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    • 21. 发明授权
    • Connection testing apparatus and method and chip using the same
    • 连接测试仪器和方法与芯片采用相同
    • US07683607B2
    • 2010-03-23
    • US11860754
    • 2007-09-25
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • H01L23/58
    • G01R31/2853G01R31/31717G01R31/318505G01R31/31905
    • A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.
    • 提供了一种连接测试装置,连接测试方法以及使用它们的芯片。 该方法可用于测试芯片之间的连接,以解决常规多芯片连接测试需要大量测试模式的问题,导致测试时间长,测试成本高,连接条件 测试失败后,故障难以分析。 在本发明中,当芯片中的ESD元件被导通时引起的电压变化,并且使用比较电路来确定连接是否正确。 此外,测试装置内置在芯片中,使得连接测试可以快速有效地完成。 一旦发生连接故障,也可以找到故障连接引脚,从而有利于工程分析,从而有效节省测试成本。
    • 25. 发明授权
    • Light source current sensing circuit and driving circuit in a display device
    • 光源电流检测电路和显示装置中的驱动电路
    • US07385402B2
    • 2008-06-10
    • US11539298
    • 2006-10-06
    • Cheng-Chi Yen
    • Cheng-Chi Yen
    • G01R31/08
    • H05B33/0827G09G3/3283H05B33/0815Y02B20/347
    • A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit includes: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a second current path for generating a first current according to the load current; an operation amplifier, coupled to the first and second current paths; and a current source, having a third current path coupled to the second current path and a fourth current path for generating a second current according to the first current, the second current indicating conductive condition of the load device.
    • 提供了用于感测流过LED组的电流的电流感测电路和用于驱动LED组的驱动电路。 电流感测电路包括:匹配晶体管组,具有耦合到负载装置的第一电流路径,用于感测负载电流;以及第二电流路径,用于根据负载电流产生第一电流; 耦合到所述第一和第二电流路径的运算放大器; 以及电流源,具有耦合到第二电流路径的第三电流路径和用于根据第一电流产生第二电流的第四电流路径,第二电流指示负载装置的导电状态。
    • 26. 发明授权
    • Light sensing circuit having programmable current source and method thereof
    • 具有可编程电流源的光感测电路及其方法
    • US08658958B2
    • 2014-02-25
    • US12688194
    • 2010-01-15
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • H03F3/08G01J1/44
    • G01J1/44H01L31/02019H03F3/08
    • A light detecting circuit and a light detecting method thereof are provided. The light detecting circuit includes a first resistor, a light sensor, a current source, and a first current mirror. The light sensor generates a corresponding photocurrent according to the illumination while being illuminated by the high brightness light beam. By dividing the photocurrent corresponding to the low brightness light beam from the photocurrent through the current source, the light detecting circuit can mainly detects the high brightness light beam, so that the detecting accuracy can be enhanced. Accordingly, when being applied to detect the high brightness light beam, the light detecting circuit can provide a sensing voltage in a wide enough range and a large enough sense scale, so that the sensing voltage is easy to be distinguished by the rear stage.
    • 提供了光检测电路及其光检测方法。 光检测电路包括第一电阻器,光传感器,电流源和第一电流镜。 光传感器在被高亮度光束照射时根据照明产生相应的光电流。 通过将与来自光电流的低亮度光束对应的光电流除以电流源,光检测电路可以主要检测高亮度光束,从而可以提高检测精度。 因此,当应用于检测高亮度光束时,光检测电路可以在足够宽的范围和足够大的感测尺度提供感测电压,使得感测电压容易被后级区分。
    • 27. 发明申请
    • LIGHT SENSING CIRCUIT AND METHOD THEREOF
    • 光感测电路及其方法
    • US20100252720A1
    • 2010-10-07
    • US12688194
    • 2010-01-15
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • H03F3/08H01L31/09
    • G01J1/44H01L31/02019H03F3/08
    • A light detecting circuit and a light detecting method thereof are provided. The light detecting circuit includes a first resistor, a light sensor, a current source, and a first current mirror. The light sensor generates a corresponding photocurrent according to the illumination while being illuminated by the high brightness light beam. By dividing the photocurrent corresponding to the low brightness light beam from the photocurrent through the current source, the light detecting circuit can mainly detects the high brightness light beam, so that the detecting accuracy can be enhanced. Accordingly, when being applied to detect the high brightness light beam, the light detecting circuit can provide a sensing voltage in a wide enough range and a large enough sense scale, so that the sensing voltage is easy to be distinguished by the rear stage.
    • 提供了光检测电路及其光检测方法。 光检测电路包括第一电阻器,光传感器,电流源和第一电流镜。 光传感器在被高亮度光束照射时根据照明产生相应的光电流。 通过将与来自光电流的低亮度光束对应的光电流除以电流源,光检测电路可以主要检测高亮度光束,从而可以提高检测精度。 因此,当应用于检测高亮度光束时,光检测电路可以在足够宽的范围和足够大的感测尺度提供感测电压,使得感测电压容易被后级区分。
    • 28. 发明申请
    • PIXEL DEVICE
    • 像素设备
    • US20090231503A1
    • 2009-09-17
    • US12049597
    • 2008-03-17
    • Cheng-Chi Yen
    • Cheng-Chi Yen
    • G02F1/133
    • G02F1/136213G09G2300/0426G09G2300/0439
    • A pixel device capable of composing a panel is provided herein. The pixel device includes a first switch, a first capacitor, and a second capacitor. The first switch delivers a pixel signal to a pixel electrode according to a control signal. The first capacitor has a first part of a first metal layer, a second metal layer, and a first dielectric coupled between the first part of the first metal layer and the second metal layer. The second capacitor has a first poly-silicon layer, an electrode layer, and a second dielectric coupled between the first poly-silicon layer and the electrode layer. The first and the second capacitors are parallel connected without increasing the area of the pixel and serve as a storage capacitor. Therefore, the pixel device can obtain more overall storage capacitance.
    • 本文提供了能够构成面板的像素装置。 像素装置包括第一开关,第一电容器和第二电容器。 第一开关根据控制信号向像素电极传送像素信号。 第一电容器具有第一金属层的第一部分,第二金属层和耦合在第一金属层的第一部分和第二金属层之间的第一电介质。 第二电容器具有耦合在第一多晶硅层和电极层之间的第一多晶硅层,电极层和第二介质。 第一和第二电容器并联连接,而不增加像素的面积并用作存储电容器。 因此,像素装置可以获得更多的整体存储电容。
    • 30. 发明授权
    • Test method of liquid crystal display panel
    • 液晶显示面板的测试方法
    • US08525541B2
    • 2013-09-03
    • US12878241
    • 2010-09-09
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • Wei-Ting LanCheng-Chi YenJu-Tien Cheng
    • G01R31/26
    • G09G3/006G09G3/3648G09G2300/0809
    • A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.
    • 提供了一种液晶显示面板的测试方法。 液晶显示面板包括多个像素和测试垫。 像素设置在第一,第二和第三数据线与多条扫描线之间的交点处。 在测试方法中,驱动每条扫描线将像素的液晶电容器连接到第一,第二和第三数据线。 第一和第二测试电压分别提供给第一和第二数据线,其中第一测试电压不等于第二测试电压。 第一条数据线是浮动的。 通过测试垫测量漂浮的第一数据线,以确定电连接到第一和第二数据线的像素的液晶电容器是否彼此电连接。