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11. 发明申请

US20080193271A1 Test Handler 有权
标题翻译：测试处理程序
公开(公告)号：US20080193271A1
公开(公告)日：2008-08-14
申请号：US11997974
申请日：2006-08-14
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
IPC分类号： H01L21/68
CPC分类号： H01L21/67745 , G01R31/2893 , H01L21/67271 , H01L21/67778
摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
摘要翻译：公开了一种测试处理程序。测试处理器包括用于传送用户托盘的第一至第三传送，以及适于在水平方向上分别移动第一至第三传送的第一至第三水平移动单元。第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

12. 发明授权

US08376431B2 Pick-and-place module for test handler 有权
标题翻译：用于测试处理程序的拾取和放置模块
公开(公告)号：US08376431B2
公开(公告)日：2013-02-19
申请号：US12788200
申请日：2010-05-26
申请人： Yun Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
发明人： Yun Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
IPC分类号： A47B97/00
CPC分类号： H01L21/6838 , G01R31/2893
摘要： A pick-and-place module for test handlers is disclosed that includes a main body and a kit. The main body forms vacuum paths therein and the kit also forms vacuum passages therein. The kit is detachably mounted to the main body in a hook coupling manner. The pick-and-place module can be applied to all customer trays having different loading capabilities when only the kit of the pick-and-place module needs to be replaced, so there is no need to manufacture the entire pick-and-place module and this reduces manufacturing costs. The pick-and-place module can reduce the amount of resources to be replaced and reduce the replacement time since the kit can be easily removed from the main body of the pick-and-place module in a hook manner.
摘要翻译：公开了一种用于测试处理程序的拾取和放置模块，其包括主体和套件。主体在其中形成真空路径，套件还在其中形成真空通道。套件以钩式联接方式可拆卸地安装到主体。当仅需要更换取样模块的套件时，拾取和放置模块可以应用于具有不同加载能力的所有客户托盘，因此不需要制造整个拾取和放置模块这降低了制造成本。拾取和放置模块可以减少更换的资源数量，并减少更换时间，因为套件可以以钩状方式从拾取和放置模块的主体轻松移除。

13. 发明授权

US08013620B2 Test handler and loading method thereof 有权
标题翻译：测试处理程序及其加载方法
公开(公告)号：US08013620B2
公开(公告)日：2011-09-06
申请号：US12634900
申请日：2009-12-10
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Hyun-Jun Yoo
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Hyun-Jun Yoo
IPC分类号： G01R31/00
CPC分类号： G01R31/2893 , G01R31/2867
摘要： When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.
摘要翻译：当测试处理器将用户托盘的半导体器件加载到测试托盘上时，测试处理器调整半导体器件之间的前/后间距或右/左间距，调整右/左节距或前/后间距，以及负载半导体器件。测试处理器可以分别顺序地调节半导体器件之间的前/后间距和右/左间距，从而减少设备重量和加载时间。

14. 发明授权

US07656150B2 Test handler and loading method thereof 有权
标题翻译：测试处理程序及其加载方法
公开(公告)号：US07656150B2
公开(公告)日：2010-02-02
申请号：US11627276
申请日：2007-01-25
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Hyun-Jun Yoo
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Hyun-Jun Yoo
IPC分类号： G01R31/28
CPC分类号： G01R31/2893 , G01R31/2867
摘要： When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.
摘要翻译：当测试处理器将用户托盘的半导体器件加载到测试托盘上时，测试处理器调整半导体器件之间的前/后间距或右/左间距，调整右/左节距或前/后间距，以及负载半导体器件。测试处理器可以分别顺序地调节半导体器件之间的前/后间距和右/左间距，从而减少设备重量和加载时间。

15. 发明授权

US08333083B2 System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the system 有权
标题翻译：系统支持电子设备的测试，系统的温度控制单元以及控制系统室内温度的方法
公开(公告)号：US08333083B2
公开(公告)日：2012-12-18
申请号：US12400243
申请日：2009-03-09
申请人： Yun-Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
发明人： Yun-Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
IPC分类号： F25D23/12 , F28D15/00 , G01R31/00 , H05K7/20
CPC分类号： G05D23/19 , G01R31/2874
摘要： A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are tested at low or high temperature. External air is supplied to the inside of the chamber when the electronic devices are tested at room temperature.
摘要翻译：公开了一种支持电子设备测试和系统温度控制单元的系统。还公开了一种用于该系统的室的温度控制方法。当电子设备在低温或高温下进行测试时，将低或高温空气供应到室内。当电子设备在室温下进行测试时，外部空气供应到室内。

16. 发明授权

US08058890B2 Test Handler 有权
标题翻译：测试处理程序
公开(公告)号：US08058890B2
公开(公告)日：2011-11-15
申请号：US13033262
申请日：2011-02-23
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
IPC分类号： G01R31/20
CPC分类号： H01L21/67745 , G01R31/2893 , H01L21/67271 , H01L21/67778
摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
摘要翻译：公开了一种测试处理程序。测试处理器包括用于传送用户托盘的第一至第三传送，以及适于分别在水平方向上移动第一至第三传送的第一至第三水平移动单元。第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

17. 发明授权

US07557564B2 Test handler comprising at least one opening unit opening one part of the plurality of inserts 有权
标题翻译：测试处理器包括打开多个插入件的一部分的至少一个开口单元
公开(公告)号：US07557564B2
公开(公告)日：2009-07-07
申请号：US11727851
申请日：2007-03-28
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
IPC分类号： G01R31/26 , G01R31/28
CPC分类号： G01R31/2893
摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.
摘要翻译：在本发明中公开了一种测试处理器。测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元，以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。此外，测试处理程序可以应用于各种类型的测试器。

18. 发明授权

US08558569B2 Opener for test handler 有权
标题翻译：测试处理程序的开启者
公开(公告)号：US08558569B2
公开(公告)日：2013-10-15
申请号：US13083829
申请日：2011-04-11
申请人： Yun-Sung Na , Tae-Hung Ku , Jung-Woo Hwang
发明人： Yun-Sung Na , Tae-Hung Ku , Jung-Woo Hwang
IPC分类号： G01R31/20
CPC分类号： G01R31/2893
摘要： An opener for a test handler is provided. Even when holding members of inserts of a carrier board are manipulated to release semiconductor devices that have been in a held state, a predetermined distance can remain between an upper surface of the opening plate and a lower surface of the insert, thus preventing the inserts from becoming defective.
摘要翻译：提供了一个测试处理程序的开启者。即使当操作承载板的插入件的部件以释放已经处于保持状态的半导体器件时，在开口板的上表面和插入件的下表面之间仍可保留预定距离，从而防止插入物变得有缺陷。

19. 发明授权

US08258804B2 Test tray for test handler 有权
标题翻译：测试托盘的测试托盘
公开(公告)号：US08258804B2
公开(公告)日：2012-09-04
申请号：US12513039
申请日：2007-10-22
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jung-Woo Hwang
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jung-Woo Hwang
IPC分类号： G01R31/00
CPC分类号： G01R31/2893
摘要： A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.
摘要翻译：公开了一种用于测试处理器的测试盘，其装载有半导体器件，然后沿着预定的循环路线携带它们。测试托盘允许一个固定单元将多个相邻的插入模块固定到框架的接收空间，从而有效地使用框架的空间并且允许相对大量的插入模块安装在相同的区域中到常规的测试托盘。

20. 发明授权

US07948255B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US07948255B2
公开(公告)日：2011-05-24
申请号：US11997974
申请日：2006-08-14
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
IPC分类号： G01R31/20 , G01R31/00
CPC分类号： H01L21/67745 , G01R31/2893 , H01L21/67271 , H01L21/67778
摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
摘要翻译：公开了一种测试处理程序。测试处理器包括用于传送用户托盘的第一至第三传送，以及适于在水平方向上分别移动第一至第三传送的第一至第三水平移动单元。第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

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