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    • 22. 发明授权
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US07515281B2
    • 2009-04-07
    • US11224308
    • 2005-09-13
    • Erik Roelof LoopstraEngelbertus Antonius Fransiscus Van der Pasch
    • Erik Roelof LoopstraEngelbertus Antonius Fransiscus Van der Pasch
    • G01B11/02G01D5/36
    • G03F7/70775
    • A lithographic apparatus includes a displacement measuring system configured to measure the position of a substrate table in at least three degrees of freedom. The displacement measuring system includes a first x-sensor configured to measure the position of the substrate table in a first direction and a first and a second y-sensor configured to measure the position of the substrate table in a second direction. Said displacement measuring system further comprises a second x-sensor. The first and second x-sensor and first and second y-sensors are encoder type sensors configured to measure the position of each of the sensors with respect to at least one grid plate. The displacement measuring system is configured to selectively use, depending on the position of the substrate table, three of the first and second x-sensors and the first and second y-sensors to determine the position of the substrate table in three degrees of freedom.
    • 光刻设备包括位移测量系统,其配置成以至少三个自由度来测量衬底台的位置。 位移测量系统包括构造成测量第一方向上的衬底台的位置的第一x传感器和被配置为在第二方向上测量衬底台的位置的第一和第二y传感器。 所述位移测量系统还包括第二x传感器。 第一和第二x传感器以及第一和第二y传感器是构造成测量每个传感器相对于至少一个格栅板的位置的编码器型传感器。 位移测量系统被配置为根据衬底台的位置选择性地使用第一和第二x传感器中的三个以及第一和第二y传感器,以确定衬底台在三个自由度中的位置。
    • 23. 发明授权
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US07230676B1
    • 2007-06-12
    • US11373529
    • 2006-03-13
    • Erik Roelof LoopstraEngelbertus Antonius Fransiscus Van Der Pasch
    • Erik Roelof LoopstraEngelbertus Antonius Fransiscus Van Der Pasch
    • G03B27/42G03B27/52G03B27/58
    • G03F7/70775G03F7/70341
    • A lithographic apparatus includes a liquid confinement system to confine liquid in a space between a final element of a projection system and a substrate, and a first and a second substrate stage that are configured to mutually cooperate in order to perform a joint movement for bringing the lithographic apparatus from a first configuration, in which the liquid is confined between a first substrate held by the first substrate stage and the final element, towards a second configuration, in which the liquid is confined between a second substrate held by the second substrate stage and the final element, such that during the joint movement the liquid is essentially confined within the space with respect to the final element. The apparatus also includes a position measurement system configured to at least during the joint movement measure the position of the first and second substrate stages.
    • 光刻设备包括液体限制系统,用于将液体限制在投影系统的最终元件与基板之间的空间中;以及第一和第二基板台,其被配置为相互配合以执行关节运动,以使 光刻设备,其中液体被限制在由第一基板台保持的第一基板和最终元件之间的第一配置朝向第二配置,其中液体被限制在由第二基板台保持的第二基板和 最终元件,使得在联合运动期间,液体基本上被限制在相对于最终元件的空间内。 该装置还包括位置测量系统,其配置为至少在联合移动期间测量第一和第二基板台的位置。