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    • 13. 发明申请
    • APPARATUS AND METHODS FOR EDGE RING IMPLEMENTATION FOR SUBSTRATE PROCESSING
    • 用于基板加工的边缘实施的装置和方法
    • US20110070743A1
    • 2011-03-24
    • US12951886
    • 2010-11-22
    • Rajinder DhindsaAlexei Marakhtanov
    • Rajinder DhindsaAlexei Marakhtanov
    • H01L21/3065
    • H01L21/6732H01J37/32091H01J37/32623H01J37/32642Y10S156/915
    • A method for processing a substrate in a plasma processing chamber is provided. The substrate is disposed above a chuck and surrounded by a first edge ring. The first edge ring is electrically isolated from the chuck. The method includes providing a second edge ring. The second edge ring is disposed below an edge of the substrate. The method also includes providing a coupling ring. The coupling ring is configured to facilitate RF coupling from an ESC (electrostatic chuck) assembly to the first edge ring, thereby causing the first edge ring to have an edge ring potential during substrate processing and causing the RF coupling to be maximized at the first edge ring and minimized at the second edge ring during the substrate processing. The method also includes providing an insulator ring, wherein the second edge ring is disposed above the insulator ring.
    • 提供了一种在等离子体处理室中处理衬底的方法。 衬底设置在卡盘上方并被第一边缘环包围。 第一边缘环与卡盘电隔离。 该方法包括提供第二边缘环。 第二边缘环设置在基板的边缘下方。 该方法还包括提供耦合环。 联接环被配置为便于从ESC(静电卡盘)组件到第一边缘环的RF耦合,从而使得第一边缘环在衬底处理期间具有边缘环电位,并且使RF耦合在第一边缘处被最大化 在基板处理期间在第二边缘环处环形并最小化。 该方法还包括提供绝缘体环,其中第二边缘环设置在绝缘体环上方。
    • 16. 发明授权
    • Method and apparatus for DC voltage control on RF-powered electrode
    • RF电源电压直流电压控制方法及装置
    • US09536711B2
    • 2017-01-03
    • US12047820
    • 2008-03-13
    • Rajinder DhindsaEric HudsonAlexei MarakhtanovMaryam MoravejAndreas Fischer
    • Rajinder DhindsaEric HudsonAlexei MarakhtanovMaryam MoravejAndreas Fischer
    • H01J37/32
    • H01J37/32642H01J37/32091H01J37/32174H01J37/32623H01J37/32697
    • In a plasma processing chamber, a method for processing a substrate is provided. The method includes supporting the substrate in the plasma processing chamber configured with an upper electrode (UE) and a lower electrode (LE), configuring at least one radio frequency power source to ignite plasma between the UE and the LE, and providing a conductive coupling ring, the conductive coupling ring is coupled to the LE to provide a conductive path. The method further includes providing a plasma-facing-substrate-periphery (PFSP) ring, the PFSP ring being disposed above the conductive coupling ring. The method yet further includes coupling the PFSP ring to at least one of a direct current (DC) ground through an RF filter, the DC ground through the RF filter and a variable resistor, a positive DC power source through the RF filter, and a negative DC power source through the RF filter to control plasma processing parameters.
    • 在等离子体处理室中,提供了一种处理基板的方法。 该方法包括在配置有上电极(UE)和下电极(LE)的等离子体处理室中支撑衬底,配置至少一个射频电源以点燃UE和LE之间的等离子体,并提供导电耦合 导电耦合环耦合到LE以提供导电路径。 该方法还包括提供等离子体对衬底周边(PFSP)环,PFSP环设置在导电耦合环上方。 该方法还包括将PFSP环耦合到通过RF滤波器的直流(DC)接地中的至少一个,通过RF滤波器的DC接地和可变电阻器,通过RF滤波器的正直流电源以及 负直流电源通过RF滤波器控制等离子体处理参数。
    • 20. 发明申请
    • APPARATUS FOR PLASMA PROCESSING SYSTEM WITH TUNABLE CAPACITANCE
    • 用于具有可调电容的等离子体处理系统的装置
    • US20140034243A1
    • 2014-02-06
    • US14058101
    • 2013-10-18
    • Rajinder DhindsaAlexei Marakhtanov
    • Rajinder DhindsaAlexei Marakhtanov
    • H01J37/21
    • H01J37/21H01J37/32091H01J37/32642H01J37/32697
    • A plasma processing system having a plasma processing chamber configured for processing a substrate is provided. The substrate is disposed above a chuck and surrounded by an edge ring, which is electrically isolated from the chuck. The system includes a RF power, which provides power to the chuck. The system also includes a tunable capacitance arrangement, which is coupled to the edge ring to provide RF coupling to the edge ring, resulting in the edge ring having an edge ring potential. The system further includes the plasma processing chamber configured to strike plasma to process the substrate, which is processed while the tunable capacitance arrangement is configured to cause the edge ring potential to be dynamically tunable to a DC potential of the substrate while processing the substrate.
    • 提供了一种等离子体处理系统,其具有用于处理基板的等离子体处理室。 基板设置在卡盘上方并被与卡盘电隔离的边缘环包围。 该系统包括向卡盘供电的RF功率。 该系统还包括可调电容布置,其耦合到边缘环以提供与边缘环的RF耦合,导致边缘环具有边缘环电位。 该系统还包括等离子体处理室,该等离子体处理室被配置成撞击等离子体以处理衬底,该处理在可调谐电容布置被配置成使得边缘环电位在处理衬底的同时能够动态调节到衬底的DC电位。