会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 192. 发明专利
    • Resist composition, method for forming resist pattern, compound, radical polymerization initiator, production method of compound, and polymer
    • 耐蚀组合物,形成耐蚀图案的方法,化合物,自由基聚合引发剂,化合物的生产方法和聚合物
    • JP2014153686A
    • 2014-08-25
    • JP2013026074
    • 2013-02-13
    • Tokyo Ohka Kogyo Co Ltd東京応化工業株式会社
    • DAZAI NAOHIROUTSUMI YOSHIYUKITAKAGI DAICHIKAIHO TAKAAKI
    • G03F7/039C07C253/30C07C255/65C08F220/26G03F7/038H01L21/027
    • PROBLEM TO BE SOLVED: To provide a resist composition excellent in lithography characteristics and a pattern profile, a polymer useful for the resist composition, and an easy production method for obtaining the polymer.SOLUTION: The resist composition comprises a base component (A) which shows changes in the solubility with a developer by an action of an acid; and the base component (A) comprises a polymer having a group expressed by general formula (I-1) in at least one terminal of the main chain. In formula (I-1), Rrepresents a hydrocarbon group having 1 to 10 carbon atoms; Z represents a hydrocarbon group having 1 to 10 carbon atoms or a cyano group, and Rand Z may be bonded to each other to form a ring; X represents a single bond or a divalent connecting group which may include -O-C(=O)-, -NH-C(=O)- or -NH-C(=NH)-; and Rrepresents a tertiary ester type acid dissociable group having 4 to 20 carbon atoms (excluding a tert-butyl group).
    • 要解决的问题:提供光刻特性和图案轮廓优异的抗蚀剂组合物,可用于抗蚀剂组合物的聚合物和获得聚合物的容易制备方法。溶胶:抗蚀剂组合物包含基础组分(A) 通过酸的作用显示与显影剂的溶解度的变化; 碱性成分(A)在主链的至少一个末端含有具有通式(I-1)表示的基团的聚合物。 式(I-1)中,R表示碳原子数1〜10的烃基, Z表示碳原子数1〜10的烃基或氰基,兰可以相互结合形成环, X表示可以包括-O-C(= O) - , - NH-C(= O) - 或-NH-C(= NH) - )的单键或二价连接基团。 R表示具有4〜20个碳原子的叔酯型酸解离基(不包括叔丁基)。
    • 199. 发明专利
    • Copolymer for positive lithography, polymerization initiator for producing the copolymer and composition for semiconductor lithography
    • 用于阳性光刻的共聚物,用于生产共聚物的聚合引发剂和用于SEMICONDUCTOR LITHOGRAPHY的组合物
    • JP2007308586A
    • 2007-11-29
    • JP2006138768
    • 2006-05-18
    • Maruzen Petrochem Co Ltd丸善石油化学株式会社
    • IIJIMA MINORUYAMAGISHI TAKANORI
    • C08F220/28C07C255/65C08F4/04G03F7/033G03F7/039H01L21/027
    • G03F7/0397C08F220/28
    • PROBLEM TO BE SOLVED: To obtain a copolymer that is used in chemical amplification positive lithography and has excellent lithography properties such as dissolution contrast, etc.
      SOLUTION: The copolymer for positive lithography has a repeating unit (A) represented by formula (A) [R
      10 is a hydrogen atom or a 1-4C hydrocarbon group which may be replaced with a fluorine atom; R
      11 is a 1C or 2C hydrocarbon group or a 7-12C bridged alicyclic hydrocarbon group crosslinked with an oxygen atom or a sulfur atom; n is an integer of 0 or 1; R
      12 is an acid-dissociable dissolution inhibiting group] and a terminal structure (B) containing an alkali-soluble group protected with an acid-dissociable dissolution inhibiting group, represented by formula (B) [R
      21 is a 3-6C hydrocarbon group which may contain a nitrogen atom; R
      22 is an acid-dissociable dissolution inhibiting group; p is a binding site with a copolymer main chain].
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:获得用于化学放大正光刻中的共聚物,并且具有优异的光刻性能如溶解对比度等。解决方案:正光刻用共聚物具有代表性的重复单元(A) 通式(A)[R SB 10]是氢原子或可被氟原子取代的1-4C烃基; R 11是与氧原子或硫原子交联的1C或2C烃基或7-12C桥连的脂环族烃基; n为0或1的整数; 由式(B)表示的具有酸解离性溶解抑制基团保护的碱溶性基团的末端结构(B)[R“SB 12”是酸解离性溶解抑制基] SB> 21 是可含有氮原子的3-6C烃基; R 22 是酸解离的溶解抑制基团; p是具有共聚物主链的结合位点]。 版权所有(C)2008,JPO&INPIT