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    • 22. 发明授权
    • Capacitor structure and method of manufacturing the same
    • 电容器结构及其制造方法
    • US07778008B2
    • 2010-08-17
    • US11983991
    • 2007-11-13
    • Keun-Bong LeeJung-Hyeon Kim
    • Keun-Bong LeeJung-Hyeon Kim
    • H01G4/005H01G4/06
    • H01G4/005H01G4/012H01G4/30Y10T29/435
    • In a capacitor structure and a method of manufacturing the capacitor structure, first and second conductive patterns are formed on a substrate. The first and second conductive patterns extend in a first direction. The first and second conductive patterns are alternately arranged to be spaced apart from one another in a second direction substantially perpendicular to the first direction. An insulating interlayer is formed on the substrate to cover the first and second conductive patterns. Third and fourth conductive patterns extending in a third direction lying at an angle of between about 0° and about 90° relative to the first direction are formed on the insulating interlayer. The third and fourth conductive patterns are alternately arranged to be spaced apart from one another in a fourth direction substantially perpendicular to the third direction.
    • 在电容器结构和制造电容器结构的方法中,在基板上形成第一和第二导电图案。 第一和第二导电图案沿第一方向延伸。 第一和第二导电图案交替地布置成在基本上垂直于第一方向的第二方向上彼此间隔开。 在衬底上形成绝缘中间层以覆盖第一和第二导电图案。 在绝缘中间层上形成有相对于第一方向以约0°至约90°之间的角度在第三方向延伸的第三和第四导电图案。 第三和第四导电图案交替地布置成在基本上垂直于第三方向的第四方向上彼此间隔开。
    • 23. 发明授权
    • Burn-in board connection device and method
    • 老化板连接装置及方法
    • US07656180B2
    • 2010-02-02
    • US11937342
    • 2007-11-08
    • Jae-Nam LeeJung-Hyeon KimJu-II KangJin-Woo Yang
    • Jae-Nam LeeJung-Hyeon KimJu-II KangJin-Woo Yang
    • G01R31/02
    • G01R31/2817G01R31/2863
    • A burn-in board connection device includes a first connection unit to hold a burn-in board and move in a first direction perpendicular to the burn-in board that is inserted in a chamber of a burn-in test device, a second connection unit to move in a second direction parallel to the burn-in board to attach/detach the burn-in board that is held by the first connection unit to/from a connector disposed in the chamber. A burn-in board connection method includes coupling a finger to the burn-in board by moving the finger in a first direction, attaching the burn-in board to a connector by moving the finger in a second direction, and driving the finger by converting a rotation of a servo motor into a linear movement of the finger.
    • 老化板连接装置包括:第一连接单元,用于保持老化板并且沿垂直于插入老化测试装置的室中的老化板的第一方向移动;第二连接单元 沿平行于老化板的第二方向移动以将由第一连接单元保持的老化板与设置在腔室中的连接器相连接/分离。 老化板连接方法包括通过沿第一方向移动手指将手指连接到老化板,通过沿第二方向移动手指将老化板附接到连接器,并且通过转换来驱动手指 伺服电动机旋转到手指的线性运动。
    • 25. 发明申请
    • Multilayer type test board assembly for high-precision inspection
    • 多层型测试板组件进行高精度检测
    • US20080164901A1
    • 2008-07-10
    • US12006543
    • 2008-01-03
    • Min-Gu KimYoung-Soo AnHo-Jeong ChoiJung-Hyeon Kim
    • Min-Gu KimYoung-Soo AnHo-Jeong ChoiJung-Hyeon Kim
    • G01R1/02
    • G01R31/2851G01R1/04H05K1/144H05K1/148H05K2201/042H05K2201/09972H05K2201/10371
    • There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and including at least one test board each having a first section where first mounting devices sensitive to an influence of electrical signals are mounted and a second section where second mounting devices insensitive to an influence of electrical signals are mounted; spacers that arrange the test boards in parallel by spacing apart the test boards by predetermined intervals; connection cables connected to the input/output signal terminals of the test boards; and a signal shielding fence formed on each of the at least one test board so as to protect the first mounting devices from electrical signals generated by the second mounting devices.
    • 提供了一种用于高精度检测的多层型测试板组件。 多层测试板组件包括:根据功能彼此分离的多个测试板,具有输入/输出信号端子,并且包括至少一个测试板,每个测试板具有第一部分,其中第一安装器件对电气的影响敏感 信号被安装,并且第二部分安装对电信号的影响不敏感的第二安装装置; 间隔件通过以预定的间隔隔开测试板来平行布置测试板; 连接电缆连接到测试板的输入/输出信号端子; 以及形成在所述至少一个测试板中的每一个上的信号屏蔽栅栏,以便保护所述第一安装装置免受由所述第二安装装置产生的电信号。
    • 26. 发明申请
    • Capacitor structure
    • 电容结构
    • US20080123245A1
    • 2008-05-29
    • US11998132
    • 2007-11-28
    • Keun-Bong LeeJung-Hyeon Kim
    • Keun-Bong LeeJung-Hyeon Kim
    • H01G4/012
    • H01G4/012H01G4/005H01G4/236H01G4/30
    • A capacitor structure includes an insulating layer, first conductive patterns, second conductive patterns, an insulating interlayer, third conductive patterns, and fourth conductive patterns. The first and second conductive patterns are alternately arranged on the insulating layer to be spaced apart from one another. The first and second conductive patterns have side faces where concave portions and convex portions are formed. The insulating interlayer is formed on the insulating layer to cover the first and second conductive patterns. The third and fourth conductive patterns are alternately arranged on the insulating interlayer to be spaced apart from one another. The third and fourth conductive patterns have side faces where concave portions and convex portions are formed.
    • 电容器结构包括绝缘层,第一导电图案,第二导电图案,绝缘夹层,第三导电图案和第四导电图案。 第一和第二导电图案交替地布置在绝缘层上以彼此间隔开。 第一和第二导电图案具有形成凹部和凸部的侧面。 在绝缘层上形成绝缘中间层以覆盖第一和第二导电图案。 第三和第四导电图案交替地布置在绝缘中间层上以彼此间隔开。 第三和第四导电图案具有形成凹部和凸部的侧面。
    • 30. 发明申请
    • Antifuse circuit of inverter type and method of programming the same
    • 逆变器类型的防腐电路及其编程方法
    • US20100127731A1
    • 2010-05-27
    • US12585276
    • 2009-09-10
    • Jae-Yong SeoGu-Gwan KangTae-Hun KangHong-Sik ParkJung-Hyeon Kim
    • Jae-Yong SeoGu-Gwan KangTae-Hun KangHong-Sik ParkJung-Hyeon Kim
    • H03K19/173H01H37/76
    • H03K19/173G11C17/18H01L23/5252H01L2924/0002H01L2924/00
    • Example embodiments are directed to an antifuse circuit of an inverter type and a method of programming the same. The antifuse circuit has improved corrosion resistance, utilizes lesser chip area and can be programmed at a low voltage. The antifuse circuit includes a PMOS transistor with the gate coupled to a drive power voltage terminal and the source coupled to an anti-pad terminal. During programming the PMOS transistor is off and the source receives an alternating current. Programming the antifuse circuit involves trapping a plurality of electron in an STI region as a result of gate-induced drain leakage. The antifuse circuit also includes an NMOS transistor with the drain connected to the drain of the PMOS transistor, the source connected to ground and the gate connected to a program control signal. The antifuse circuit results in reliable fuse programming at a low voltage by using the PMOS transistor as an anti-fuse device.
    • 示例性实施例涉及逆变器类型的反熔丝电路及其编程方法。 反熔丝电路具有改善的耐腐蚀性,使用较小的芯片面积,并且可以在低电压下编程。 反熔丝电路包括PMOS晶体管,其栅极耦合到驱动电源电压端子,并且源极耦合到反焊盘端子。 在编程期间,PMOS晶体管截止,源极接收交流电流。 对反熔丝电路的编程涉及在栅极引起的漏极泄漏的情况下在STI区域中捕获多个电子。 反熔丝电路还包括NMOS晶体管,漏极连接到PMOS晶体管的漏极,源极连接到地,栅极连接到编程控制信号。 反熔丝电路通过使用PMOS晶体管作为反熔丝器件,在低电压下实现可靠​​的熔丝编程。