具有测试电路的半导体集成电路。
    • 28. 发明授权
    • Braking device for dual-bearing reel
    • 双轴承卷轴制动装置
    • US06293483B1
    • 2001-09-25
    • US09610584
    • 2000-07-05
    • Jun SatoKenichi Kawasaki
    • Jun SatoKenichi Kawasaki
    • A01K8902
    • A01K89/0155
    • A dual-bearing reel centrifugal braking mechanism 23 that enables braking force to be adjusted readily and accurately. The centrifugal braking mechanism 2, for braking the spool 12 rotatively provided in a reel unit 1, and includes a brake element 51, a rotor 52, a plurality of shifting members 53, and a shifting mechanism 54. The brake element 51 is fixed to the reel body. The rotor 52 is disposed being concentric with the brake element 51. The rotor 52 is a member which rotates together with the spool 12 and is capable of moving in a direction along the axial direction of the spool 12 with respect of the reel unit 1. The plurality of shifting members 53 is attached to the rotor 52 in a movable manner so that each member may be moved towards the brake element 51 by a centrifugal force generated by the rotation of the spool 12. The plurality of shifting members 53 is also members which are capable of making contact with the brake element 51 with a different number of them during a braking operation by the movement of the rotor 52 in the axial direction. The shifting mechanism 54 is a mechanism for reciprocating the rotor 52 in the axial direction.
    • 双轴承卷轴离心制动机构23,其能够容易且精确地调节制动力。 离心式制动机构2用于制动旋转地设置在卷轴单元1中的线轴12,并且包括制动元件51,转子52,多个变速构件53和变速机构54.制动元件51固定到 卷轴体。 转子52设置成与制动元件51同心。转子52是与卷轴12一起旋转的构件,并且能够相对于卷轴单元1沿着卷轴12的轴向方向移动。 多个移动构件53以可移动的方式附接到转子52,使得每个构件可以通过由卷轴12的旋转产生的离心力而朝向制动元件51移动。多个移动构件53也是构件 其能够通过转子52沿轴向的移动而在制动操作期间与不同数量的制动元件51接触。 换档机构54是使转子52沿轴向往复运动的机构。