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    • 22. 发明授权
    • Charged particle guide apparatus and image viewing apparatus for charged
particle microscope using the same
    • 带电粒子引导装置和使用其的带电粒子显微镜的图像观察装置
    • US5811805A
    • 1998-09-22
    • US702183
    • 1996-08-23
    • Nobuyuki OsakabeJunji EndoTetsuji KodamaTsuneyuki UrakamiHiroshi TsuchiyaShinji Ohsuka
    • Nobuyuki OsakabeJunji EndoTetsuji KodamaTsuneyuki UrakamiHiroshi TsuchiyaShinji Ohsuka
    • H01J37/22H01J37/244H01J37/26
    • H01J37/22H01J37/244
    • An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate. The apparatus includes a charged particle source for emitting charged particles, an illuminating electron lens system for illuminating a specimen with a beam of the charged particles, an image magnifying/projecting lens system for magnifying an image of the specimen formed by charged particles scattered upon transmission through the specimen and projecting the magnified image onto an image forming plane, at least one charged particle extracting means provided on the image forming plane of the image magnifying/projecting lens system for taking out the charged particles from a predetermined portion of the charged particle beam projected onto the image forming plane, at least one charged particle detector for detecting the charged particles taken out through the charged particle extracting means, and a signal processing means for processing a signal outputted from the charged particle detector.
    • 即使当结构以高速率变化时,也可以测量试样的原子结构,磁性结构,电结构等的移动速度或振动频率的电子显微镜图像观察装置。 该装置包括用于发射带电粒子的带电粒子源,用于用带电粒子束照射样本的照明电子透镜系统,用于放大由透射时散射的带电粒子形成的样本的图像的图像放大/投影透镜系统 通过样本并将放大图像投影到图像形成平面上,至少一个带电粒子提取装置,设置在图像放大/投影透镜系统的图像形成平面上,用于从带电粒子束的预定部分中取出带电粒子 投影到图像形成平面上的至少一个带电粒子检测器,用于检测通过带电粒子提取装置取出的带电粒子;以及信号处理装置,用于处理从带电粒子检测器输出的信号。
    • 24. 发明授权
    • Apparatus for affecting time-space conversion on a light signal changing
at ultra-high speed
    • 用于在超高速变化的光信号上影响时空转换的装置
    • US5353149A
    • 1994-10-04
    • US121899
    • 1993-09-16
    • Tsuneyuki UrakamiTeruo Hiruma
    • Tsuneyuki UrakamiTeruo Hiruma
    • G01J11/00G02F1/35H03M9/00
    • H03M9/00G01J11/00G02F1/3534
    • An optical converter is so arranged that light to be measured and probe light are made to interact with each other on a nonlinear element and that mixed light produced by the interaction is detected, which is characterized in that an energy amount of interacting signal light is kept as high as possible without spatial expansion of signal light, which could lower the SN ratio. For this, the time-space conversion function is achieved by a method for producing the probe light. Namely, the optical converter comprises (a) a nonlinear element for making two types of light interact with each other to cause the nonlinear optical effect, (b) a device for guiding light to be measured to the nonlinear element, and (c) a device for producing probe light crossing the light to be measured on the nonlinear element and changing a traveling direction of probe light with change of crossing time. A light waveform measuring apparatus or an optical serial-parallel converter may be attained by adding to the optical converter (d) a device for detecting mixed light produced by the interaction between the signal light and the probe light on the nonlinear element.
    • 光学转换器被布置成使被测光和探测光在非线性元件上彼此相互作用,并且检测由相互作用产生的混合光,其特征在于保持相互作用的信号光的能量 尽可能高的信号光空间扩大,这可能降低SN比。 为此,通过用于产生探测光的方法来实现时空转换功能。 也就是说,光转换器包括(a)用于使两种类型的光彼此相互作用以产生非线性光学效应的非线性元件,(b)用于将待测光的装置引导到非线性元件,以及(c) 用于产生在非线性元件上穿过待测光的探针光的装置,并且随着交叉时间的变化改变探测光的行进方向。 通过向光转换器(d)添加用于检测由非线性元件上的信号光和探测光之间的相互作用产生的混合光的装置,可以获得光波形测量装置或光并行转换器。
    • 25. 发明授权
    • Optical waveform measuring device
    • 光学波形测量装置
    • US5168164A
    • 1992-12-01
    • US858861
    • 1992-03-27
    • Tsuneyuki UrakamiMotohiro Suyama
    • Tsuneyuki UrakamiMotohiro Suyama
    • G01J11/00
    • G01J11/00
    • When sampling light and light to be measured each having a wavelength longer than an upper wavelength limit of the sensitivity of a photocathode are incident on the photocathode of a multiphoton absorption-type electron tube, light-light sampling is enabled by two-photon absorption and one-photoelectron emission. A delaying unit adjusts an incident timing of the sampling light from an optical pulse generating unit on the elctron tube in synchronism with an incident timing of the light to be measured on the electron tube. A half mirror causes the sampling light and the light to be measured to coincide on the photocathode of the electron tube. A controlling unit controls the delaying unit to sequentially shift the incident timing of the sampling light on the electron tube. Thus, the operation of a display unit can be controlled in synchronism with the incident timing of the sampling light so that a series of sampling outputs from the electron tube can be converted to the optical waveform of the light to be measured and displayed on the display unit.