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    • 11. 发明申请
    • PASSIVATION OF ETCHED SEMICONDUCTOR STRUCTURES
    • WO2010015301A8
    • 2010-02-11
    • PCT/EP2009/004791
    • 2009-07-02
    • S.O.I. TEC SILICON ON ISULATOR TECHNOLOGIESFAURE, BruceGUENARD, Pascal
    • FAURE, BruceGUENARD, Pascal
    • H01L21/762H01L21/324H01L21/20
    • The present invention relates to a method for passivation of a semiconductor structure, comprising the steps providing at least one first material layer; forming at least one second material layer that is to be patterned above the first material layer; forming a diffusion barrier layer between the at least one second material layer and the at least one first material layer thereby forming a multilayer stack and patterning, in particular, etching, the at least one second material layer down to but not completely through the diffusion barrier layer and without exposing portions of the at least one first material layer such that diffusion of material of the at least one first material layer through the diffusion barrier layer during a subsequent heat treatment of the multilayer stack is substantially prevented. The invention also relates to a method for passivation of a semiconductor structure, comprising the steps providing a multilayer stack comprising at least one buried layer formed below a second material layer; patterning, in particular, etching, the surface of the multilayer stack through the second material layer thereby exposing portions of the at least one buried layer and depositing a diffusion barrier layer at least on the exposed portions of the at least one buried layer such that diffusion of material of the at least one buried layer through the diffusion barrier layer during a subsequent heat treatment of the multilayer stack is substantially prevented.
    • 16. 发明申请
    • A METHOD OF FABRICATING EPITAXIALLY GROWN LAYERS ON A COMPOSITE STRUCTURE
    • 一种在复合结构上制作外延层的方法
    • WO2009092624A1
    • 2009-07-30
    • PCT/EP2009/050086
    • 2009-01-06
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESFAURE, BruceMARCOVECCHIO, Alexandra
    • FAURE, BruceMARCOVECCHIO, Alexandra
    • H01L21/762H01L21/20H01L21/683
    • H01L21/76254H01L33/0079H01L2924/0002H01L2924/00
    • The invention relates to a method of fabricating materials by epitaxy, comprising a step of epitaxial growth of at least one layer (15) of a material on a composite structure (14). The composite structure comprises at least one thin film (4) bonded to a support substrate (10), a bonding layer (25) being formed by deposition between the support substrate (10) and the thin film (4), the thin film (4) and the support substrate (10) having a mean thermal expansion coefficient of 7 x 10 -6 K -1 or more. The bonding layer of oxide (25) is formed by low pressure chemical vapor deposition (LPCVD) of a layer of oxide of silicon on the bonding face of the support substrate (10) and/or on the bonding face of the thin film (4). The thickness of the thin film (4) is less than or equal to the thickness of the oxide layer. The method also includes a heat treatment carried out at a temperature that is higher than the temperature for deposition of the layer of oxide of silicon and for a predetermined period.
    • 本发明涉及通过外延制造材料的方法,包括在复合结构(14)上材料的至少一层(15)外延生长的步骤。 所述复合结构包括至少一个结合到支撑衬底(10)的薄膜(4),通过在所述支撑衬底(10)和所述薄膜(4)之间沉积形成所述结合层(25),所述薄膜 4)和平均热膨胀系数为7×10 -6 K -1以上的支撑基板(10)。 氧化物(25)的接合层通过在支撑基板(10)的接合面上和/或薄膜(4)的接合面上的硅氧化物层的低压化学气相沉积(LPCVD)形成 )。 薄膜(4)的厚度小于或等于氧化物层的厚度。 该方法还包括在比硅的氧化物层的沉积温度高一定温度的温度下进行的热处理。
    • 19. 发明申请
    • METHOD OF PRODUCING A SUBSTRATE FOR AN OPTOELECTRONIC APPLICATION
    • 生产用于光电子应用的基板的方法
    • WO2006074933A1
    • 2006-07-20
    • PCT/EP2006/000230
    • 2006-01-12
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES S.A.LETERTRE, FabriceFAURE, Bruce
    • LETERTRE, FabriceFAURE, Bruce
    • H01L21/20H01L33/00
    • H01L31/1892H01L21/2007H01L21/76254H01L33/0079Y02E10/50
    • The present invention relates to a method of producing a substrate for an optoelectronic application, the substrate having at least one active nitride layer on a final carrier and a metallic intermediate layer therebetween, wherein the method comprises: preparation of an auxiliary substrate wherein one semi-conducting nitride layer is placed on an auxiliary carrier; metallising the auxiliary substrate on the side of the nitride layer; bonding of the metallised carrier substrate with the final carrier; and removing of the auxiliary carrier after the bonding step. It is the object of the present invention to provide a method of this type in which the crystalline quality of the active nitride layer(s) can be improved. The object is solved by a method of the above mentioned type wherein the step of preparing the auxiliary substrate comprises: detaching a part from a massive semi-conducting nitride substrate; and transferring said part onto the auxiliary carrier to form the semi-conducting nitride layer thereon.
    • 本发明涉及一种制备光电子应用基片的方法,该基底在最终载体上具有至少一个活性氮化物层和其间的金属中间层,其中所述方法包括:制备辅助基底,其中, 导电氮化物层放置在辅助载体上; 在氮化物层的侧面对辅助衬底进行金属化; 金属化载体基板与最终载体的接合; 以及在接合步骤之后去除辅助载体。 本发明的目的是提供一种可以提高活性氮化物层的结晶质量的方法。 该目的通过上述类型的方法来解决,其中准备辅助衬底的步骤包括:从块状半导体氮化物衬底分离一部分; 并将所述部分转移到辅助载体上以在其上形成半导电氮化物层。