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    • 11. 发明授权
    • Magnetoresistive random access memory (MRAM) cell patterning
    • 磁阻随机存取存储器(MRAM)细胞图案化
    • US06677165B1
    • 2004-01-13
    • US10393713
    • 2003-03-20
    • Yong LuTheodore Zhu
    • Yong LuTheodore Zhu
    • H01L218242
    • H01L27/222H01L43/12Y10S438/951
    • A process that advantageously forms MRAM cells without the application of ion beam milling processes. Unlike conventional processes that rely on ion beam milling processes to remove materials from a magnetoresistive sandwich from areas other than areas that will later form MRAM cell bodies, this process forms a layer of photoresist over areas other than those areas that correspond to MRAM cell bodies. The photoresist is lifted off after the deposition of a magnetoresistive sandwich that forms the MRAM cell bodies, thereby safely removing the magnetoresistive sandwich from undesired areas while maintaining the magnetoresistive sandwich in the areas corresponding to MRAM cell bodies.
    • 有利地形成MRAM电池而不施加离子束研磨工艺的方法。 不同于依靠离子束研磨工艺从除了稍后形成MRAM单元体的区域之外的区域从磁阻三明治去除材料的常规工艺,该工艺在除了对应于MRAM单元体的那些区域之外的区域上形成光致抗蚀剂层。 在形成MRAM单元体的磁阻三明治的沉积之后,光致抗蚀剂被剥离,从而从不期望的区域安全地去除磁阻三明治,同时在对应于MRAM单元体的区域中保持磁阻三明治。
    • 13. 发明授权
    • Memory redundancy with programmable non-volatile control
    • 内存冗余与可编程非易失性控制
    • US06862700B2
    • 2005-03-01
    • US10685297
    • 2003-10-14
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • G11C29/00
    • G11C29/808G11C29/846
    • A redundancy scheme for a memory is disclosed that is programmable both before and after the memory device is packaged and/or installed in a system. This is preferably accomplished by using programmable non-volatile memory elements to control the replacement circuitry. Because the programmable memory elements are non-volatile, the desired replacement configuration is not lost during shipping, or if power is lost in a system. By allowing post-packaging replacement of defective memory elements, the overall yield of the device may be improved. By allowing post system installation replacement of defective memory elements, the reliability of many systems may be improved. In addition, the disclosed redundancy scheme allows two or more defective memory elements from different rows or columns to be replaced with memory elements from a single redundant low or column. This provides added flexibility during the replacement process.
    • 公开了一种用于存储器的冗余方案,其在存储器件被封装和/或安装在系统中之前和之后是可编程的。 这优选地通过使用可编程非易失性存储器元件来控制替换电路来实现。 由于可编程存储器元件是非易失性的,所以在运输过程中或者系统中的电源丢失时,所需的更换配置不会丢失。 通过允许更换缺陷存储元件的后期封装,可以提高器件的整体产量。 通过允许后置系统安装更换有缺陷的存储器元件,可以提高许多系统的可靠性。 此外,所公开的冗余方案允许来自不同行或列的两个或更多个有缺陷的存储器元件被来自单个冗余低或列的存储器元件替换。 这在更换过程中提供了更多的灵活性。
    • 14. 发明授权
    • Magnetic memory cell with shape anisotropy
    • 具有形状各向异性的磁记忆体
    • US06765823B1
    • 2004-07-20
    • US10354251
    • 2003-01-29
    • Theodore ZhuYong LuAnthony ArrottJoel Drewes
    • Theodore ZhuYong LuAnthony ArrottJoel Drewes
    • G11C1115
    • H01L43/08G11C11/15G11C11/16H01L27/222
    • A magneto-resistive memory comprising magneto-resistive memory cells is disclosed, comprising a pinned magnetic layer and a free magnetic layer. The two magnetic layers are formed having widened regions at the ends of the layers. As such, the shape made out by the magneto-resistive memory, from a top-view perspective, is wide at the ends and narrower at the mid-, forming an I shape in one preferred embodiment. The end portions of the free magnetic layer are allowed to magnetically couple to the end portions of the pinned magnetic layer such that magnetic coupling is shifted to these widened regions and coupling in the mid-portion between the widened regions is minimized. Thus, the influence of the pinned magnetic layer on the magnetization orientation of the mid-portion of the free magnetic layer is substantially eliminated, allowing for increased predictability in switching behavior and increased write selectivity of memory cells.
    • 公开了一种包括磁阻存储器单元的磁阻存储器,包括固定磁性层和自由磁性层。 两个磁性层在层的端部形成有加宽区域。 因此,从顶视角看,由磁阻存储器形成的形状在端部宽,在中间较窄,在一个优选实施例中形成I形。 允许自由磁性层的端部磁耦合到被钉扎的磁性层的端部,使得磁耦合转移到这些加宽的区域,并且在加宽区域之间的中间部分处的耦合被最小化。 因此,钉扎磁性层对自由磁性层的中间部分的磁化取向的影响基本上被消除,从而允许提高存储器单元的开关行为的可预测性和增加的写入选择性。
    • 15. 发明授权
    • Look-up table for use with redundant memory
    • 查找表用于冗余内存
    • US07328379B2
    • 2008-02-05
    • US11067326
    • 2005-02-25
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • G11C29/00
    • G11C29/808G11C29/846
    • A redundancy scheme for a memory is disclosed that is programmable both before and after the memory device is packaged and/or installed in a system. This is preferably accomplished by using programmable non-volatile memory elements to control the replacement circuitry. Because the programmable memory elements are non-volatile, the desired replacement configuration is not lost during shipping, or if power is lost in a system. By allowing post-packaging replacement of defective memory elements, the overall yield of the device may be improved. By allowing post system installation replacement of defective memory elements, the reliability of many systems may be improved. In addition, the disclosed redundancy scheme allows two or more defective memory elements from different rows or columns to be replaced with memory elements from a single redundant low or column. This provides added flexibility during the replacement process.
    • 公开了一种用于存储器的冗余方案,其在存储器件被封装和/或安装在系统中之前和之后是可编程的。 这优选地通过使用可编程非易失性存储器元件来控制替换电路来实现。 由于可编程存储器元件是非易失性的,所以在运输过程中或者系统中的电源丢失时,所需的更换配置不会丢失。 通过允许更换缺陷存储元件的后期封装,可以提高器件的整体产量。 通过允许后置系统安装更换有缺陷的存储器元件,可以提高许多系统的可靠性。 此外,所公开的冗余方案允许来自不同行或列的两个或更多个有缺陷的存储器元件被来自单个冗余行或列的存储器元件替换。 这在更换过程中提供了更多的灵活性。
    • 18. 发明授权
    • Memory redundancy with programmable non-volatile control
    • 内存冗余与可编程非易失性控制
    • US06671834B1
    • 2003-12-30
    • US09618492
    • 2000-07-18
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • G11C2900
    • G11C29/808G11C29/846
    • A redundancy scheme for a memory is disclosed that is programmable both before and after the memory device is packaged and/or installed in a system. This is preferably accomplished by using programmable non-volatile memory elements to control the replacement circuitry. Because the programmable memory elements are non-volatile, the desired replacement configuration is not lost during shipping, or if power is lost in a system. By allowing post-packaging replacement of defective memory elements, the overall yield of the device may be improved. By allowing post system installation replacement of defective memory elements, the reliability of many systems may be improved. In addition, the disclosed redundancy scheme allows two or more defective memory elements from different rows or columns to be replaced with memory elements from a single redundant low or column. This provides added flexibility during the replacement process.
    • 公开了一种用于存储器的冗余方案,其在存储器件被封装和/或安装在系统中之前和之后是可编程的。 这优选地通过使用可编程非易失性存储器元件来控制替换电路来实现。 由于可编程存储器元件是非易失性的,所以在运输过程中,或者系统中的电源丢失时,所需的更换配置不会丢失。 通过允许更换缺陷存储元件的后期封装,可以提高器件的整体产量。 通过允许后置系统安装更换有缺陷的存储器元件,可以提高许多系统的可靠性。 此外,所公开的冗余方案允许来自不同行或列的两个或更多个有缺陷的存储器元件被来自单个冗余低或列的存储器元件替换。 这在更换过程中提供了更多的灵活性。
    • 20. 发明授权
    • Memory redundancy with programmable control
    • 内存冗余与可编程控制
    • US07389451B2
    • 2008-06-17
    • US11067356
    • 2005-02-25
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • Theodore ZhuGary KirchnerRichard W. SwansonYong Lu
    • G01C29/00
    • G11C29/808G11C29/846
    • A redundancy scheme for a memory is disclosed that is programmable both before and after the memory device is packaged and/or installed in a system. This is preferably accomplished by using programmable non-volatile memory elements to control the replacement circuitry. Because the programmable memory elements are non-volatile, the desired replacement configuration is not lost during shipping, or if power is lost in a system. By allowing post-packaging replacement of defective memory elements, the overall yield of the device may be improved. By allowing post system installation replacement of defective memory elements, the reliability of many systems may be improved. In addition, the disclosed redundancy scheme allows two or more defective memory elements from different rows or columns to be replaced with memory elements from a single redundant low or column. This provides added flexibility during the replacement process.
    • 公开了一种用于存储器的冗余方案,其在存储器件被封装和/或安装在系统中之前和之后是可编程的。 这优选地通过使用可编程非易失性存储器元件来控制替换电路来实现。 由于可编程存储器元件是非易失性的,所以在运输过程中或者系统中的电源丢失时,所需的更换配置不会丢失。 通过允许更换缺陷存储元件的后期封装,可以提高器件的整体产量。 通过允许后置系统安装更换有缺陷的存储器元件,可以提高许多系统的可靠性。 此外,所公开的冗余方案允许来自不同行或列的两个或更多个有缺陷的存储器元件被来自单个冗余行或列的存储器元件替换。 这在更换过程中提供了更多的灵活性。