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21. 发明授权

US07551350B2 Super-resolution microscope 有权
标题翻译：超分辨率显微镜
公开(公告)号：US07551350B2
公开(公告)日：2009-06-23
申请号：US11659525
申请日：2005-07-25
申请人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
发明人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
IPC分类号： G02B21/06 , G02B21/00
CPC分类号： G01N21/6458 , G01N2021/6419 , G01N2021/6439 , G02B21/002 , G02B21/16 , G02B27/58
摘要： A super-resolution microscope includes an optical system for combining a part of a first coherent light from a first light source and a part of a second coherent light from a second light source and focusing the coherent lights onto a sample, scanning , unit for scanning the coherent lights, and a detecting unit for detecting an optical response signal from the sample. The microscope is configured so as to satisfy the following conditions: σ01Ipτ≦1, and 0.65(λe/λp)≦τσdipIe.
摘要翻译：超分辨率显微镜包括用于组合来自第一光源的第一相干光的一部分和来自第二光源的第二相干光的一部分的光学系统，并将相干光聚焦到样本上，扫描单元进行扫描相干光，以及用于检测来自样品的光响应信号的检测单元。显微镜配置为满足以下条件：<？in-line-formula description =“In-line Formulas”end =“lead”？> sigma01Iptau <= 1，<？in-line-formula description =“ 在线公式“end =”tail“？> <？in-line-formula description =”In-line Formulas“end =”lead“？> 0.65（lambdae / lambdap）<= tausigmadipIe。 <？in-line-formula description =“In-line Formulas”end =“tail”？>

22. 发明申请

US20070183029A1 Microscope and its optical controlling method 审中-公开
标题翻译：显微镜及其光学控制方法
公开(公告)号：US20070183029A1
公开(公告)日：2007-08-09
申请号：US10821474
申请日：2004-04-08
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/0076 , G02B21/002 , G02B21/0032
摘要： Microscope and its optical controlling method capable of making an optical adjustment of first and second lights being made in easy with high accuracy, and capable of developing the effect of the superresolution and expected optical performance surely, is provided. The microscope comprises first deflection means 14a and 14b for deflecting the first light from the first light source 11 that excites the molecule included in the specimen 74 from the ground-state to the first electronically excited state, two dimensionally second deflecting means 7a, 17b for deflecting a second light from a second light source 12 to excite the molecule from the first electron exciting state to the second electron exciting state with more higher energy level, two dimensionally, a combining means 16 for synthesizing deflected first light and second light on the same optical axis or on the mutually parallel optical axis, and third deflection means 19a, 19b for deflecting the synthesized first light and the second light simultaneously, wherein the luminescence is detected, by adjusting the optical axes of the first light to the third light by the first to third deflection means, and by overlapping part of these lights by the beam-condensing optical system 72 and irradiating them on the specimen 74.
摘要翻译：提供了能够以高精度使第一和第二光的光学调节光学调节的显微镜及其光学控制方法，并且能够确实地发展超分辨率和期望的光学性能的效果。显微镜包括用于使来自第一光源11的第一光偏转的第一偏转装置14a，激发被检体74中包含的分子从基态激发到第一电子激发状态，二维第二偏转装置7a ，17b，用于偏转来自第二光源12的第二光，以将分子从第一电子激发状态激发到具有更高能级的第二电子激励状态，二维地，用于合成偏转的第一光和第二光的合成装置16 在同一光轴上或在相互平行的光轴上的光，以及用于同时偏转合成的第一光和第二光的第三偏转装置19b，其中通过调节第一光的光轴来检测发光通过第一至第三偏转装置到第三光，并且通过聚光光学系统72和这些光的一部分重叠将其照射在样品74上。

23. 发明授权

US06633432B2 Optical device and a microscope 失效
标题翻译：光学装置和显微镜
公开(公告)号：US06633432B2
公开(公告)日：2003-10-14
申请号：US09934440
申请日：2001-08-21
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B2126
CPC分类号： G02B27/58 , G01N21/6458 , G02B21/16
摘要： An optical device and microscope of simple construction are provided that are capable of readily attaining super resolution with good focusing performance. This comprises a light source means (2, 3, 4, 6, 8) that generates light of multiple different wavelengths, a light condensation means to focus lights of these multiple wavelengths on an object 1, and an emitted light detector means 17 for detection of light emitted from said object 1. Among said multiple lights of different wavelengths generated from said light source means, at least one light forms a condensed light pattern of multiple spatial modes. These multiple lights are condensed upon said object 1 such that part of the region of the condensed light pattern of said multiple spatial modes is made to spatially overlap with the condensed light pattern of the other light.
摘要翻译：提供了简单结构的光学装置和显微镜，其能够容易地获得具有良好聚焦性能的超分辨率。这包括产生多个不同波长的光的光源装置（ 2,3,4,6,8 ），将这些多个波长的光聚焦在一起的光凝结装置对象 1 ，以及发射光检测器表示 17 ，用于检测从所述对象发射的光 1 。在从所述光源装置产生的所述多个不同波长的光中，至少一个光形成多个空间模式的聚光模式。这些多个光在所述对象 1 上被聚合，使得所述多个空间模式的聚集的光图案的区域的一部分被制成与空间上与其他光。

24. 发明授权

US5163078A Multilayer film reflecting mirror for X-rays 失效
标题翻译：用于X射线的多层膜反射镜
公开(公告)号：US5163078A
公开(公告)日：1992-11-10
申请号：US781912
申请日：1991-10-24
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G21K1/06
CPC分类号： G21K1/062 , B82Y10/00 , G21K2201/061 , G21K2201/064 , G21K2201/067
摘要： An X-ray multilayer film reflecting mirror comprises a plurality of substance layers formed on a substrate to be applied to X-rays having a wavelength of 100 .ANG. or less so that a deviation .DELTA. of the film thickness of each layer from a standard value is within a range defined by ##EQU1## where .theta. is the grazing angle of an X-ray being incident and .lambda. is the wavelength of the X-ray. Thus, the multilayer film reflecting mirror having the reflectance which is advantageous in practical use can be stably provided, and a product yield is improved.
摘要翻译： X射线多层膜反射镜包括形成在基板上的多个物质层，其被施加到具有100个或更小的波长的X射线，使得每层的膜厚度与标准值的偏差DELTA为在由定义的范围内，θ是入射的X射线的掠角，λ是X射线的波长。因此，可以稳定地提供具有有利于实际应用的反射率的多层膜反射镜，提高产品收率。

25. 发明授权

US5144497A Swchwarzschild optical system 失效
标题翻译： Swchwarzschild光学系统
公开(公告)号：US5144497A
公开(公告)日：1992-09-01
申请号：US489006
申请日：1990-03-06
申请人： Mikiko Kato , Yoshinori Iketaki
发明人： Mikiko Kato , Yoshinori Iketaki
IPC分类号： G21K1/06 , G02B5/08 , G02B5/28 , G02B17/00 , G02B17/06 , G02B21/04 , G03F7/20 , G21K7/00
CPC分类号： G21K7/00 , G02B17/061 , G02B21/04 , G03F7/70233
摘要： In a Schwarzschild optical system comprising a concave mirror having an aperture at its center and a convex mirror disposed in face of the concave mirror, the convex mirror is coated with a multilayer film such that an incident angle .theta.02 on the convex mirror at which reflectance is maximized with respect to light of a particular wavelength satisfies the following condition:By such structure, the Schwarzshild optical system of the present invention provides an important advantage in practical use that transmittance efficiency is extremely favorable..alpha.(.theta.02, N.A.).gtoreq.0.5 .alpha..sub.max.theta.1 .sub.min
摘要翻译：在包括在其中心具有孔的凹面镜和设置在凹面的表面上的凸面镜的Schwarzschild光学系统中，凸面镜涂覆有多层膜，使得凸面镜上的入射角θ02反射相对于特定波长的光最大化满足以下条件：通过这种结构，本发明的施瓦茨灯光学系统在实际应用中提供了透射效率非常有利的重要优点。 α（θ02，NA）> / = 0.5 alpha maxθ1 min <θ01θmax，其中＆lt; IMAGE＆gt; + TR＆lt; IMAGE＆gt;和＆lt; IMAGE＆gt;θmax = sin-1（NA） > B = 2 beta /（sinθ02 xcosθ02）αIMA = alpha（theta 02，NA）的最大值

26. 发明授权

US5103100A X-ray detector 失效
标题翻译： X射线探测器
公开(公告)号：US5103100A
公开(公告)日：1992-04-07
申请号：US566107
申请日：1990-08-13
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01T1/24 , G01T1/36 , H05G1/26
CPC分类号： H05G1/26
摘要： An X-ray detector, which is concerned with X-rays having wavelengths of less than 100 .ANG., includes an X-ray filter with a thickness smaller than a previously defined value, a semiconductor light-receiving element arranged behind the X-ray filter, and a measuring device for measuring an output produced by the semiconductor light-receiving element. This detector is provided with a grazing incidence mirror in front of the X-ray filter so that the wavelength selection and intensity measurement can be effected simultaneously. The X-ray detector has important advantages in practical use that the power source system does not come to a large scale, its periphery circuit is simple, and sensitivity is as high as one to two orders than that of a conventional X-ray diode.
摘要翻译：涉及具有小于100安培的波长的X射线的X射线检测器包括厚度小于预定值的X射线滤光器，设置在X射线滤光器后面的半导体光接收元件以及用于测量由半导体光接收元件产生的输出的测量装置。该检测器在X射线滤波器前面设置有掠入射镜，使得可以同时进行波长选择和强度测量。 X射线检测器在实际应用中具有重要的优点，即电源系统不会大规模，其外围电路简单，灵敏度高达常规X射线二极管的一到二个数量级。

27. 发明授权

US08699132B2 Ultra-high resolution microscope 有权
标题翻译：超高分辨率显微镜
公开(公告)号：US08699132B2
公开(公告)日：2014-04-15
申请号：US13162993
申请日：2011-06-17
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/06 , G01N21/6458 , G01N2021/6419 , G02B21/0032 , G02B21/0068 , G02B21/0072 , G02B21/0076
摘要： A microscope capable of forming a beam spot in a desired shape on a focal plane is provided.The microscope is provided with a modulation optical element (38) having a plurality of regions for spatial modulation of illumination light and an adjustment element (37) for adjusting an optical property of the illumination light modulated by the modulation optical element.
摘要翻译：提供能够在焦平面上形成期望形状的光斑的显微镜。显微镜配备有具有用于照明光的空间调制的多个区域的调制光学元件（38）和用于调整由调制光学元件调制的照明光的光学特性的调整元件（37）。

28. 发明授权

US08536543B2 Super-resolution microscope 有权
标题翻译：超分辨率显微镜
公开(公告)号：US08536543B2
公开(公告)日：2013-09-17
申请号：US12961917
申请日：2010-12-07
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01N21/64
CPC分类号： G02B21/0076 , G02B21/0068 , G02B21/0072 , G02B27/58
摘要： Provided is a super-resolution microscope for observing a specimen containing a substance having two or more excited quantum state, which includes: a light source section that outputs a first illumination light for exciting the substance from a stable state to a first quantum state, and a second illumination light for further transitioning the substance to other quantum state; an optical system including a microscope objective lens and condensing the first illumination light and the second illumination light, each outputted from the light source section, onto the specimen in a manner that these lights are partially overlapped with each other; a detection section that detects an optical response signal emitted from the specimen in response to condensing of the first illumination light and the second illumination light; and, a polarization controlling element provided with a polarizing member that converts a polarization state of the first illumination light or the second illumination light, and a phase modulation section integrally formed with the polarizing member and spatially modulating a phase of the second illumination light.
摘要翻译：本发明提供一种用于观察包含具有两个以上激发量子态的物质的检体的超分辨率显微镜，其特征在于，包括：将从所述稳定状态激发所述物质的第一照明光输出至第一量子状态的光源部，以及用于将物质进一步转变为其他量子态的第二照明光; 包括显微镜物镜的光学系统，将从光源部输出的第一照明光和第二照明光以使得这些光部分重叠的方式聚集在样本上; 检测部，其响应于所述第一照明光和所述第二照明光的聚光而检测从所述样本发射的光响应信号; 以及偏振控制元件，其设置有转换第一照明光或第二照明光的偏振状态的偏振构件，以及与偏振构件一体形成的相位调制部，并对第二照明光的相位进行空间调制。

29. 发明授权

US07812967B2 Microscopy method and microscope 有权
标题翻译：显微镜法和显微镜
公开(公告)号：US07812967B2
公开(公告)日：2010-10-12
申请号：US11847943
申请日：2007-08-30
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01N21/41
CPC分类号： G01N21/636 , G01N21/41 , G02B21/16 , G02B2207/114
摘要： The present invention provides a microscopy method and a microscope, which enable microscopic observation of desired information of a specimen with an extremely high S/N ratio in a short period of time without increasing intensity of a light sources. The method of the invention is characterized in that it comprises: a simultaneous irradiation step of irradiating a specimen with first and second electromagnetic rays having different wave length with the rays overlapping at least partly each other; and a simultaneous irradiation visualization step of visualizing a spatial distribution of a refractive index variation caused by the irradiation of the first electromagnetic ray as a phase contrast image of the second electromagnetic ray having passed through the specimen in the region of the specimen to which the overlapped the first and the second electromagnetic rays are irradiated.
摘要翻译：本发明提供一种显微镜方法和显微镜，其能够在不增加光源强度的情况下，在短时间内以极高的S / N比显微观察样品的期望信息。本发明的方法的特征在于：其包括：同时照射步骤，用至少部分地彼此重叠的射线照射具有不同波长的第一和第二电磁射线的样本; 以及同时照射可视化步骤，将由第一电磁射线的照射引起的折射率变化的空间分布可视化为通过样本的第二电磁线的相对对比度图像照射第一和第二电磁射线。

30. 发明授权

US07304315B2 Three dimensional analyzing device 有权
标题翻译：三维分析装置
公开(公告)号：US07304315B2
公开(公告)日：2007-12-04
申请号：US11404248
申请日：2006-04-13
申请人： Yoshinori Iketaki , Masaaki Fujii , Takeshi Watanabe , Takashige Omatsu , Kimihisa Yamamoto , Toshio Suzuki
发明人： Yoshinori Iketaki , Masaaki Fujii , Takeshi Watanabe , Takashige Omatsu , Kimihisa Yamamoto , Toshio Suzuki
IPC分类号： G01N21/64 , G01J3/00
CPC分类号： G01N21/6458 , G01N21/645 , G01N2021/6419
摘要： A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region in a specimen, and a photo acceptance element for accepting a response light emitted from the photoactive region. Preferably, the device further includes an operation unit for calculating a correlation function of a response light in the time domain based on the output of the photo acceptance element to analyze a desired physical value of the specimen.
摘要翻译：三维分析装置包括用于产生第一光束的第一光束源，用于产生第二光束的第二光束源，至少部分地将第一和第二光束空间重叠的光学系统，并将光束照射到样品上至三视觉上将光活性区域限制在样本中，以及用于接受从光活性区域发射的响应光的光接收元件。优选地，所述装置还包括操作单元，用于基于所述光接收元件的输出来计算所述时域中的响应光的相关函数，以分析所述样本的期望物理值。

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