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    • 16. 发明授权
    • Profiling apparatus
    • 分析仪器
    • US4747734A
    • 1988-05-31
    • US801067
    • 1985-11-22
    • Kensuke IdeHiroshi Yamaji
    • Kensuke IdeHiroshi Yamaji
    • B23Q35/121B23Q35/04G05B19/18
    • B23Q35/121Y10T409/30196
    • An improved profiling apparatus performs a profiling operation after a profiling surface on a modelwork, and includes a vector arithmetic unit for calculating a projection component in an X-Y plane of the profiling surface in accordance with a signal from a tracer head, that is, a contact detector and a profiling direction arithmetic unit for calculating a profiling direction and a pick feeding direction on the basis of an output from the vector arithmetic unit. The profiling apparatus is effective with high accuracy in the profiling operation, less useless operation and short processing time, and is useful for a processing machine such as a diesinking machine and a machining center.
    • 改进的成形装置在模型工作后的成形表面之后执行轮廓操作,并且包括矢量运算单元,用于根据来自示踪头的信号即接触面来计算轮廓表面的XY平面中的投影分量, 检测器和用于基于来自矢量运算单元的输出来计算轮廓方向和拾取进给方向的轮廓方向运算单元。 成型设备在成型操作中具有高精度,操作更少,处理时间短,对于诸如模具机和加工中心的加工机器是有用的。