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    • 19. 发明授权
    • Data exchange in resistance changing memory for improved endurance
    • 电阻变化记忆中的数据交换,以提高耐力
    • US08250293B2
    • 2012-08-21
    • US12687951
    • 2010-01-15
    • Thomas HappJan Boris Philipp
    • Thomas HappJan Boris Philipp
    • G06F12/10G06F12/16
    • G11C11/16G11C11/1673G11C11/1675G11C13/0002G11C13/0035G11C13/0069
    • According to one embodiment of the present invention, a method of operating an integrated circuit including a plurality of resistance changing memory cells grouped into physical memory units is provided. The method includes: Monitoring writing access numbers assigned to the physical memory units, each writing access number reflecting the number of writing accesses to the physical memory unit to which the writing access number is assigned; if the value of a writing access number assigned to a first physical memory unit exceeds a writing access threshold value, a data exchange process is carried out during which the data content stored within the first physical memory unit is exchanged with the data content of a second physical memory unit having a writing access number of a lower value.
    • 根据本发明的一个实施例,提供了一种操作集成电路的方法,该集成电路包括分组成物理存储器单元的多个电阻变化存储器单元。 该方法包括:监视分配给物理存储器单元的写入访问号码,每个写入访问号码反映写入访问次数到写入访问号码的物理存储单元; 如果分配给第一物理存储器单元的写访问号码的值超过写访问阈值,则执行数据交换处理,在该数据交换处理期间,存储在第一物理存储单元内的数据内容与第二物理存储单元的数据内容交换 物理存储单元具有较低值的写入访问号。