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    • 14. 发明授权
    • Process for the production of an optoelectronic component having a
defined axial variation of the coupling coefficient and a defined axial
distribution of the phase shift
    • 用于生产具有限定的耦合系数的轴向变化和相移的确定的轴向分布的光电子部件的方法
    • US5601731A
    • 1997-02-11
    • US401168
    • 1995-03-09
    • Hartmut Hillmer
    • Hartmut Hillmer
    • G02B5/18G02B6/12G02B6/124G03F7/00H01S5/10H01S5/12H01L21/00B44C1/22
    • H01S5/12G02B5/1857G02B6/124G03F7/001G02B2006/12176H01S5/10H01S5/1021H01S5/1064H01S5/1231
    • The process for production of an optoelectronic component having a predetermined coupling coefficient distribution and a predetermined phase shift distribution includes providing a photomask defining lateral and axial geometry of the grating fields of the optoelectronic compound, particularly predetermined curved grating boundaries between regions of the optoelectronic component having the grating fields and grating-free regions; performing a spin-on deposition of a photoresist on the semiconductor layers of a semiconductor substrate; structuring the semiconductor layers so that a DFB or DBR grating structure is located between the spin-on photoresist and the semiconductor substrate; after performing the spin-on deposition of the photoresist, exposing the photoresist using the provided photomask to form the optoelectronic component in the semiconductor substrate; and after the exposing of the photoresist using the photomask, etching surfaces of the optoelectronic component which are to be free of the grating fields to remove material to a minimum depth reaching a horizontal xz-plane corresponding to deepest points in the grating trenches of the grating fields.
    • 具有预定耦合系数分布和预定相移分布的光电子部件的制造方法包括提供光学掩模,该光掩模限定光电子化合物的光栅场的横向和轴向几何形状,特别是具有光电子部件的区域之间的预定弯曲光栅边界, 光栅场和光栅区域; 在半导体衬底的半导体层上进行光刻胶的自旋沉积; 构造半导体层,使得DFB或DBR光栅结构位于旋涂光致抗蚀剂和半导体衬底之间; 在进行光致抗蚀剂的旋涂沉积之后,使用所提供的光掩模曝光光致抗蚀剂以在半导体衬底中形成光电子部件; 并且在使用光掩模曝光光致抗蚀剂之后,蚀刻光电子部件的不受光栅场的表面,以将材料移除到达到与光栅的光栅沟槽中的最深点相对应的水平xz平面的最小深度 领域。