会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 21. 发明授权
    • Functional pattern logic diagnostic method
    • 功能模式逻辑诊断方法
    • US07017095B2
    • 2006-03-21
    • US10064398
    • 2002-07-10
    • Donato ForlenzaFranco MotikaPhillip J. Nigh
    • Donato ForlenzaFranco MotikaPhillip J. Nigh
    • G01R31/28G06F11/00
    • G01R31/318586G01R31/318544
    • A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on the functional failure by determining the location of and type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.
    • 通过组合确定性和功能测试,通过确定故障电路中的错误的位置和类型,基于功能故障来创建新的测试模式来诊断半导体器件功能测试故障的方法。 这是通过在功能测试期间识别故障向量来实现的,通过在故障向量之前从LSSD扫描链中卸载锁存器的值来观察故障设备的状态,从锁存器的未加载状态生成LOAD,应用 生成LOAD作为新创建的独立LSSD确定性模式的第一个事件,将产生故障的主输入和时钟应用于正确操作的设备,卸载正确操作设备的输出以生成确定性LSSD模式; 以及将生成的确定性LSSD模式应用于故障设备,以使用现有的LSSD确定性工具来诊断故障。
    • 24. 发明申请
    • System, method and program product for control of a presentation
    • 用于控制演示的系统,方法和程序产品
    • US20050183022A1
    • 2005-08-18
    • US10777961
    • 2004-02-12
    • Edward KelleyFranco MotikaTijs Wilbrink
    • Edward KelleyFranco MotikaTijs Wilbrink
    • G06F3/00G06F17/24
    • G06F17/241
    • A system, method and program product for making a presentation of screens to one or more invitees. A preliminary sequence of screens is defined to a computer. Before presenting one of the screens in the sequence to the one or more invitees, the computer presents to a presenter the one screen. Subsequently, the presenter decides whether to present the one screen to the one or more invitees and conveys the decision about the one screen to the computer. If the presenter decides to present the one screen to the one or more invitees, then the computer sends the one screen to a display device for each of the one or more invitees. If the presenter decides not to present the one screen to the one or more invitees, then the computer does not send the one screen to the display devices for the one or more invitees whereby the one or more invitees will not see the one screen. The one screen is presented to the presenter on a computer local to the presenter, one of the display devices is a projector local and coupled to the presenter's computer and another of the display devices is a computer remote from but coupled to the local computer. The foregoing process is then repeated for the next screen in the sequence.
    • 一种用于向一个或多个被邀请者呈现屏幕的系统,方法和程序产品。 屏幕的初步序列被定义到计算机。 在将序列中的一个屏幕呈现给一个或多个被邀请者之前,计算机向演示者呈现一个屏幕。 随后,演示者决定是否向一个或多个受邀者呈现一个屏幕,并将关于一个屏幕的决定传达给计算机。 如果演示者决定将一个屏幕呈现给一个或多个受邀者,则计算机将一个屏幕发送到一个或多个受邀者中的每一个的显示设备。 如果演示者决定不向一个或多个受邀者呈现一个屏幕,则计算机不会向一个或多个受邀者的显示设备发送一个屏幕,从而一个或多个受邀者将不会看到一个屏幕。 一个屏幕在呈现者本地的计算机上呈现给演示者,其中一个显示设备是本地的投影仪并且耦合到演示者的计算机,而另一个显示设备是远离但耦合到本地计算机的计算机。 然后对序列中的下一个屏幕重复上述过程。
    • 27. 发明授权
    • Built-in dynamic stress for integrated circuits
    • 内置动态应力集成电路
    • US5982189A
    • 1999-11-09
    • US856414
    • 1997-05-14
    • Franco MotikaPhil NighJohn Shushereba
    • Franco MotikaPhil NighJohn Shushereba
    • G01R31/30G01R27/26
    • G01R31/30
    • A built-in stress circuit for an integrated circuit that has a frequency generator, at least one self-test circuit, a temperature regulator and a controller is disclosed. The frequency generator receives a reference clock and an adjusted temperature frequency from the temperature regulator and outputs the test frequencies needed for the self-test circuits. The self-test circuits, which are coupled to the frequency generator, receive the test frequencies and dissipate power as the self-test circuits are being used. The temperature regulator, which is coupled to the self-test circuits and the frequency generator, senses the power dissipated (i.e., the temperature), adjusts a temperature frequency corresponding to the temperature desired, and outputs the adjusted temperature frequency. The controller, which is coupled to the frequency generator, the self-test circuits, and the temperature regulator, provides the control data necessary for testing both electrical and thermal stress conditions.
    • 公开了一种用于具有频率发生器,至少一个自检电路,温度调节器和控制器的集成电路的内置应力电路。 频率发生器从温度调节器接收参考时钟和调整的温度频率,并输出自检电路所需的测试频率。 耦合到频率发生器的自测电路在使用自检电路时接收测试频率并耗散功率。 耦合到自检电路和频率发生器的温度调节器感测功率消耗(即,温度),调节对应于期望温度的温度频率,并输出调节的温度频率。 耦合到频率发生器,自检电路和温度调节器的控制器提供测试电和热应力条件所需的控制数据。