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    • 11. 发明授权
    • Touch screen panel and display device having the same
    • 触摸屏面板和具有相同功能的显示设备
    • US09354756B2
    • 2016-05-31
    • US13873281
    • 2013-04-30
    • Jae-Won HuhTae-Jun Kim
    • Jae-Won HuhTae-Jun Kim
    • G06F3/044G02F1/1335G02F1/1333G06F3/041
    • G06F3/044G02F1/13338G06F3/041
    • A touch screen panel includes a substrate, first sensing patterns formed in a first direction on the substrate, and second sensing patterns formed in a second direction intersected with the first direction on the substrate. The first sensing patterns include first sensing cells formed in an independent shape, respectively, between the second sensing patterns, and first connection patterns, the first connection patterns including a plurality of island patterns and a plurality of bridge patterns, the island patterns being separated and patterned in island shape in the second sensing patterns, the plurality of bridge patterns connecting between the first sensing cells and the island patterns or connecting between two adjacent island patterns, the first connection patterns connecting to the first sensing cells in the first direction.
    • 触摸屏面板包括基板,在基板上沿第一方向形成的第一感测图案,以及在与基板上的第一方向相交的第二方向上形成的第二感测图案。 第一感测图案包括分别在第二感测图案和第一连接图案之间以独立形状形成的第一感测单元,第一连接图案包括多个岛图案和多个桥形图案,岛图案被分离,并且 在所述第二感测图案中以岛状形成图案,所述多个桥接图案连接在所述第一感测单元和所述岛状图案之间或者在两个相邻的岛状图案之间连接,所述第一连接图案在所述第一方向上连接到所述第一感测单元。
    • 12. 发明申请
    • PLASMA DISPLAY DEVICE AND DRIVING METHOD THEREOF
    • 等离子体显示装置及其驱动方法
    • US20110128270A1
    • 2011-06-02
    • US12855683
    • 2010-08-12
    • Woo-Joon ChungTae-Jun KimJi-Sun Kim
    • Woo-Joon ChungTae-Jun KimJi-Sun Kim
    • G09G5/00G09G3/28
    • G09G3/293G09G3/2022G09G3/2927G09G2320/0238
    • A driving method of a plasma display device with reduced black luminance is provided. During at least one TV field without a main reset period, the at least one TV field including a first subfield and a second subfield having a reset waveform in a reset period of the first subfield and the second subfield, respectively, the method includes: applying a first scan low voltage or a first scan high voltage to a scan electrode during an address period of the first subfield; and applying a second scan low voltage or a second scan high voltage to the scan electrode during an address period of the second subfield, wherein the first and the second scan low voltages are maintained at a constant level for a period of time in the first and second subfields, respectively, and the first scan low voltage is different from the second scan low voltage.
    • 提供了具有降低的黑色亮度的等离子体显示装置的驱动方法。 在不具有主复位周期的至少一个TV场期间,所述至少一个TV场分别包括在第一子场和第二子场的复位周期中具有复位波形的第一子场和第二子场,该方法包括:应用 在第一子场的寻址周期期间向扫描电极施加第一扫描低电压或第一扫描高电压; 以及在所述第二子场的寻址周期期间,向所述扫描电极施加第二扫描低电压或第二扫描高电压,其中所述第一和第二扫描低电压在所述第一子场的第一和第 第二子场,第一扫描低电压与第二扫描低电压不同。
    • 14. 发明授权
    • Method of and apparatus for detecting a defect at the outer peripheral edge of a wafer, and cleaning equipment comprising the apparatus
    • 用于检测晶片外周缘处的缺陷的方法和装置,以及包括该装置的清洁设备
    • US06867855B2
    • 2005-03-15
    • US10356479
    • 2003-02-03
    • Seung-Jae GoIn-Suk LeeTae-Jun Kim
    • Seung-Jae GoIn-Suk LeeTae-Jun Kim
    • G01B11/30H01L21/00G01N21/00G01B7/16
    • H01L21/67288H01L21/67046
    • Apparatus for detecting a defect in the outer peripheral edge of a wafer includes a rotary mechanism by which the wafer can be rotated, a wafer edge contact device, and a controller. The wafer edge contact device includes a string that is pressed against the edge of the wafer. One end of the string is fixed in place, and a sensor is operatively associated with the other end of the string so as to sense movement of the other end of the string. This other end of the string will be pulled by a defect at the outer peripheral edge of the wafer when the wafer is rotated. Thus, a defective edge of the wafer can be detected before/after the wafer is processed. Accordingly, the wafer can be prevented from being further damaged, wafer particles are prevented from polluting the fabricating equipment, and the operating efficiency and productivity of the fabricating equipment are enhanced.
    • 用于检测晶片的外周边缘中的缺陷的装置包括可旋转晶片的旋转机构,晶片边缘接触装置和控制器。 晶片边缘接触装置包括压靠晶片边缘的线。 弦的一端固定就位,并且传感器可操作地与弦的另一端相关联,以便感测弦的另一端的移动。 当晶片旋转时,串的另一端将被晶片外围边缘处的缺陷所牵引。 因此,可以在晶片被处理之前/之后检测晶片的缺陷边缘。 因此,可以防止晶片进一步损坏,防止晶片颗粒污染制造设备,并且提高制造设备的操作效率和生产率。