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    • 21. 发明授权
    • Semiconductor strain sensor
    • 半导体应变传感器
    • US08438931B2
    • 2013-05-14
    • US12674419
    • 2008-07-25
    • Atsushi KazamaRyoji OkadaTetsurou Kawai
    • Atsushi KazamaRyoji OkadaTetsurou Kawai
    • G01L1/22
    • G01L1/18G01B7/16G01L1/2293
    • A semiconductor strain sensor having a strain sensor chip composed of a semiconductor substrate having a piezoresistive element as a strain detection section. The semiconductor strain sensor has a stable characteristic for a long period of time and a stable conversion factor of a strain generated in the strain sensor chip corresponding to a strain of an object to be measured, within a strain range of a size to be measured. The strain sensor chip is bonded to a metal base plate with a metal bonding material. The metal base plate has two or four extending members, which protrude from a side of the strain sensor chip for attaching the strain senor chip to the object to be measured. Preferably, a groove is arranged between a metal base plate undersurface area, which corresponds to the bonding area where the strain sensor chip is bonded to the metal base plate, and the undersurfaces of the extending members, and a protruding section sandwiched by the grooves is arranged on the undersurface of the metal base plate.
    • 一种半导体应变传感器,具有由具有压阻元件的半导体基板构成的应变传感器芯片作为应变检测部。 半导体应变传感器在待测尺寸的应变范围内长时间地具有稳定的特性,并且在应变传感器芯片中产生的应变对应于被测量物体的应变的稳定的转换系数。 应变传感器芯片用金属接合材料接合到金属基板上。 金属基板具有从应变传感器芯片的一侧突出的两个或四个延伸部件,用于将应变传感器芯片附接到待测量对象。 优选地,在对应于应变传感器芯片与金属基板接合的接合区域的金属底板下表面区域和延伸构件的下表面之间布置有凹槽,以及由凹槽夹持的突出部分 布置在金属底板的下表面上。
    • 22. 发明申请
    • SEMICONDUCTOR STRAIN SENSOR
    • 半导体应变传感器
    • US20110227178A1
    • 2011-09-22
    • US12674419
    • 2008-07-25
    • Atsushi KazamaRyoji OkadaTetsurou Kawai
    • Atsushi KazamaRyoji OkadaTetsurou Kawai
    • H01L29/84
    • G01L1/18G01B7/16G01L1/2293
    • A semiconductor strain sensor having a strain sensor chip composed of a semiconductor substrate having a piezoresistive element as a strain detection section. The semiconductor strain sensor has a stable characteristic for a long period of time and a stable conversion factor of a strain generated in the strain sensor chip corresponding to a strain of an object to be measured, within a strain range of a size to be measured. The strain sensor chip is bonded to a metal base plate with a metal bonding material. The metal base plate has two or four extending members, which protrude from a side of the strain sensor chip for attaching the strain senor chip to the object to be measured. Preferably, a groove is arranged between a metal base plate undersurface area, which corresponds to the bonding area where the strain sensor chip is bonded to the metal base plate, and the undersurfaces of the extending members, and a protruding section sandwiched by the grooves is arranged on the undersurface of the metal base plate.
    • 一种半导体应变传感器,具有由具有压阻元件的半导体基板构成的应变传感器芯片作为应变检测部。 半导体应变传感器在待测尺寸的应变范围内长时间地具有稳定的特性,并且在应变传感器芯片中产生的应变对应于被测量物体的应变的稳定的转换系数。 应变传感器芯片用金属接合材料接合到金属基板上。 金属基板具有从应变传感器芯片的一侧突出的两个或四个延伸部件,用于将应变传感器芯片附接到待测量对象。 优选地,在对应于应变传感器芯片与金属基板接合的接合区域的金属底板下表面区域和延伸构件的下表面之间布置有凹槽,以及由凹槽夹持的突出部分 布置在金属底板的下表面上。
    • 25. 发明授权
    • Beam direction module and optical switch using the same
    • 光束方向模块和光开关使用相同
    • US07184619B2
    • 2007-02-27
    • US10890131
    • 2004-07-14
    • Atsushi KazamaKazuyuki FukudaToshiya ShiramatsuMasaya HorinoYasuhiro Itou
    • Atsushi KazamaKazuyuki FukudaToshiya ShiramatsuMasaya HorinoYasuhiro Itou
    • G02B6/26
    • G02B6/3556G02B6/32G02B6/3512G02B6/3544G02B6/357G02B6/3572G02B6/3578G02B6/3584
    • A beam direction module which can be applied to an optical switch, comprising: a collimator support member; a first mirror substrate including first micro-mirrors, and first windows through which beams can pass; a first electrode substrate including first mirror driving electrodes, and second windows through which beams can pass; a first spacer; a second mirror substrate including second micro-mirrors, and third windows through which beams can pass; a second electrode substrate including second mirror driving electrodes, and fourth windows through which beams can pass; a second spacer; and an inter-mirror spacer, wherein the first electrode substrate, the first spacer, the first mirror substrate, the inter-mirror spacer, the second mirror substrate, the second spacer and the second electrode substrate are stacked successively on the collimator support member and fixed between caps and the collimator support member while pins protruding from the collimator support member are inserted into alignment through-holes formed.
    • 可以应用于光开关的光束方向模块,包括:准直器支撑部件; 包括第一微反射镜的第一反射镜基板和光束能穿过的第一窗口; 第一电极基板,包括第一反射镜驱动电极和光束能通过的第二窗口; 第一间隔物 包括第二微反射镜的第二反射镜基板和光束能穿过的第三窗口; 第二电极基板,包括第二反射镜驱动电极和第四窗口,波束可以通过该第四窗口; 第二间隔物 以及反射镜间隔件,其中所述第一电极基板,所述第一间隔件,所述第一反射镜基板,所述反射镜间隔件,所述第二反射镜基板,所述第二间隔物和所述第二电极基板依次堆叠在所述准直器支撑部件上, 固定在盖和准直器支撑构件之间,而从准直器支撑构件突出的销插入形成的对准通孔中。
    • 26. 发明授权
    • Bus relay device and bus control system including plurality of bus masters, bus slave, interconnect section, and bridge section
    • 总线中继装置和总线控制系统,包括多个总线主机,总线从机,互连部分和桥接部分
    • US07783804B2
    • 2010-08-24
    • US11984607
    • 2007-11-20
    • Atsushi Kazama
    • Atsushi Kazama
    • G06F13/18
    • G06F13/4031
    • In the conventional bus control system, the interconnect section and the bridge section have the arbitration function. Meanwhile, the interconnect section and the bridge section were designed by different designers. Accordingly, a large number of man-hours are needed not only for designing the bridge section but also for inspecting the bridge section. To solve this problem, provided is a system comprising a plurality of bus masters coupled to a high speed bus and outputting first control signals respectively via the high speed bus; a bus slave coupled to a low speed bus and receiving a second control signal via the low speed bus; an interconnect section receiving the first control signals via the high speed bus, selecting one of the first control signals, and converting the selected one of the first signals into a third control signal relative to the second control signal; and a bridge section coupled to the low speed bus, converting the third control signal into the second control signal, and outputting the second control signal to the low speed bus. With this configuration, the bus arbitrations can be collectively controlled in the interconnect section alone. In addition, a circuit size can be reduced.
    • 在常规总线控制系统中,互连部分和桥接部分具有仲裁功能。 同时,互连部分和桥接部分由不同的设计者设计。 因此,不仅需要设计桥段,而且还需要大量工时来检查桥段。 为了解决这个问题,提供了一种系统,包括耦合到高速总线的多个总线主机,并分别经由高速总线输出第一控制信号; 耦合到低速总线并经由低速总线接收第二控制信号的总线从设备; 互连部分,经由高速总线接收第一控制信号,选择第一控制信号中的一个,并将所选择的一个第一信号转换成相对于第二控制信号的第三控制信号; 以及耦合到所述低速总线的桥接部分,将所述第三控制信号转换为所述第二控制信号,并将所述第二控制信号输出到所述低速总线。 利用这种配置,总线仲裁可以单独地在互连部分中统一控制。 此外,可以减小电路尺寸。
    • 28. 发明申请
    • ANGULAR RATE SENSOR
    • 角速率传感器
    • US20070272015A1
    • 2007-11-29
    • US11752335
    • 2007-05-23
    • Atsushi KazamaShigeo Nakamura
    • Atsushi KazamaShigeo Nakamura
    • G01P9/02G01P9/04G01P1/04
    • G01P15/125G01C19/5712G01P2015/0814
    • An angular rate sensor formed into a planar shape, which detects an angular rate around a first axis in the plane, includes a rotating oscillator rotatably supported in the plane and around the rotational axis in a direction of a second axis perpendicular to the first axis; vibration generating means which rotationally vibrates the rotating oscillator; and a first detecting oscillator and a second detecting oscillator which are disposed inside the rotating oscillator and separately on the right side and the left side of the rotational axis, and which are supported as being displaceable in a direction of the second axis. A first detecting unit and a second detecting unit, which detect vibrations of the respective first and second detecting oscillators in the direction of the second axis due to the Coriolis force, are respectively provided closer to the rotational axis than the first and second detecting oscillators are.
    • 形成为平面形状的角速度传感器,其检测所述平面中的第一轴周围的角速度,包括旋转振荡器,所述旋转振荡器在垂直于所述第一轴线的第二轴线的方向上可旋转地支撑在所述平面中并且围绕所述旋转轴线; 使旋转振荡器旋转振动的振动产生装置; 以及第一检测振荡器和第二检测振荡器,其分别设置在旋转振荡器的内部,并且分别位于旋转轴的右侧和左侧,并且被支撑为可沿第二轴线的方向移位。 第一检测单元和第二检测单元分别设置为比第一和第二检测振荡器更靠近旋转轴设置检测相应的第一和第二检测振荡器在第二轴方向上由于科里奥利力的振动。 。