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21. 发明申请

US20100002507A1 FLASH MEMORY DEVICE REDUCING NOISE OF COMMON SOURCE LINE, PROGRAM VERIFY METHOD THEREOF, AND MEMORY SYSTEM INCLUDING THE SAME 有权
标题翻译：闪存存储器件减少通用源线的噪声，程序验证方法和包括其的存储器系统
公开(公告)号：US20100002507A1
公开(公告)日：2010-01-07
申请号：US12472639
申请日：2009-05-27
申请人： Sang-gu Kang , Hee-Won Lee , Ju-Seok Lee , Jung-Ho Song
发明人： Sang-gu Kang , Hee-Won Lee , Ju-Seok Lee , Jung-Ho Song
IPC分类号： G11C16/04 , G11C16/06 , G11C7/10
CPC分类号： G11C7/02 , G11C7/1048 , G11C11/5628 , G11C16/0483 , G11C2211/5621 , G11C2211/5642
摘要： A flash memory device controls a common source line voltage and performs a program verify method. A plurality of memory cells is connected between a bit line and the common source line. A data input/output circuit is connected to the bit line and is configured to store data to be programmed in a selected memory cell of the plurality of memory cells. The data input/output circuit maintains data to be programmed within the data input/output circuit during a program verify operation, and decreases noise in the common source line by selectively precharging the bit line based on the data to be programmed.
摘要翻译：闪存器件控制公共源极线电压并执行程序验证方法。多个存储单元连接在位线和公共源极线之间。数据输入/输出电路连接到位线，并且被配置为存储要编程在多个存储器单元的所选存储单元中的数据。数据输入/输出电路在编程验证操作期间保持在数据输入/输出电路内编程的数据，并且通过基于要编程的数据选择性地预充电位线来降低公共源极线中的噪声。

22. 发明授权

US09431122B2 Storage device and operating method of storage device 有权
标题翻译：存储设备的存储设备和操作方法
公开(公告)号：US09431122B2
公开(公告)日：2016-08-30
申请号：US14856695
申请日：2015-09-17
申请人： Ju Seok Lee
发明人： Ju Seok Lee
IPC分类号： G11C16/04 , G11C16/26 , G11C11/56 , G11C16/34
CPC分类号： G11C16/3445 , G11C11/5642 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/26 , G11C16/3422
摘要： An operating method is provided which includes receiving a read command and a read address, performing a read operation about memory cells selected according to the read address, and performing a reliability verification read operation about unselected memory cells adjacent to the selected memory cells. A number of memory cells each corresponding to at least one state of an erase state and program states of the unselected memory cells is counted as a count value based on the result of the reliability verification read operation. Data read through the read operation is output to an external device and data read through the reliability verification read operation is not output to the external device.
摘要翻译：提供了一种操作方法，其包括接收读取命令和读取地址，执行关于根据读取地址选择的存储器单元的读取操作，以及对与所选择的存储器单元相邻的未选择存储单元进行可靠性验证读取操作。每个对应于擦除状态的至少一个状态的存储器单元和未选择的存储器单元的程序状态的数量被计数为基于可靠性验证读取操作的结果的计数值。通过读取操作读取的数据被输出到外部设备，通过可靠性验证读取操作读取的数据不会输出到外部设备。

23. 发明授权

US08811088B2 Method of reading memory cells with different threshold voltages without variation of word line voltage and nonvolatile memory device using the same 有权
标题翻译：使用不同字线电压的不同阈值电压读取存储单元的方法和使用其的非易失性存储器件
公开(公告)号：US08811088B2
公开(公告)日：2014-08-19
申请号：US13608030
申请日：2012-09-10
申请人： Sang-Hyun Joo , Kiwhan Song , Ju Seok Lee , Kihwan Choi
发明人： Sang-Hyun Joo , Kiwhan Song , Ju Seok Lee , Kihwan Choi
IPC分类号： G11C16/26
CPC分类号： G11C16/26 , G11C11/5642 , G11C16/0483 , G11C16/08 , G11C2211/563
摘要： A soft-decision read method of a nonvolatile memory device includes receiving a soft-decision read command, applying a read voltage to a selected word line, pre-charging bit lines respectively connected to selected memory cells of the selected word line, continuously sensing states of the selected memory cells. The pre-charged voltages of the bit lines and the read voltage supplied to the selected word line are not varied during the sensing states of the selected memory cells.
摘要翻译：非易失性存储器件的软判决读取方法包括：接收软判决读命令，将读电压施加到所选择的字线，对分别连接到所选字线的选定存储单元的位线进行预充电，连续检测状态的所选存储单元。提供给所选字线的位线的预充电电压和读取电压在所选存储单元的感测状态期间不改变。

24. 发明授权

US08742764B2 Method and apparatus for checking insulation of pouch electric cell and probe for the same 有权
标题翻译：用于检查袋电池和探针的绝缘的方法和装置
公开(公告)号：US08742764B2
公开(公告)日：2014-06-03
申请号：US13123822
申请日：2009-10-12
申请人： Ju-Seok Lee , Hey-Woong Park , Ju-Young Kim , John E. Namgoong
发明人： Ju-Seok Lee , Hey-Woong Park , Ju-Young Kim , John E. Namgoong
IPC分类号： G01N27/416
CPC分类号： G01R1/06788 , G01R31/1263 , G01R31/3627
摘要： To check insulation of a pouch electric cell, probes are contacted to an electrode of a pouch electric cell and an aluminum layer of a pouch of the pouch electric cell, respectively, and then an electric characteristic value between the probes is measured. The probe contacted with the aluminum layer has a contact portion made of conductive elastic material. Also, insulation of the pouch electric cell is determined by comparing the measured electric characteristic value with a reference value. Thus, physical characteristics of an outer periphery of a flexible pouch may be sufficiently exhibited in measuring or checking insulation of a pouch electric cell such as insulation resistance, thereby improving reliability of electric contact and minimizing physical damage or deformation of the pouch electric cell.
摘要翻译：为了检查袋电池的绝缘，将探针分别与袋电池的电极和袋电池的袋的铝层接触，然后测量探针之间的电特性值。与铝层接触的探针具有由导电弹性材料制成的接触部分。此外，通过将测量的电特性值与参考值进行比较来确定袋电池的绝缘。因此，可以在测量或检查诸如绝缘电阻的袋电池的绝缘性方面充分发挥柔性袋的外周的物理特性，从而提高电接触的可靠性并使袋电池的物理损坏或变形最小化。

25. 发明授权

US08068361B2 Systems and methods for performing a program-verify process on a nonvolatile memory by selectively pre-charging bit lines associated with memory cells during the verify operations 有权
标题翻译：用于通过在验证操作期间选择性地预充电与存储器单元相关联的位线来对非易失性存储器执行程序验证过程的系统和方法
公开(公告)号：US08068361B2
公开(公告)日：2011-11-29
申请号：US12533720
申请日：2009-07-31
申请人： Sang-Gu Kang , Hee-won Lee , Ju Seok Lee , Jung-Ho Song
发明人： Sang-Gu Kang , Hee-won Lee , Ju Seok Lee , Jung-Ho Song
IPC分类号： G11C16/04
CPC分类号： G11C16/24 , G11C11/5628 , G11C16/3454 , G11C2211/5621
摘要： A nonvolatile memory system is operated by performing a program loop on each of a plurality of memory cells, each program loop comprising at least one program-verify operation and selectively pre-charging bit lines associated with each of the plurality of memory cells during the at least one program-verify operation.
摘要翻译：通过在多个存储器单元中的每一个上执行程序循环来操作非易失性存储器系统，每个程序循环包括至少一个程序验证操作，并且在at期间选择性地预充电与多个存储器单元中的每一个相关联的位线至少一个程序验证操作。

26. 发明申请

US20110191043A1 APPARATUS AND METHOD FOR CHECKING INSULATION OF CELL MODULE ASSEMBLY AND PROBE FOR IT 有权
标题翻译：检查电池组件绝缘和探针的装置和方法
公开(公告)号：US20110191043A1
公开(公告)日：2011-08-04
申请号：US12667124
申请日：2009-10-12
申请人： Ju-Seok Lee , John E. NamGoong
发明人： Ju-Seok Lee , John E. NamGoong
IPC分类号： G06F19/00 , H01M10/48 , G01R27/08
CPC分类号： G01R31/3627 , G01R31/1263
摘要： An apparatus for checking insulation of a cell module assembly composed of a plurality of pouch cells includes a first probing unit electrically contacted to an electrode of the cell module assembly; a second probing unit electrically contacted to aluminum films of selected ones of the pouch cells in the cell module assembly; and a measuring unit for measuring an insulation resistance between the first probing unit and the second probing unit. This apparatus may measure insulation resistances of a plurality of pouch cells of the cell module assembly at once, thereby ensuring faster insulation checking.
摘要翻译：用于检查由多个袋单元组成的电池模块组件的绝缘的装置包括与电池模块组件的电极电接触的第一探测单元; 第二探测单元与细胞模块组件中的所选囊泡细胞中的铝膜电接触; 以及测量单元，用于测量第一探测单元和第二探测单元之间的绝缘电阻。该装置可以一次测量电池模块组件的多个袋单元的绝缘电阻，从而确保更快的绝缘检查。

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