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    • 11. 发明公开
    • PROCÉDÉ D'OPTIMISATION DE LA COLLECTION DE PHOTONS DANS DES CRISTAUX SCINTILLATEURS, CRISTAL ET UTILISATIONS ASSOCIÉS
    • 法在合理的光子集合中闪烁晶体及相关CRYSTAL和用途
    • EP3117243A1
    • 2017-01-18
    • EP15719259.2
    • 2015-03-13
    • Université de Technologie de TroyesCERN, Organisation Européenne pour la Recherche NucléaireSILSEFLaboratoire Chimie de la Matière Condensée de Paris (LCMCP)
    • LERONDEL, GillesLE CUNFF, LoicSALAS MONTIEL, RafaelLECOQ, PaulTUROVER, DanielGROSSO, David
    • G01T1/20
    • G01T1/2002
    • The invention relates to a method for optimizing photon management in scintillation crystals. Said method is characterized in that it includes the following steps: depositing a material (5), having a refractive index "n" approximately equal to the refractive index of a scintillation crystal (1), on one surface (2) of said scintillation crystal; structuring said material (5) via a structuring means; and creating sub-diffractive size structures (6) in said material (5) such as to enable the refractive index to be adapted between the scintillation crystal (1) and the material (5) on said surface (2) and/or create structures (6) at the diffraction limit in said material (5) in the form of a single-order blazed distribution grating by directly redirecting the photons reflected on the side surfaces (20) of said crystal toward the surface (2) of said crystal, such as to enable the time distribution to be reduced. The invention also relates to the means for structuring the material (5) and to the scintillation crystal thus optimized for photon management. The invention further relates to the use of a scintillation crystal, optimized according to the above method, in particle detection systems and/or medical imaging and/or security systems and/or for radiation-related monitoring.
    • 本发明涉及一种用于在闪烁晶体优化光子管理的方法。 所述方法的特征在于它DASS包括以下步骤:沉积材料(5),其具有的折射率的“n”大约等于一个闪烁晶体(1)的折射率,在一个表面(2)的所述闪烁晶体 ; 所述构筑材料(5)通过的结构化装置; 和创建子衍射尺寸的结构(6)所述材料(5):如,以使折射率所述闪烁晶体(1)和所述材料之间angepasst(5)在所述表面(2)和/或创建的结构 (6)在所述材料的衍射极限(5)在一单阶的形式闪耀分布光栅通过直接重定向的光子反射所述晶体的朝向表面(2)所述晶体的侧表面(20)上, :如,以使分配的时间被减少。 因此,本发明涉及的装置用于构造材料(5)和用于光子管理THUS优化闪烁晶体。 本发明还涉及到使用一个闪烁晶体,雅丁优化,以上述方法的,在粒子检测系统和/或医学成像和/或安全系统和/或辐射相关的监测。
    • 14. 发明公开
    • SPECTROMETRE COMPACT A ECHANTILLONAGE BIDIMENSIONNEL
    • KOMPAKTSPEKTROMETERFÜRZWEIDIMENSIONALE ABTASTUNG
    • EP2260277A1
    • 2010-12-15
    • EP09732105.3
    • 2009-03-17
    • Université de Technologie de Troyes
    • HADJAR, YassineBLAIZE, SylvainBRUYANT, AurélienLERONDEL, GillesROYER, Pascal
    • G01J3/02G01J3/453G01J3/28
    • G01J3/0205G01J3/02G01J3/021G01J3/2803G01J3/45G01J3/453
    • The present invention relates to a spectrometer including a diopter (11); a recording means (15, 18) for recording, at said diopter (11), an interferogram (12) formed from two interference beams (F1, F2) and forming interference lines (13) along the transverse axis (Ox) of the interferogram (12) in the plane (xOy) of the diopter (11), said recording means (15, 18) including a network (18) of detection elements (19) so arranged to detect the spatial distribution of said interferogram (12); and is characterized in that said network (18) of detection elements (19) is two-dimensional, wherein at least one portion of said recording means (15, 18) and said interferogram (12) are angled into each other along the transverse axis (Ox) of the interferogram (12). The present invention also relates to a spectroscopic imaging device, including a means for emitting two interference beams (F1, F2), and to such a spectrometer.
    • 本发明涉及一种包括屈光度(11)的光谱仪; 在来自两个干涉光束(F1,F2)的干涉图(12)的所述屈光度(11)的所述屈光度(11)处的捕获装置(15,18),并沿着干涉图(12)的横轴(Ox)形成干涉线 屈光度计(11)的平面(xOy),所述捕获装置(15,18)包括检测元件(19)的网络(18),以便检测所述干涉图(12)的空间分布,其特征在于所述 检测元件(19)的网络(18)是二维的,并且所述捕获装置(15,18)和所述干涉图(12)的至少一部分相对于彼此沿横向轴线(Ox)倾斜, 的干涉图(12)。 本发明还涉及一种分光成像装置,包括用于发射两个干涉光束(F1,F2)的装置以及这种光谱仪。