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    • 18. 发明申请
    • MOSFET ON SILICON-ON-INSULATOR REDX WITH ASYMMETRIC SOURCE-DRAIN CONTACTS
    • 具有非对称源 - 漏联系的硅绝缘子红外线MOSFET
    • US20110049624A1
    • 2011-03-03
    • US12548005
    • 2009-08-26
    • Dechao GuoShu-Jen HanChung-Hsun LinNing Su
    • Dechao GuoShu-Jen HanChung-Hsun LinNing Su
    • H01L29/786H01L21/336
    • H01L21/84H01L29/41733H01L29/458H01L29/66772H01L29/7839H01L29/78624
    • A semiconductor device is disclosed that includes a silicon-on-insulator substrate including a buried insulator layer and an overlying semiconductor layer. Source extension and drain extension regions are formed in the semiconductor layer. A deep drain region and a deep source region are formed in the semiconductor layer. A first metal-semiconductor alloy contact layer is formed using tilted metal formation at an angle tilted towards the source extension region, such that the source extension region has a metal-semiconductor alloy contact that abuts the substrate from the source side, as a Schottky contact therebetween and the gate shields metal deposition from abutting the deep drain region. A second metal-semiconductor alloy contact is formed located on the first metal-semiconductor layer on each of the source extension region and drain extension region.
    • 公开了一种半导体器件,其包括绝缘体上硅衬底,其包括掩埋绝缘体层和上覆半导体层。 在半导体层中形成源延伸和漏扩展区。 在半导体层中形成深漏极区域和深源极区域。 第一金属 - 半导体合金接触层使用倾斜的金属形成,以朝向源延伸区域倾斜的角度形成,使得源极延伸区域具有金属 - 半导体合金接触件,其从源极侧邻接衬底,作为肖特基接触 并且栅极屏蔽金属沉积物抵靠深漏极区域。 在源极延伸区域和漏极延伸区域中的每一个上,在第一金属 - 半导体层上形成第二金属 - 半导体合金接触。