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    • 12. 发明授权
    • Pipelined analog-to-digital converter and its single redundancy bit digital correction technique
    • 流水线模数转换器及其单冗余位数字校正技术
    • US08531323B2
    • 2013-09-10
    • US13142367
    • 2010-06-21
    • Ting LiYuxin WangXiaofeng ShenShutao ZhouTao LiuMingyuan XuRuzhang LiKaiquan He
    • Ting LiYuxin WangXiaofeng ShenShutao ZhouTao LiuMingyuan XuRuzhang LiKaiquan He
    • H03M1/06
    • H03M1/0695H03M1/168
    • A pipeline A/D converter and its single redundancy bit digital correction are provided. The single redundancy bit digital correction includes the following steps: substages except for the last one quantizes input voltage, calculates the residual voltage, which is amplified and shifted to the middle part of the reference voltage range, and outputs to the following substage until the last one, which only quantizes the input voltage; the code and offset code of each substage corresponding to the quantized thermometer code are calculated; the offset codes of all stages are added by weight to get total offset code; and codes of all substages are added by weight, to which the total offset code is added. The comparator offset error is corrected to obtain an output code which identifies the negative or positive overflow of input signals. The A/D converter adopting the above digital correction is provided.
    • 提供流水线A / D转换器及其单个冗余位数字校正。 单个冗余位数字校正包括以下步骤:除最后一个以外的子步长量化输入电压,计算被放大并转移到参考电压范围中间部分的剩余电压,并输出到下一个子站直到最后一个 一个,仅量化输入电压; 计算与量化温度计代码相对应的每个子级的代码和偏移代码; 所有阶段的偏移代码通过权重相加得到总偏移代码; 并且通过加权添加所有子级的代码,添加总偏移代码。 校正比较器偏移误差以获得识别输入信号的负或正溢出的输出代码。 提供采用上述数字校正的A / D转换器。
    • 16. 发明授权
    • Fabrication methods for micro compounds optics
    • 微复合光学制造方法
    • US07365909B2
    • 2008-04-29
    • US10688187
    • 2003-10-17
    • Wenbing YunYuxin WangMichael FeserAlan Lyon
    • Wenbing YunYuxin WangMichael FeserAlan Lyon
    • G02B27/44
    • G02B27/4211G02B3/08G02B27/4272G03F7/0005Y10S438/975
    • Methods for fabricating refractive element(s) and aligning the elements in a compound optic, typically to a zone plate element. The techniques are used for fabricating micro refractive, such as Fresnel, optics and compound optics including two or more optical elements for short wavelength radiation. One application is the fabrication of the Achromatic Fresnel Optic (AFO). Techniques for fabricating the refractive element generally include: 1) ultra-high precision mechanical machining, e.g,. diamond turning; 2) lithographic techniques including gray-scale lithography and multi-step lithographic processes; 3) high-energy beam machining, such as electron-beam, focused ion beam, laser, and plasma-beam machining; and 4) photo-induced chemical etching techniques. Also addressed are methods of aligning the two optical elements during fabrication and methods of maintaining the alignment during subsequent operation.
    • 用于制造折射元件并将复合光学元件中的元件对准的方法,通常与区域板元件对准。 这些技术用于制造微折射,例如菲涅尔,光学和复合光学器件,包括用于短波长辐射的两个或更多个光学元件。 一种应用是制造消色差菲涅耳光(AFO)。 用于制造折射元件的技术通常包括:1)超高精度机械加工,例如 钻石车削 2)光刻技术,包括灰阶光刻和多步光刻工艺; 3)高能束加工,如电子束,聚焦离子束,激光和等离子束加工; 和4)光诱导化学蚀刻技术。 还涉及在制造期间对准两个光学元件的方法以及在随后的操作期间维持对准的方法。
    • 17. 发明授权
    • Lens bonded X-ray scintillator system and manufacturing method therefor
    • 透镜结合X射线闪烁体系及其制造方法
    • US07297959B2
    • 2007-11-20
    • US11278839
    • 2006-04-06
    • Wenbing YunYuxin WangDavid R. Trapp
    • Wenbing YunYuxin WangDavid R. Trapp
    • G01T1/20
    • G01T1/2002G01T1/20
    • A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%. The design of this detector also allows it to function as an energy filter to remove high-energy x-rays. This detector is useful in a wide range of applications including x-ray imaging, spectroscopy, and diffraction. The scintillator optical system has scintillator material with a lens system for collecting the light that is generated in the scintillator material. A substrate is used for spacing the scintillator material from the lens system.
    • 用于对x射线进行成像的闪烁CCD检测器系统使用具有在1至20keV范围内的光子能量的X射线。 检测器与现有系统不同之处在于它提供比千分尺更高的分辨率,高达95%的高检测量子效率。 该检测器的设计也可以用作能量过滤器,以去除高能X射线。 该检测器可用于广泛的应用,包括X射线成像,光谱和衍射。 闪烁体光学系统具有闪烁体材料,其具有用于收集闪烁体材料中产生的光的透镜系统。 衬底用于将闪烁体材料与透镜系统间隔开。