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    • 23. 发明授权
    • Polishing estimation/evaluation device, overpolishing condition calculation device, and computer-readable non-transitory medium thereof
    • 抛光估算/评估装置,过度抛光条件计算装置及其计算机可读的非暂时介质
    • US08499259B2
    • 2013-07-30
    • US13019778
    • 2011-02-02
    • Daisuke Fukuda
    • Daisuke Fukuda
    • G06F17/50
    • G06F17/5068G06F2217/12Y02P90/265
    • A polishing estimation/evaluation device includes a dividing unit, an overpolished area extracting unit, and a dummy modifying unit. The dividing unit divides a layout of an integrated circuit into a plurality of partial areas. The overpolished area extracting unit refers to an overpolishing condition indicating whether overpolishing occurs in a vicinity of a partial area based on a wiring density in the partial area and a wiring density in surrounding areas of the partial area, and extracts a partial area where the overpolishing occurs from the plurality of partial areas obtained by the division by the dividing unit. The dummy modifying unit modifies dummy wiring in the partial area where the overpolishing occurs extracted by the overpolished area extracting unit and/or dummy wiring in surrounding areas of the partial area to reduce the number of partial areas where the overpolishing occurs.
    • 抛光估计/评估装置包括分割单元,过度抛光区域提取单元和虚拟修改单元。 分割单元将集成电路的布局划分为多个部分区域。 过度抛光区域提取单元是指基于部分区域中的布线密度和部分区域的周围区域的布线密度来指示是否在部分区域附近发生过度抛光的过度抛光条件,并且提取部分区域,其中过度抛光 从通过分割单元的分割获得的多个部分区域发生。 伪修改单元修改由过度抛光区域提取单元提取的过度抛光的局部区域中的虚拟布线和/或部分区域的周围区域中的虚拟布线,以减少发生过度抛光的局部区域的数量。
    • 24. 发明授权
    • Laminated ceramic capacitor
    • 层压陶瓷电容器
    • US08208240B2
    • 2012-06-26
    • US12670855
    • 2007-11-29
    • Youichi YamazakiHideyuki OsuzuYoshihiro FujiokaDaisuke Fukuda
    • Youichi YamazakiHideyuki OsuzuYoshihiro FujiokaDaisuke Fukuda
    • H01G4/12C04B35/468
    • H01G4/1227H01G4/30
    • A crystal constituting a dielectric porcelain, comprised of a first crystal group composed of crystal grains of 0.2 atomic % or less calcium concentration and a second crystal group composed of crystal grains of 0.4 atomic % or more calcium concentration, wherein the ratio of concentration of each of magnesium and a first rare earth element contained in a center portion to that contained in a surface layer portion of crystal grains constituting the first crystal group is greater than the corresponding concentration ratio of crystal grains constituting the second crystal group, and wherein on a polished surface resulting from polishing of the surface of the dielectric porcelain, when the area of crystal grains of the first crystal group is referred to as a and the area of crystal grains of the second crystal group referred to as b, the ratio of b/(a+b) is in the range of 0.5 to 0.8.
    • 构成电介质瓷的晶体,由由0.2质量%以下钙浓度的晶粒构成的第一晶体组和由钙浓度为0.4原子%以上的晶粒构成的第二晶体组成,其中, 的镁和包含在构成第一晶体组的晶粒的表层部分中的部分的中心部分的第一稀土元素大于构成第二晶体基团的晶粒的相应浓度比,并且其中在抛光 当第一晶体组的晶粒的面积被称为a,第二晶体组织的晶粒面积被称为b时,由电介质陶瓷的表面的抛光产生的表面,b /( a + b)在0.5〜0.8的范围内。
    • 29. 发明申请
    • ESTIMATION APPARATUS AND ESTIMATION METHOD
    • 估计装置和估计方法
    • US20100152875A1
    • 2010-06-17
    • US12632258
    • 2009-12-07
    • Daisuke Fukuda
    • Daisuke Fukuda
    • G06F17/50
    • B24B37/04B24B49/00
    • An estimation apparatus for estimating a formation of a plurality of wiring layers for an integrated circuit to be manufactured by laminating the wiring layers each formed through a deposition process of a wiring material on a substrate and subsequently polishing the deposited wiring material, the apparatus includes a deposition estimator, a polishing estimator, and an adjuster. The apparatus includes an optimizer configured to optimize distribution of the height of the wiring material for each of the wiring layers within an acceptable range by controlling the adjuster to generate various combinations of adjusted patterns of the wiring layers and by controlling the deposition estimator and the polishing estimator to perform estimation of distribution of deposition height of the wiring material and distribution of the wiring material to be remained after polishing for each of the wiring layers, respectively, for each of the combinations of the adjusted patterns.
    • 一种估计装置,用于通过将通过布线材料的沉积工艺形成的布线层层叠在衬底上并随后抛光沉积的布线材料来估计要制造的用于集成电路的多个布线层的形成,该装置包括: 沉积估计器,抛光估计器和调节器。 该装置包括优化器,该优化器被配置为通过控制调节器来产生布线层的调整图案的各种组合并且通过控制沉积估计器和抛光来优化每个布线层的布线材料的高度在可接受范围内的分布 估计器,用于分别对调整图案的每个组合执行布线材料的沉积高度的分布估计和针对每个布线层的抛光后剩余的布线材料的分布。
    • 30. 发明申请
    • MULTILAYERED CERAMIC CAPACITOR
    • 多层陶瓷电容器
    • US20100067171A1
    • 2010-03-18
    • US12516797
    • 2007-11-29
    • Youichi YamazakiHideyuki OsuzuYoshihiro FujiokaDaisuke Fukuda
    • Youichi YamazakiHideyuki OsuzuYoshihiro FujiokaDaisuke Fukuda
    • H01G4/06
    • H01G4/1227C04B35/4682C04B2235/3203C04B2235/3208C04B2235/3215C04B2235/3224C04B2235/3225C04B2235/3239C04B2235/3262C04B2235/3418C04B2235/36C04B2235/663C04B2235/785C04B2235/79C04B2235/85H01G4/30
    • [Problems] To provide a multilayered ceramic capacitor which in a high-temperature loading test, can be inhibited from decreasing in insulation resistance with time and which can have high insulating properties even when produced without via a reoxidation step.[Means for Solving Problems] The multilayered ceramic capacitor is formed by alternately superposing dielectric layers made of dielectric porcelain and inner-electrode layers. The dielectric porcelain is constituted of first crystals comprising crystal particles comprising barium titanate as the main component and having a calcium concentration of 0.2 at. % or lower and second crystals comprising crystal particles having a calcium concentration of 0.4 at. % or higher. The ratios (C2/C1) between the concentrations (C1) of magnesium and rare earth elements in a surface layer of the crystal particles constituting the first crystals and the concentrations (C2) of magnesium and the rare earth elements in a central part of the crystal particles (9a) constituting the first crystals are higher than the corresponding concentration ratios (C4/C3) in the crystal particles (9b) constituting the second crystals. When the areal proportion of the crystal particles of the first crystals and that of the crystal particles of the second crystals are expressed by a and b, respectively, then b/(a+b) is 0.5-0.8.
    • [问题]提供一种多层陶瓷电容器,其在高温负载试验中可以抑制绝缘电阻随时间的降低,即使在不经由再氧化步骤的情况下也可以具有高绝缘性。 解决问题的手段多层陶瓷电容器通过交替叠加由电介质瓷和内电极层构成的电介质层而形成。 电介质陶瓷由包含钛酸钡作为主要成分并且钙浓度为0.2at。的晶体颗粒的第一晶体构成。 %或更低的第二晶体包含钙浓度为0.4at。的晶体颗粒。 % 或更高。 构成第一晶体的结晶粒子的表面层中的镁和稀土元素的浓度(C1)与镁和稀土元素在中心部分的浓度(C2)之间的比(C2 / C1) 构成第一晶体的结晶粒子(9a)高于构成第二晶体的结晶粒子(9b)中的相应的浓度比(C4 / C3)。 当第一晶体的晶体颗粒和第二晶体的晶体颗粒的面积比例分别由a和b表示时,b /(a + b)为0.5-0.8。