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    • 23. 发明授权
    • Methods and tools for controlling the removal of material from microfeature workpieces
    • 用于控制从微型工件移除材料的方法和工具
    • US07527545B2
    • 2009-05-05
    • US11511689
    • 2006-08-28
    • Nagasubramaniyan ChandrasekaranRajshree KothariGundu M. SabdeJames J. Hofmann
    • Nagasubramaniyan ChandrasekaranRajshree KothariGundu M. SabdeJames J. Hofmann
    • B24B7/22B24B49/12
    • B24B37/013B24B49/12H01L22/26
    • Methods and apparatus for controlling the removal of material from microfeature workpieces in abrasive removal processes. An embodiment of such a method comprises irradiating a periodic structure of the workpiece and obtaining an intensity distribution of radiation returning from the periodic structure. The workpiece can be irradiated with a wide spectrum of wavelengths (e.g., white light), or the workpiece can be irradiated with a laser or lamp at specific wavelengths. The intensity distribution can be an image or other signal from which a dimension or other physical parameter of the periodic structure can be determined. For example, the intensity distribution can be an intensity signal of radiation returning from the workpiece in a selected bandwidth (e.g., 200 nm-900 nm) or an image of a diffraction pattern of radiation that has been scattered by the periodic structure. The method further includes outputting a control signal based on the obtained intensity distribution. For example, the control signal can be an endpoint signal indicating the actual endpoint of the abrasive removal process.
    • 用于控制在磨料去除过程中从微特征工件中去除材料的方法和装置。 这种方法的实施例包括照射工件的周期性结构并获得从周期性结构返回的辐射的强度分布。 可以用宽的波长范围(例如,白光)照射工件,或者可以用特定波长的激光或灯照射工件。 强度分布可以是可以确定周期性结构的尺寸或其他物理参数的图像或其他信号。 例如,强度分布可以是在所选择的带宽(例如,200nm-900nm)中从工件返回的辐射的强度信号或由周期性结构散射的辐射的衍射图案的图像。 该方法还包括基于获得的强度分布输出控制信号。 例如,控制信号可以是指示磨料去除过程的实际终点的端点信号。
    • 27. 发明授权
    • Method of anodically bonding elements for flat panel displays
    • 用于平板显示器的阳极结合元件的方法
    • US06554671B1
    • 2003-04-29
    • US09631003
    • 2000-08-02
    • James J. HofmannJason B. Elledge
    • James J. HofmannJason B. Elledge
    • H01J924
    • H01J9/185H01J9/242H01J31/127
    • A process is disclosed for anodically bonding an array of spacer columns to one of the inner major faces on one of the generally planar plates of an evacuated, flat-panel video display. The process includes the steps of: providing a generally planar plate having a plurality of spacer column attachment sites; providing electrical interconnection between all attachment sites; coating each attachment site with a patch of oxidizable material; providing an array of unattached permanent glass spacer columns, each unattached permanent spacer column being of uniform length and being positioned longitudinally perpendicular to a single plane, with the plane intersecting the midpoint of each unattached spacer column; positioning the array such that an end of one permanent spacer column is in contact with the oxidizable material patch at each attachment site; and anodically bonding the contacting end of each permanent spacer column to the oxidizable material layer. The invention also includes an evacuated flat panel display having spacer structures which are anodically bonded to an internal major face of the display, as well as a face plate assembly manufactured by the aforestated process.
    • 公开了一种用于将隔离柱阵列阳极结合到抽空的平板显示器的一个平面板上的内主表面之一的工艺。 该方法包括以下步骤:提供具有多个间隔柱附着位点的大致平面的板; 提供所有附件位置之间的电气互连; 用一块可氧化材料涂覆每个附着部位; 提供一组未连接的永久性玻璃间隔柱,每个未连接的永久间隔柱具有均匀的长度并且纵向垂直于单个平面定位,该平面与每个未连接的间隔柱的中点相交; 定位阵列使得一个永久间隔柱的末端在每个附着位置与可氧化材料贴片接触; 并将每个永久间隔柱的接触端阳极结合到可氧化材料层上。 本发明还包括具有阳极结合到显示器的内部主面的间隔结构的抽真空平板显示器以及通过前述方法制造的面板组件。
    • 28. 发明申请
    • METHODS AND TOOLS FOR CONTROLLING THE REMOVAL OF MATERIAL FROM MICROFEATURE WORKPIECES
    • 用于控制从微生物工件中去除材料的方法和工具
    • US20090181601A1
    • 2009-07-16
    • US12410984
    • 2009-03-25
    • Nagasubramaniyan ChandrasekaranRajshree KothariGundu M. SabdeJames J. Hofmann
    • Nagasubramaniyan ChandrasekaranRajshree KothariGundu M. SabdeJames J. Hofmann
    • B24B49/04B24B49/12
    • B24B37/013B24B49/12H01L22/26
    • Methods and apparatus for controlling the removal of material from microfeature workpieces in abrasive removal processes. An embodiment of such a method comprises irradiating a periodic structure of the workpiece and obtaining an intensity distribution of radiation returning from the periodic structure. The workpiece can be irradiated with a wide spectrum of wavelengths (e.g., white light), or the workpiece can be irradiated with a laser or lamp at specific wavelengths. The intensity distribution can be an image or other signal from which a dimension or other physical parameter of the periodic structure can be determined. For example, the intensity distribution can be an intensity signal of radiation returning from the workpiece in a selected bandwidth (e.g., 200 nm-900 nm) or an image of a diffraction pattern of radiation that has been scattered by the periodic structure. The method further includes outputting a control signal based on the obtained intensity distribution. For example, the control signal can be an endpoint signal indicating the actual endpoint of the abrasive removal process.
    • 用于控制在磨料去除过程中从微特征工件中去除材料的方法和装置。 这种方法的实施例包括照射工件的周期性结构并获得从周期性结构返回的辐射的强度分布。 可以用宽的波长范围(例如,白光)照射工件,或者可以用特定波长的激光或灯照射工件。 强度分布可以是可以确定周期性结构的尺寸或其他物理参数的图像或其他信号。 例如,强度分布可以是在所选择的带宽(例如,200nm-900nm)中从工件返回的辐射的强度信号或由周期性结构散射的辐射的衍射图案的图像。 该方法还包括基于获得的强度分布输出控制信号。 例如,控制信号可以是指示磨料去除过程的实际终点的端点信号。