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    • 27. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • WO1997040531A1
    • 1997-10-30
    • PCT/JP1997001347
    • 1997-04-18
    • MATSUSHITA ELECTRONICS CORPORATIONHIRANO, HiroshigeTAKEO, Masato
    • MATSUSHITA ELECTRONICS CORPORATION
    • H01L21/822
    • H01L27/11502H01L27/10805
    • Purpose: The characteristic variation of a ferroelectric capacitor of a semiconductor device is reduced and the characteristic variation, namely, the characteristic deterioration with time of the capacitor is suppressed. Constitution: The capacitor is constituted of lower electrode (111a) having a planar shape which extends in a first direction D1 and having a width in a second direction D2 perpendicular to the first direction D1, a plurality of upper electrodes (112a) which are arranged above the electrode (111a) so that the electrodes (112a) are opposed to the electrodes (111a), and ferroelectric layers arranged between both electrodes (111a and 112a). The dimensions of the electrodes (112a) in the first direction D1 are smaller than those in the second direction D2.
    • 目的:减小半导体器件的铁电电容器的特性变化,并且抑制特性变化,即电容器的特性劣化随时间变化。 结构:电容器由平面形状的下电极(111a)构成,所述下电极(111a)在第一方向D1上延伸并且具有与第一方向D1垂直的第二方向D2的宽度;多个上电极(112a) 在电极(111a)的上方,电极(112a)与电极(111a)相对,铁电层配置在两电极(111a,112a)之间。 第一方向D1上的电极(112a)的尺寸小于第二方向D2的尺寸。