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21. 发明授权

US07046368B2 Position measuring arrangement 有权
标题翻译：位置测量装置
公开(公告)号：US07046368B2
公开(公告)日：2006-05-16
申请号：US10632536
申请日：2003-08-01
申请人： Wolfgang Holzapfel , Udo Linnemann
发明人： Wolfgang Holzapfel , Udo Linnemann
IPC分类号： G01B9/02 , G01B11/14
CPC分类号： G01D5/268 , G01B2290/30 , G01B2290/45 , G01B2290/70 , G01D5/26 , G01D5/266 , G01D5/34723 , G01D5/38
摘要： A position measuring arrangement for determining a relative position between a first object and a second object. The arrangement includes a light source having a single-mode laser light source that generates radiation and a signal generator that receives the radiation and generates displacement-dependent output signals that determine a relative position between a first object and a second object. A feedback device, wherein the laser light source interacts with the feedback device in such a way that an excitation of several modes takes place in the single-mode laser light source, and a multi-mode operation of the single-mode laser light source results.
摘要翻译：一种用于确定第一物体和第二物体之间的相对位置的位置测量装置。该装置包括具有产生辐射的单模激光光源的光源和接收辐射的信号发生器，并产生确定第一物体和第二物体之间的相对位置的与位移有关的输出信号。一种反馈装置，其中激光光源与反馈装置相互作用，使得在单模激光光源中发生若干模式的激发，并且单模激光光源的多模式操作结果。

22. 发明授权

US06541761B1 Optical position measuring system with a graduation that causes essentially only first orders of diffraction 有权
$Optical position measuring system with a graduation that causes essentially only first orders of diffraction$
标题翻译：光学位置测量系统具有基本上只引入第一级衍射的刻度
公开(公告)号：US06541761B1
公开(公告)日：2003-04-01
申请号：US09652220
申请日：2000-08-30
申请人： Wolfgang Holzapfel , Walter Huber
发明人： Wolfgang Holzapfel , Walter Huber
IPC分类号： G01D534
CPC分类号： G01D5/38
摘要： An optical position measuring system that includes a light source, a measuring graduation, a scanning unit movable relative to the measuring graduation in at least one measurement direction. A projection graduation has periodic amplitude and phase structures disposed in alternation in the measurement direction. The arrangement further includes a detection graduation and a plurality of optoelectronic detector elements, wherein light from the light source interacts with the projection graduation so as to project a fringe pattern onto the detection graduation, so that via the plurality of optoelectronic detector elements, displacement-dependent output signals are detectable, and wherein the projection graduation has a structure such that in addition to even orders of diffraction and the zero order of diffraction, at least some of the (2n+1)th orders of diffraction are suppressed, where n=1, 2, 3, . . . , as a result of which essentially only the ±1st orders of diffraction contribute to generating the output signals.
摘要翻译：一种光学位置测量系统，包括光源，测量刻度，在至少一个测量方向上相对于测量刻度移动的扫描单元。投影刻度具有在测量方向上交替设置的周期性幅度和相位结构。该布置还包括检测刻度和多个光电检测器元件，其中来自光源的光与投影刻度相互作用以将条纹图案投影到检测刻度上，使得经由多个光电检测器元件，依赖输出信号是可检测的，并且其中投影刻度具有这样的结构，使得除了衍射的偶数阶和衍射的零级之外，抑制衍射的第（2n + 1）阶中的至少一些，其中n = 1，2，3，。。。，其结果基本上只有±1级的衍射有助于产生输出信号。

23. 发明授权

US06526190B2 Position measuring system 失效
公开(公告)号：US06526190B2
公开(公告)日：2003-02-25
申请号：US09993944
申请日：2001-11-14
申请人： Wolfgang Holzapfel , Siegfried Reichhuber
发明人： Wolfgang Holzapfel , Siegfried Reichhuber
IPC分类号： G02B600
CPC分类号： G02B6/34 , G01D5/34715 , G02B2006/12107
摘要： A position measuring system that includes a graduation support having a measuring graduation, a planar waveguide and a light source that generates light that is conducted to the measuring graduation, wherein the light is reflected at surfaces of the planar waveguide. A scanning unit for scanning the measuring graduation that includes a light-sensitive scanning area to which light modulated by the measuring graduation is conducted. The modulated light conducted to the light-sensitive scanning area has at least two different light portions, which differ in a number of reflections at the surfaces of the planar waveguide, and wherein the reflecting of the at least two different light portions occurs prior to reaching the measuring graduation.

24. 发明授权

US06470577B1 Angle measuring system and use of this angle measuring system in a spindle arrangement 失效
标题翻译：角度测量系统和这种角度测量系统在主轴布置中的应用
公开(公告)号：US06470577B1
公开(公告)日：2002-10-29
申请号：US09666742
申请日：2000-09-20
申请人： Sebastian Tondorf , Wolfgang Holzapfel
发明人： Sebastian Tondorf , Wolfgang Holzapfel
IPC分类号： G01B1126
CPC分类号： B23Q17/2457 , B23Q1/5406 , G01D5/34715 , G01D5/36 , Y10S33/03
摘要： An angle measuring device having a graduation carrier, a scanning plate, a detector arrangement on a stationary element for measuring a rotational position of the graduation carrier with respect to the scanning plate around a first axis of rotation, wherein the scanning plate with the graduation carrier is rotatable with respect to the detector arrangement around a second axis of rotation; and the first and second axes of rotation extend parallel with respect to each other and are radially distanced from each other.
摘要翻译：一种角度测量装置，具有刻度载体，扫描板，在静止元件上的检测器装置，用于测量分度载体相对于围绕第一旋转轴线的扫描板的旋转位置，其中扫描板具有刻度载体可围绕第二旋转轴线相对于检测器装置旋转; 并且第一和第二旋转轴线相对于彼此平行延伸并且彼此径向间隔开。

25. 发明授权

US5994692A Photo-electric position measuring system having a scanning grating with transverse graduations 失效
标题翻译：光电位置测量系统具有横向刻度的扫描光栅
公开(公告)号：US5994692A
公开(公告)日：1999-11-30
申请号：US107641
申请日：1998-06-30
申请人： Wolfgang Holzapfel
发明人： Wolfgang Holzapfel
IPC分类号： G01B11/00 , G01D5/38 , G02B26/10 , G02B27/44
CPC分类号： G02B27/4255 , G01D5/38 , G02B26/106 , G02B27/4277
摘要： A scanning grating is provided in a photo-electric position measuring system and the scanning grating includes several grating areas. Each one of these grating areas has a transverse grating with a graduation period. The transverse gratings of the grating areas are disposed offset by TT/4 perpendicularly to the measuring direction, i.e., in the Y direction, with respect to each other. The partial light beams diffracted at the scanning grating in the +1st and -1st order lead to an intensity modulation at a defined scanning distance Z1. An amplitude grating is provided at the location of this intensity modulation, so that by means of downstream disposed photo-detectors a scanning signal is generated by the +1st diffraction order and a scanning signal, which is phase-shifted by 180.degree. with respect to the first, is generated by the -1st diffraction order.
摘要翻译：扫描光栅设置在光电位置测量系统中，扫描光栅包括若干光栅区域。这些光栅区域中的每一个具有具有刻度周期的横向光栅。光栅区域的横向光栅相对于彼此垂直于测量方向即Y方向偏移TT / 4。以+ 1和-1级在扫描光栅处衍射的部分光束在定义的扫描距离Z1处导致强度调制。在该强度调制的位置设置幅度光栅，通过下游配置的光电检测器，通过+ 1衍射级产生扫描信号，扫描信号相对于第一个是由第一个衍射级产生的。

26. 发明授权

US5874729A Device for filtering odd-numbered harmonic signal components 失效
标题翻译：用于滤除奇数个谐波信号分量的装置
公开(公告)号：US5874729A
公开(公告)日：1999-02-23
申请号：US893935
申请日：1997-07-15
申请人： Wolfgang Holzapfel
发明人： Wolfgang Holzapfel
IPC分类号： G01B11/00 , G01D5/36 , G01D5/38 , G01D5/34
CPC分类号： G01D5/366
摘要： A device that is suitable for filtering odd-numbered harmonic signal components out of a periodic signal which is generated from the scanning of a periodic scale graduation using the scanning plate. The scanning plate includes a periodic sequence of individual filter elements in the measuring direction for the resulting periodicity P of the filter elements, the condition P=N.cndot.d.sub.A applies, and N is an odd-numbered integer greater than 1, and d.sub.A is a period of a scanning graduation of a scanning plate without filtering action. In the filter elements, there is a symmetrical arrangement of structural elements such that inside each filter element two complementary halves of structural elements are each provided.
摘要翻译：适用于从使用扫描板的周期性刻度的扫描产生的周期信号中过滤奇数个谐波信号分量的装置。扫描板包括滤波器元件的周期性P的测量方向上的各个滤波器元件的周期性序列，应用条件P = N.dA，并且N是大于1的奇数整数，并且dA是没有过滤作用的扫描板的扫描刻度的周期。在过滤器元件中，存在结构元件的对称布置，使得在每个过滤元件内部均设有两个互补的结构元件的两半。

27. 发明授权

US5648658A Apparatus and method for generating position-dependent signals using a scanning plate having a plurality of differently configured scanning regions 失效
标题翻译：使用具有多个不同配置的扫描区域的扫描板产生位置相关信号的设备和方法
公开(公告)号：US5648658A
公开(公告)日：1997-07-15
申请号：US392594
申请日：1995-02-23
申请人： Wolfgang Holzapfel , Walter Huber
发明人： Wolfgang Holzapfel , Walter Huber
IPC分类号： G01B11/00 , G01C3/06 , G01D5/38 , G02B5/18 , H01J3/14 , G01B11/02 , H01J5/16
CPC分类号： G01D5/38 , G02B5/1871
摘要： In this apparatus, which serves preferably to generate reference pulses, graduations are provided on the scanner plate (A), whose graduation period varies steadily as a function of location (chirped grating). The various graduation markings (GS) are embodied in turn as periodic phase gratings, whose graduation scores extend parallel to the measurement direction (X).
摘要翻译：在优选地产生参考脉冲的该装置中，在扫描板（A）上设置刻度，其刻度周期作为位置（啁啾光栅）的函数而稳定地变化。各种刻度标记（GS）依次被体现为周期性相位光栅，其刻度分数平行于测量方向（X）延伸。

28. 发明授权

US5648431A Process for the utilization of plastics 失效
标题翻译：塑料利用过程
公开(公告)号：US5648431A
公开(公告)日：1997-07-15
申请号：US470158
申请日：1995-06-06
申请人： Michael Demuth , Wolfgang Holzapfel
发明人： Michael Demuth , Wolfgang Holzapfel
IPC分类号： C08G18/42 , C08J11/08 , C08J11/18 , C08L75/04
CPC分类号： C08J11/18 , C08G18/4277 , C08J11/08 , C08L75/04 , C08G2101/005 , C08G2101/0083 , C08J2375/04 , Y02W30/701 , Y02W30/706
摘要： A process for utilizing compact or porous plastics is described that comprise in part or totally polyurethane plastics, wherein the process is characterized by the fact that the plastics are prepared into a reaction mixture with a low hydroxyl number, which can be further processed in the conventional manner into new final products by swelling the plastics eithera) in suitable swelling agents and reducing in size into a free flowing gel; orb) dissolving and/or decomposing in suitable hydroxy polyols; andc) adjusting the hydroxyl number to the desired size;d) optionally transforming the reaction mixture comprising a), b) and c) into a polyurethane prepolymer,e) further processing the individual reaction mixtures a) to c) into a polyurethane product or into a plastic with the aid of other suitable hardener systems.
摘要翻译：描述了使用紧密或多孔塑料的方法，其部分或全部包含聚氨酯塑料，其中该方法的特征在于将塑料制备成具有低羟基数的反应混合物，其可以在常规方法中进一步加工通过使塑料膨胀或者a）在合适的溶胀剂中并将其尺寸减小到自由流动的凝胶中来进入新的最终产品; 或b）在合适的羟基多元醇中溶解和/或分解; 和c）将羟值调节至所需尺寸; d）任选地将包含a），b）和c）的反应混合物转化成聚氨酯预聚物，e）借助于其它合适的固化剂体系，将各个反应混合物a）至c）进一步加工成聚氨酯产物或塑料。

29. 发明授权

US5428445A Interferential position measuring device 失效
标题翻译：干涉位置测量装置
公开(公告)号：US5428445A
公开(公告)日：1995-06-27
申请号：US884793
申请日：1992-05-18
申请人： Wolfgang Holzapfel
发明人： Wolfgang Holzapfel
IPC分类号： G01B11/00 , G01D5/26 , G01D5/36 , G01D5/38 , H01J3/14 , G01B9/02
CPC分类号： G01D5/366 , G01D5/38
摘要： The invention relates to an interference device having a light source, detectors, and at least two diffraction elements with identical or only slightly different diffraction structures, wherein the parameters of the diffraction structures of the diffraction elements vary continuously as a function of location.
摘要翻译：本发明涉及具有光源，检测器以及具有相同或仅略微不同的衍射结构的至少两个衍射元件的干涉装置，其中衍射元件的衍射结构的参数作为位置的函数连续变化。

30. 发明授权

US5264915A Interferential measurement device for at least one direction of measurement 失效
标题翻译：用于至少一个测量方向的干涉测量装置
公开(公告)号：US5264915A
公开(公告)日：1993-11-23
申请号：US777746
申请日：1991-10-16
申请人： Walter Huber , Wolfgang Holzapfel , Hans R. Kober
发明人： Walter Huber , Wolfgang Holzapfel , Hans R. Kober
IPC分类号： G01B11/00 , G01D5/38 , G01B11/02
CPC分类号： G01D5/38
摘要： In an interferential measurement device for at least one direction of measurement for measuring the relative position of objects, the collimated light beam bundle emanating from a light source is split into three diffraction beams in the at least one direction of measurement at a scanning grid. These three diffraction beams are divided into eight diffraction beams at a cross grid of a material measure and in turn come to interference at a scanning grid under renewed diffraction. The resultant diffraction beams fall on detectors for the generation of measured positional values for the at least one direction of measurement. The cross grid of the scale extends diagonally to the at least one direction of measurement and has an effective grid constant de in the direction of measurement, which agrees with the grid constant d of the scanning grid. The detectors are disposed in such a way that only diffraction beams are detected, which were deflected by the cross grid in the X direction of measurement and in the Y direction extending vertically thereto.
摘要翻译：在用于测量物体的相对位置的至少一个测量方向的干涉测量装置中，从光源发出的准直光束束在扫描网格的至少一个测量方向上分为三个衍射光束。这三个衍射光束在材料测量的交叉网格处被划分为八个衍射光束，并且在新的衍射下在扫描网格上被干扰。所得的衍射光束落在检测器上，用于产生用于至少一个测量方向的测量位置值。标尺的交叉网格对角地延伸到至少一个测量方向，并且在测量方向上具有与扫描网格的网格常数d一致的有效网格常数。检测器的设置方式是仅在X测量方向和垂直方向延伸的Y方向上仅检测由十字网偏转的衍射光束。

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